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Results 1 to 25 of 6960

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SIMS EVIDENCE CONCERNING WATER IN PASSIVE LAYERS = MISE EN EVIDENCE PAR SPECTROMETRIE SIMS D'EAU DANS LES COUCHES PASSIVESMURPHY OJ; BOCKRIS JOM; POU TE et al.1982; J. ELECTROCHEM. SOC.; ISSN 0013-4651; USA; DA. 1982; VOL. 129; NO 9; PP. 2149-2151; BIBL. 20 REF.Article

A STUDY OF THE INITIAL OXIDATION OF CHROMIUM-NICKEL STEEL BY SIMSBLASEK G; WEIHERT M.1979; SURF. SCI.; NLD; DA. 1979; VOL. 82; NO 1; PP. 215-227; BIBL. 25 REF.Article

A NEW TECHNIQUE TO STUDY THE STAGES OF OXIDATION OF METALS USING OXIDATION INDUCED CHANGES IN THE SHAPE OF SECONDARY ION ENERGY SPECTRA = UNE NOUVELLE TECHNIQUE POUR ETUDIER LES ETAPES DE L'OXYDATION DES METAUX GRACE A LA SPECTROMETRIE SIMSSNOWDON KJ.1980; CORROS. SCI.; ISSN 0010-938X; GBR; DA. 1980; VOL. 20; NO 1; PP. 53-61; BIBL. 20 REF.Article

HYDROGEN PROFILES OF ANODIC ALUMINUM OXIDE FILMS = PROFILS D'H2 DANS LES FILMS D'OXYDES ANODIQUES SUR ALLANFORD WA; ALWITT RS; DYER CK et al.1980; J. ELECTROCHEM. SOC.; ISSN 0013-4651; USA; DA. 1980; VOL. 127; NO 2; PP. 405-411; BIBL. 24 REF.Article

APPLICATION OF SIMS TO ANALYSIS OF STEELSTSUNOYAMA K; SUZUKI T; OHASHI Y et al.1980; MASS SPECTROSC.; JPN; DA. 1980; VOL. 28; NO 1; PP. 1-8; BIBL. 34 REF.Article

UNTERSUCHUNGEN ZUR SELEKTIVEN OXIDATION VON GOLD-KUPFER-CADMIUM-LEGIERUNGEN MIT EINEM SEKUNDAERIONENMASSENSPEKTROMETER = RECHERCHES SUR L'OXYDATION SELECTIVE DES ALLIAGES AU-CU-CD A L'AIDE D'UN SPECTROMETRE DE MASSE SECONDAIREBECKER S; BLANK P; FELLER HG et al.1979; METALL; DEU; DA. 1979; VOL. 33; NO 7; PP. 751-757; ABS. ENG; BIBL. 18 REF.Article

POROUS ANODIC FILMS FORMED ON ALUMINIUM IN CHROMIC ACID = FILMS D'ANODISATION POREUX FORMES SUR AL DANS L'ACIDE CHROMIQUETHOMPSON GE; WOOD GC; HUTCHINGS R et al.1980; TRANS. INST. MET. FINISH.; ISSN 0020-2967; GBR; DA. 1980; VOL. 58; NO 1; PP. 21-25; BIBL. 14 REF.Article

APPLICATION DE LA SPECTROMETRIE DE MASSE D'IONS SECONDAIRES A L'ANALYSE DE SURFACES ET DES FILMS MINCES = APPLICATION OF SECONDARY ION MASS SPECTROMETRY TO THE ANALYSIS OF SURFACES AND THIN FILMSSIMONDET MF.1983; SURFACES; ISSN 0585-9840; FRA; DA. 1983; NO 158; PP. 14-16; 2 P.Article

BUTTLE FRACTURE ANALYSIS OF MO BY SIMSKITAJIMA M; NODA T; OKADA M et al.1981; NIPPON KINZOKU GAKKAISHI (1952); ISSN 0021-4876; JPN; DA. 1981; VOL. 45; NO 2; PP. 219-220; BIBL. 5 REF.Article

ESCA AND SIMS STUDIES OF THE PASSIVE FILM ON IRON = ETUDE PAR ESCA ET SIMS DU FILM PASSIF SUR FETJONG SC; YEAGER E.1981; J. ELECTROCHEM. SOC.; ISSN 0013-4651; USA; DA. 1981; VOL. 128; NO 10; PP. 2251-2254; BIBL. 7 REF.Article

DEPTH DISTRIBUTION OF ION-IMPLANTED ARGON IN GADOLINIUM AND SAMARIUM FILMS = DISTRIBUTION EN PROFONDEUR DE L'ARGON IMPLANTE PAR DES IONS DANS DES COUCHES MINCES DE GADOLINIUM ET DE SAMARIUMISKANDEROVA ZA; LIFANOVA LF; RADJABOV TD et al.1982; VACUUM; ISSN 0042-207X; GBR; DA. 1982; VOL. 32; NO 5; PP. 269-275; BIBL. 26 REF.Article

DIRECT OBSERVATION OF HYDROGEN DAMAGE IN A 304 STAINLESS STEEL AND A 1020 STEEL = OBSERVATION DIRECTE DE L'ENDOMMAGEMENT PAR L'HYDROGENE D'UN ACIER INOXYDABLE 304 ET D'UN ACIER 1020RIOJA RJ; YACAMAN M; MORENO M et al.1982; SCR. METALL.; ISSN 0036-9748; USA; DA. 1982; VOL. 16; NO 2; PP. 129-134; BIBL. 9 REF.Article

SIMS/XPS STUDIES OF THE PASSIVE FILM ON NICKEL = ETUDES PAR SIMS/XPS DU FILM PASSIF SUR NITJONG SC.1982; MATERIALS RESEARCH BULLETIN; ISSN 0025-5408; USA; DA. 1982; VOL. 17; NO 10; PP. 1297-1304; BIBL. 12 REF.Article

VERSATILE AND USER-FRIENDLY COMPUTER SYSTEM FOR THE CAMECA IMS-300 SECONDARY ION MASS SPECTROMETERVAN CRAEN M; VAN ESPEN P; ADAMS F et al.1982; REVIEW OF SCIENTIFIC INSTRUMENTS; ISSN 0034-6748; USA; DA. 1982; VOL. 53; NO 7; PP. 1007-1011; BIBL. 2 REF.Article

SIMS-UNTERSUCHUNGEN ZUR VOLUMENDIFFUSION VON AL IN GE = SIMS-INVESTIGATION OF THE BULK DIFFUSION OF AL IN GEDORNER P; GUST W; PREDEL B et al.1982; ACTA METALL.; USA; DA. 1982-05; VOL. 30; NO 5; PP. 941-946; BIBL. 14 REF.Article

COMMENTS ON THE SURFACE-EXCITATION MODELKROHN VE.1981; SURF. SCI.; NLD; DA. 1981-11; VOL. 111; NO 3; PP. L744-L746; BIBL. 15 REF.Article

DEPTH DISTRIBUTION OF KNOCK-ON NITROGEN IN SI BY PHOSPHORUS IMPLANTATION THROUGH SI3N4 FILMS.HIRAO T; INOUE K; TAKAYANAGI S et al.1977; APPL. PHYS. LETTERS; U.S.A.; DA. 1977; VOL. 31; NO 8; PP. 505-508; BIBL. 11 REF.Article

VERTICAL DISTRIBUTION OF COMPONENTS IN A POLYMER BLEND WITH THE AID OF THE SECONDARY ION MASS SPECTROMETRYCHUJO R; NISHI T; SUMI Y et al.1983; JOURNAL OF POLYMER SCIENCE. POLYMER LETTERS EDITION; ISSN 0360-6384; USA; DA. 1983; VOL. 21; NO 6; PP. 487-494; BIBL. 7 REF.Article

APPLICATIONS OF THE ION MICROPROBE TO GEOCHEMISTRY AND COSMOCHEMISTRYSHIMIZU N; HART SR.1982; ANNU. REV. EARTH PLANET. SCI.; ISSN 0084-6597; USA; DA. 1982; VOL. 10; PP. 483-526; BIBL. 3 P.Article

HIGH-PERFORMANCE SECONDARY ION MASS SPECTROMETERCOLTON RJ; CAMPANA JE; BARLAK TM et al.1980; REV. SCI. INSTRUM.; ISSN 0034-6748; USA; DA. 1980; VOL. 51; NO 12; PP. 1685-1689; BIBL. 14 REF.Article

ETUDE DE L'INTERACTION ENTRE LE CARBONE DISSOUS, L'AZOTE ET L'HYDROGENE DANS L'ACIER PAR SPECTROMETRIE SIMSISHIZAKI T; TAMURA H; TAMAI M et al.1980; MASS SPECTROSC.; JPN; DA. 1980; VOL. 28; NO 1; PP. 103-106; BIBL. 9 REF.Article

HIGH-SENSITIVITY DEPTH PROFILING OF ARSENIC AND PHOSPHORUS IN SILICON BY MEANS OF SIMS.WITTMAACK K.1976; APPL. PHYS. LETTERS; U.S.A.; DA. 1976; VOL. 29; NO 9; PP. 552-554; BIBL. 22 REF.Article

LOW-ENERGY ION BEAM SYSTEM FOR MATERIALS STUDIESNELSON GC; BORDERS JA; OBORNY MC et al.1982; REV. SCI. INSTRUM.; ISSN 0034-6748; USA; DA. 1982; VOL. 53; NO 5; PP. 610-614; BIBL. 9 REF.Article

MODIFICATION OF A SECONDARY ION MASS SPECTROMETER TO ALLOW THE EXAMINATION OF HIGHLY RADIOACTIVE SPECIMENSBART G; AERNE T; FLUCKIGER U et al.1981; NUCL. INSTRUM. METHODS; ISSN 0029-554X; NLD; DA. 1981; VOL. 180; NO 1; PP. 109-116; BIBL. 8 REF.Article

ENERGY AND MASS ANALYSES OF SECONDARY POSITIVE IONS FROM SILICON WAFER SURFACESTAYA S.1978; MASS SPECTROSC.; JPN; DA. 1978; VOL. 26; NO 1; PP. 89-95; BIBL. 9 REF.Article

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