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Results 1 to 25 of 22101

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Isopiestic determination of the coefficients of activity of magnesium in Al-Cu-Mg liquid alloysSOARES, D; MALHEIROS, L. F; HÄMÄLÄINEN, M et al.Journal of alloys and compounds. 1995, Vol 220, pp 179-181, issn 0925-8388Conference Paper

Towards a unified advanced CD-SEM specification for sub-0.18 μm technologyALLGAIR, J; ARCHIE, C; SULLIVAN, N et al.SPIE proceedings series. 1998, pp 138-150, isbn 0-8194-2777-2Conference Paper

Measurement of contamination rate and stage drift in Scanning Electron MicroscopesVLADAR, A. E.SPIE proceedings series. 1998, pp 192-198, isbn 0-8194-2777-2Conference Paper

A new optical column for a scanning positron microscopeUHLMANN, K; BRITTON, D. T; KÖGEL, G et al.Measurement science & technology (Print). 1995, Vol 6, Num 7, pp 932-938, issn 0957-0233Article

Synthesis of well-aligned carbon nanotube network on a gold-patterned quartz substrateANYUAN CAO; XIANFENG ZHANG; CAILU XU et al.Applied surface science. 2001, Vol 181, Num 3-4, pp 234-238, issn 0169-4332Article

A stitch in time for wide field SEM imagingANSELL, Paul.Materials world. 2000, Vol 8, Num 11, pp 13-14, issn 0967-8638Article

Formation of pyramids at surface of TMAH etched siliconCHOI, W. K; THONG, J. T. L; LUO, P et al.Applied surface science. 1999, Vol 144-45, pp 472-475, issn 0169-4332Conference Paper

Approach to CD SEM metrology utilizing the full waveform signalMCINTOSH, J. M; KANE, B. C; BINDELL, J. B et al.SPIE proceedings series. 1998, pp 51-60, isbn 0-8194-2777-2Conference Paper

Effect of exfoliation ratio on the flakiness of fine graphite particles obtained by grinding of exfoliated graphiteKUGA, Y; ENDOH, S; CHYODA, H et al.Carbon (New York, NY). 1997, Vol 35, Num 12, pp 1833-1836, issn 0008-6223Article

High yield synthesis and growth mechanism of carbon nanotubesZUJIN SHI; XIHUANG ZHOU; ZHAOXIA JIN et al.Solid state communications. 1996, Vol 97, Num 5, pp 371-375, issn 0038-1098Article

Matching analysis on seven manufacturing CDSEMsBOWLEY, R. R; BEECHER, J. E; COGLEY, R. M et al.SPIE proceedings series. 1998, pp 94-99, isbn 0-8194-2777-2Conference Paper

A novel correction scheme for quantitative voltage contrast measurements using low extraction fields in the scanning electron microscopeCHIM, W. K.Measurement science & technology (Print). 1995, Vol 6, Num 5, pp 488-495, issn 0957-0233Article

The interactions among the Al/Mo-N/Au multilayerKWANG-LUNG LIN; YU-JIN HO.Thin solid films. 1995, Vol 260, Num 1, pp 93-97, issn 0040-6090Article

Combinaison d'un microscope à force atomique et d'un microscope électronique à balayage = Coupling of an atomic force microscopy and a scanning electron microscopyTROYON, M; WANG, Z; LEI, H. N et al.Spectra 2000 analyse. 1995, Vol 24, Num 185, pp 55-59, issn 1255-2909Article

A contribution to the evaluation of scanning electron microscope resolutionMAULNY, A; FANGET, G. L.SPIE proceedings series. 1998, pp 71-80, isbn 0-8194-2777-2Conference Paper

Magnetic volcanos in gadolinium Langmuir-Blodgett filmsTISHIN, A. M; SNIGIREV, O. V; KHOMUTOV, G. B et al.Journal of magnetism and magnetic materials. 2001, Vol 234, Num 3, pp 499-504, issn 0304-8853Article

Enclosed surface laser ablation of laminated aluminium foilSTEWART, R; LI, L; THOMAS, D et al.Applied surface science. 2000, Vol 154-55, pp 47-52, issn 0169-4332Conference Paper

Fracture behavior of AZ91 magnesium alloyLÜ, Y. Z; WANG, Q. D; DING, W. J et al.Materials letters (General ed.). 2000, Vol 44, Num 5, pp 265-268, issn 0167-577XArticle

Scanning with ease through the far infraredTEMKIN, R.Science (Washington, D.C.). 1998, Vol 280, Num 5365, issn 0036-8075, p. 854Article

taking SEMs into a new environmentDONALD, A.Materials world. 1998, Vol 6, Num 7, pp 399-401, issn 0967-8638Article

Measuring the size and intensity distribution of SEM beam spotGOLDENSHTEIN, A; GOLD, Y. I; CHAYET, H et al.SPIE proceedings series. 1998, pp 132-137, isbn 0-8194-2777-2Conference Paper

Electronic memory switching in a new charge transfer-complex thin filmWANG, K. Z; XUE, Z. Q; OUYANG, M et al.Solid state communications. 1995, Vol 96, Num 7, pp 481-484, issn 0038-1098Article

Environmental scanning electron microscopesLI, M. J; ROGERS, K; RUST, C. A et al.Advanced materials & processes. 1995, Vol 148, Num 1, pp 24-25, issn 0882-7958Article

Controlled synthesis of aligned carbon nanotube arrays on catalyst patterned silicon substrates by plasma-enhanced chemical vapor depositionWANG, H; LIN, J; HUAN, C. H. A et al.Applied surface science. 2001, Vol 181, Num 3-4, pp 248-254, issn 0169-4332Article

Instant diagnosis with X-ray visionCROFT, Sally.Materials world. 2000, Vol 8, Num 11, pp 15-16, issn 0967-8638Article

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