ON THE REMAINDER TERM FOR THE CENTRAL LIMIT THEOREM.SHIMIZU R.1974; ANN. INST. STATIST. MATH.; JAP.; DA. 1974; VOL. 26; NO 2; PP. 195-201; BIBL. 3 REF.Article

FUNCTIONAL EQUATION WITH AN ERROR TERM AND THE STABILITY OF SOME CHARACTERIZATIONS OF THE EXPONENTIAL DISTRIBUTIONSHIMIZU R.1980; ANN. INST. STATIST. MATH.; JPN; DA. 1980; VOL. 32; NO 1; PP. 1-16; BIBL. 8 REF.Article

ON A LACK OF MEMORY PROPERTY OF THE EXPONENTIAL DISTRIBUTIONSHIMIZU R.1979; ANN. INST. STATIST. MATH.; JPN; DA. 1979; VOL. 31; NO 2; PP. 309-313; BIBL. 11 REF.Article

A CHARACTERIZATION OF THE EXPONENTIAL DISTRIBUTIONSHIMIZU R.1979; ANN. INST. STATIST. MATH.; JPN; DA. 1979; VOL. 31; NO 3; PP. 367-372; BIBL. 9 REF.Article

ON THE STABILITY OF CHARACTERIZATIONS OF THE EXPONENTIAL DISTRIBUTIONSHIMIZU R.1981; ANN. INST. STAT. MATH.; ISSN 0373-5990; JPN; DA. 1981; VOL. 33; NO 3; PP. 339-346; BIBL. 5 REF.Article

COMMENT ON "EVALUATION OF CONCENTRATION-DEPTH PROFILES BY SPUTTERING IN SIMS AND AES" BY S. HOFMANNSHIMIZU R.1979; APPL. PHYS.; DEU; DA. 1979; VOL. 18; NO 4; PP. 425-426; BIBL. 10 REF.Article

Aberration-free images observed with TEM and STEMSHIMIZU, R.Surface and interface analysis. 2003, Vol 35, Num 1, pp 55-59, issn 0142-2421, 5 p.Article

A HYBRID MONTE CARLO CALCULATION ESTIMATE OF ANGULAR DISTRIBUTION OF SPUTTERED ATOMS FOR KEV PROTON BOMBARDMENT = ESTIMATION PAR UN CALCUL DE MONTE CARLO HYBRIDE DE LA DISTRIBUTION ANGULAIRE DES ATOMES PULVERISES POUR UN BOMBARDEMENT PAR PROTONS DU KEVOKUTANI T; SHIMIZU R.1982; JPN. J. APPL. PHYS.; ISSN 0021-4922; JPN; DA. 1982; VOL. 21; NO 4; PART. 1; PP. 570-573; BIBL. 11 REF.Article

BACKSCATTERING CORRECTION FOR QUANTITATIVE AUGER ANALYSIS. I: MONTE CARLO CALCULATIONS OF BACKSCATTERING FACTORS FOR STANDARD MATERIALSICHIMURA S; SHIMIZU R.1981; SURF. SCI.; ISSN 0039-6028; NLD; DA. 1981; VOL. 112; NO 3; PP. 386-408; BIBL. 38 REF.Article

Excommunication and the Philosophy of SpinozaSHIMIZU, R.Inquiry Oslo. 1980, Vol 23, Num 3, pp 327-348Article

FUNDAMENTAL STUDIES ON THE LTE MODEL USING SECONDARY ION AND ION-INDUCED PHOTON EMISSIONSOKUTANI T; SHIMIZU R.1979; SURF. SCI.; ISSN 0039-6028; NLD; DA. 1979; VOL. 88; NO 2-3; PP. L51-L58; BIBL. 16 REF.Article

STUDY OF PREFERENTIAL SPUTTERING ON BINARY ALLOY BY IN-SITU AUGER MEASUREMENT OF SPUTTERED AND SPUTTER-DEPOSITED SURFACES.SHIMIZU R; SAEKI N.1977; SURF. SCI.; NETHERL.; DA. 1977; VOL. 62; NO 2; PP. 751-755; BIBL. 10 REF.Article

MONTE CARLO SIMULATION OF MULTIPLE INELASTIC SCATTERINGS IN CRYSTALS.KAMIYA Y; SHIMIZU R.1976; JAP. J. APPL. PHYS.; JAP.; DA. 1976; VOL. 15; NO 11; PP. 2067-2072; BIBL. 28 REF.Article

INITIAL OXIDATION STUDIES ON FE (100) BY MEANS OF PHOTOELECTRIC WORK FUNCTION MEASUREMENTS COMBINED WITH AUGER ELECTRON SPECTROSCOPYUEDA K; SHIMIZU R.1974; SURF. SCI.; NETHERL.; DA. 1974; VOL. 43; NO 1; PP. 77-87; BIBL. 27 REF.Article

Inequalities for a distribution with monotone hazard rateSHIMIZU, R.Annals of the Institute of Statistical Mathematics. 1986, Vol 38, Num 2, pp 195-204, issn 0020-3157Article

ON A CHARACTERISTIC PROPERTY OF THE UNIFORM DISTRIBUTIONSHIMIZU R; HUANG JS.1983; ANNALS OF THE INSTITUTE OF STATISTICAL MATHEMATICS; ISSN 0373-5990; JPN; DA. 1983; VOL. 35; NO 1; PP. 91-94; BIBL. 6 REF.Article

THICKNESS AND IN-DEPTH COMPOSITION PROFILE OF ALTERED LAYER CAUSED ON CU-NI ALLOY SURFACE DUE TO PREFERENTIAL SPUTTERING.SAEKI N; SHIMIZU R.1978; SURF. SCI.; NETHERL.; DA. 1978; VOL. 71; NO 2; PP. 479-490; BIBL. 36 REF.Article

AUGER STUDY OF PREFERENTIAL SPUTTERING FOR CU-NI ALLOY SAMPLE.SAEKI N; SHIMIZU R.1978; JAP. J. APPL. PHYS.; JAP.; DA. 1978; VOL. 17; NO 1; PP. 59-68; BIBL. 16 REF.Article

COMPUTER SIMULATION OF ATOMIC MIXING DURING ION BOMBARDEMENT.ISHITANI T; SHIMIZU R.1975; APPL. PHYS.; GERM.; DA. 1975; VOL. 6; NO 2; PP. 241-248; BIBL. 19 REF.Article

NONLINEAR VARIATION WITH APPLIED FIELD OF THE MOBILITY OF MAGNETIC DOMAIN WALLS IN YTTRIUM ORTHOFERRITEIKUTA T; SHIMIZU R.1973; J. PHYS. D; G.B.; DA. 1973; VOL. 6; NO 5; PP. 633-640; BIBL. 16 REF.Serial Issue

Expansion of scale mixtures of the gamma distributionSHIMIZU, R.Journal of statistical planning and inference. 1989, Vol 21, Num 3, pp 305-314, issn 0378-3758, 10 p.Article

Technique of sequential surface analysis with ISS and AES = Technique d'analyse de surface séquentielle avec ISS et AESSHIMIZU, R.Surface and interface analysis. 1988, Vol 11, Num 10, pp 510-516, issn 0142-2421Article

Quantitative analysis by Auger electron spectroscopySHIMIZU, R.Japanese journal of applied physics. 1983, Vol 22, Num 11, pp 1631-1642, issn 0021-4922Article

Expansion of the scale mixture of the multivariate normal distribution with error bound evaluated in the L₁-normSHIMIZU, R.Journal of multivariate analysis. 1995, Vol 53, Num 1, pp 126-138, issn 0047-259XArticle

OBSERVATION OF ELECTRON BEAM DAMAGE IN THIN-FILM SIO₂ ON SI WITH SCANNING AUGER ELECTRON MICROSCOPEICHIMURA S; SHIMIZU R.1979; J. APPL. PHYS.; ISSN 0021-8979; USA; DA. 1979; VOL. 50; NO 9; PP. 6020-6022; BIBL. 10 REF.Article