CHANNELING OF IMPLANTED PHOSPHORUS THROUGH POLYCRYSTALLINE SILICONSEIDEL TE.1980; APPL. PHYS. LETT.; ISSN 0003-6951; USA; DA. 1980; VOL. 36; NO 6; PP. 447-449; BIBL. 10 REF.Article

ENHACED SOLUBILITY AND ION PAIRING OF CU AND AU IN HEAVILY DOPED SILICON AT HIGH TEMPERATURES.MEEK RL; SEIDEL TE.1975; J. PHYS. CHEM. SOLIDS; G.B.; DA. 1975; VOL. 36; NO 7-8; PP. 731-740; BIBL. 43 REF.Article

SURFACE VERSUS BULK NUCLEATED OXIDATION-INDUCED STACKING FAULTS IN SILICON WAFERS.ROZGONYI GA; SEIDEL TE.1977; J. CRYST. GROWTH; NETHERL.; DA. 1977; VOL. 38; NO 3; PP. 359-363; BIBL. 9 REF.Article

BURRIED-GUARDED LAYER ION-IMPLANTED RESISTORSSEIDEL TE; GIBSON WC.1973; I.E.E.E. TRANS. ELECTRON DEVICES; U.S.A.; DA. 1973; VOL. 20; NO 8; PP. 744-748; BIBL. 8 REF.Serial Issue

DIRECT COMPARISON OF ION-DAMAGE GETTERING AND PHOSPHORUS-DIFFUSION GETTERING AND PHOSPHORUS-DIFFUSION GETTERING OF AU IN SI.SEIDEL TE; MEEK RL; CULLIS AG et al.1975; J. APPL. PHYS.; U.S.A.; DA. 1975; VOL. 46; NO 2; PP. 600-609; BIBL. 16 REF.Article

COMPARATIVE STUDY OF ANNEALED NEON-, ARGON-, AND KRYPTON-ION IMPLANTATION DAMAGE IN SILICONCULLIS AG; SEIDEL TE; MEEK RL et al.1978; J. APPL. PHYS.; USA; DA. 1978; VOL. 49; NO 10; PP. 5188-5198; BIBL. 30 REF.Article

DIFFUSION GETTERING OF AU AND CU IN SILICON.MEEK RL; SEIDEL TE; CULLIS AG et al.1975; J. ELECTROCHEM. SOC.; U.S.A.; DA. 1975; VOL. 122; NO 6; PP. 786-796; BIBL. 26 REF.Article

ELECTRON-BEAM-INDUCED CURRENT AND TEM STUDIES OF STOCKING FAULTS FORMED BY THE OXIDATION OF BORON-IMPLANTED SILICON.SEIDEL TE; HASZKO SE; MAHER DM et al.1977; J. APPL. PHYS.; U.S.A.; DA. 1977; VOL. 48; NO 12; PP. 5038-5042; BIBL. 8 REF.Article

DEPENDENCE OF RESIDUAL DAMAGE ON TEMPERATURE DURING AR⁺ SPUTTER CLEANING OF SILICON.BEAN JC; BECKER GE; PETROFF PM et al.1977; J. APPL. PHYS.; U.S.A.; DA. 1977; VOL. 48; NO 3; PP. 907-913; BIBL. 25 REF.Article

SIMULTANEOUS GETTERING OF AU IN SILICON BY PHOSPHORUS AND DISLOCATIONSTSENG WF; KOJI T; MAYER JW et al.1978; APPL. PHYS. LETTERS; USA; DA. 1978; VOL. 33; NO 5; PP. 442-444; BIBL. 8 REF.Article

ATLANTA FIBER SYSTEM EXPERIMENT: PLANAR EPITAXIAL SILICON AVALANCHE PHOTODIODEMELCHIOR H; HARTMAN AR; SCHINKE DP et al.1978; BELL SYST. TECH. J.; USA; DA. 1978; VOL. 57; NO 6 PART. 1; PP. 1791-1807; BIBL. 23 REF.Article

ORIENTATION AND IMPLANTATION EFFECTS ON STACKING FAULTS DURING SILICON BURIED LAYER PROCESSINGROBINSON M; ROZ GONYI GA; SEIDEL TE et al.1981; J. ELECTROCHEM. SOC.; ISSN 0013-4651; USA; DA. 1981; VOL. 128; NO 4; PP. 926-929; BIBL. 34 REF.Article

TRANSISTORS WITH BORON BASES PREDEPOSITED BY ION IMPLANTATION AND ANNEALED IN VARIOUS OXYGEN AMBIENTS.SEIDEL TE; PAYNE RS; MOLINE RA et al.1975; IN: INT. ELECTRON DEVICES MEET.; WASHINGTON, D.C.; 1975; NEW YORK; INST. ELECTR. ELECTRON. ENG.; DA. 1975; PP. 581-584; BIBL. 12 REF.Conference Paper

THE REDUCTION OF EMITTER-COLLECTOR SHORTS IN A HIGH-SPEED ALL-IMPLANTED BIPOLAR TECHNOLOGYPARRILLO LC; PAYNE RS; SEIDEL TE et al.1981; IEEE TRANS. ELECTRON DEVICES; ISSN 0018-9383; USA; DA. 1981; VOL. 28; NO 12; PP. 1508-1514; BIBL. 17 REF.Article

Josephson effects in iron based superconductorsSEIDEL, Paul.Superconductor science & technology (Print). 2011, Vol 24, Num 4, issn 0953-2048, 043001.1-043001.21Article

L'obésité en chiffres = Obesity epidemiologySEIDEL, Jaap.Concours médical (Paris). 2004, Vol 126, Num 25, pp 3-5, issn 0010-5309, 3 p., SUPConference Paper

Strongly stretched polyelectrolyte brushesSEIDEL, Christian.Macromolecules. 2003, Vol 36, Num 7, pp 2536-2543, issn 0024-9297, 8 p.Article

ISO after completing its successful missionSEIDEL, A.Cryogenics (Guildford). 1999, Vol 39, Num 2, pp 135-148, issn 0011-2275Conference Paper

Reinigen von Endlosdraht = Cleaning of endless wireSEIDEL, A.Metalloberfläche. 1997, Vol 51, Num 7, pp 489-493, issn 0026-0797Article

Searle's new argument = Le nouvel argument de SearleSEIDEL, A.Dialogue. Canadian Philosophical Association. 1997, Vol 36, Num 3, pp 575-582, issn 0012-2173Article

Freunde und Feinde Jeremias unter den Beamten Judas der spätvorexilischen Zeit = Jeremiah Friends and Enemies under the King of Judah in the post-exilic periodSEIDEL, B.Biblische Zeitschrift. 1997, Vol 41, Num 1, pp 28-53, issn 0006-2014Article

Entwicklungslinien der neueren Pentateuchforschung im 20. Jahrhundert = The Lines of Development of New Studies on the Pentateuch in the 20. CenturySEIDEL, B.Zeitschrift für die alttestamentliche Wissenschaft. 1994, Vol 106, Num 3, pp 476-485, issn 0044-2526Article

Selected health risks caused by long-term, whole-body vibrationSEIDEL, H.American journal of industrial medicine. 1993, Vol 23, Num 4, pp 589-604, issn 0271-3586Conference Paper

Plato, Wittgenstein and Artificial IntelligenceSEIDEL, A.Metaphilosophy. 1991, Vol 22, Num 4, pp 292-306, issn 0026-1068Article

Rehabilitation in der ehemaligen DDR = Rehabilitation in the former GDRSEIDEL, C.Das Offentliche Gesundheitswesen. 1991, Vol 53, pp 191-195, issn 0029-8573, NS3Article