DO BLACK AND WHITE UNIVERSITY INTERNS DIFFER IN THEIR BASIC VALUES?SIKULA J. P.JOURNAL (THE) OF NEGRO EDUCATION. 1975, Vol 44, Num 2, pp 200-207Article

ETUDE DE PHENOMENES STOCHASTIQUES DANS DES DIODES AU GAASSIKULA J.1974; ELEKTROTECH. CAS.; CESKOSL.; DA. 1974; VOL. 25; NO 4-6; PP. 312-318; ABS. RUSSE ALLEM. ANGL.; BIBL. 11 REF.Article

FLUCTUATIONS DU COURANT DANS LES CONTACTS DE DIODES AU GAPSIKULA J.1977; ELEKTROTECH. CAS.; CESKOSL.; DA. 1977; VOL. 28; NO 1; PP. 43-47; ABS. RUSSE ALLEM. ANGL.; BIBL. 6 REF.Article

What Is Appropriate Historical Content in Black Studies CoursesSIKULA J. P; SIKULA R. R.Malaysian Journal of Education. 1975, Vol 12, Num 1-2, pp 69-72Article

Spark and glow DC-partial-discharges in dielectricsFICKER, T; SIKULA, J.Japanese journal of applied physics. 1984, Vol 23, Num 9, pp 1263-1264, issn 0021-4922, part 1Article

STOCHASTIC PHENOMENA IN EPITAXIAL P-N JUNCTIONS IN GAP.SIKULA J; KOKTAVY B; KRATENA L et al.1975; PHYS. STATUS SOLIDI, A; ALLEM.; DA. 1975; VOL. 29; NO 1; PP. 41-46; ABS. ALLEM.; BIBL. 10 REF.Article

Excess noise of the silicon surface barrier detectorsVOJTEK, J; SIKULA, J; TYKVA, R et al.Czechoslovak journal of physics. 1990, Vol 40, Num 11, pp 1289-1292, issn 0011-4626Article

Local avalanche breakdowns in semiconductor GaAsP diodesKOKTAVY, P; SIKULA, J; STOURAC, L et al.International conference on microelectronics. 2004, isbn 0-7803-8166-1, 2Vol, vol 2, 667-670Conference Paper

A low-frequency noise study of hot-carrier stressing effects in submicron Si p-MOSFETsVASINA, P; SIMOEN, E; CLAEYS, C et al.Microelectronics and reliability. 1998, Vol 38, Num 1, pp 23-27, issn 0026-2714Article

Investigation of excess 1 / f noise in CdTe single crystalsANDREEV, A; GRMELA, L; MORAVEC, P et al.Semiconductor science and technology. 2010, Vol 25, Num 5, issn 0268-1242, 055016.1-055016.7Article

Electromagnetic emission from polycrystalline solidsSIKULA, J; KOKTAVY, B; KOSIKOVA, I et al.Journal of acoustic emission. 1999, Vol 17, Num 3-4, pp S100-S107, issn 0730-0050Conference Paper

Are intra- and suprasellar masses detected by CT and MR really tumours ?TOTH, S; MIKO, L; KOLLAR, J et al.Acta neurochirurgica. 1995, Vol 137, Num 1-2, pp 54-57, issn 0001-6268Article

1/f Noise in GaAs Schottky diodesSIKULA, J; VASINA, P; MUSILOVA, V et al.Physica status solidi. A. Applied research. 1984, Vol 84, Num 2, pp 693-696, issn 0031-8965Article

Alterations of the connective tissue in nude miceGYARMATI, J. JR; MANDI, B; FACHET, J et al.Thymus. 1983, Vol 5, Num 5-6, pp 383-392, issn 0165-6090Article

Screening of vascular cognitive impairment on a Hungarian cohortSZATMARI, S; FEKETE, I; CSIBA, L et al.Psychiatry and clinical neurosciences (Carlton. Print). 1999, Vol 53, Num 1, pp 39-43, issn 1323-1316Article

Utilizing CFD as an efficient tool for improved equipment designHAJEK, J; KERMES, V; STEHLIK, P et al.Heat transfer engineering. 2005, Vol 26, Num 5, pp 15-24, issn 0145-7632, 10 p.Conference Paper

Screening for Depressive symptoms in the acute phase of strokeKELLERMANN, N; FEKETE, I; GESZTELYI, R et al.General hospital psychiatry. 1999, Vol 21, Num 2, pp 116-121, issn 0163-8343Article

Low frequency noise of tantalum capacitorsSIKULA, J; HLAVKA, J; PAVELKA, J et al.Active and passive electronic components. 2002, Vol 25, Num 2, pp 161-167, issn 0882-7516Article

Posterior interbody fusion using laminectomy bone and transpedicular screw fixation in the treatment of lumbar spondylolisthesis. CommentaryCSECSEI, G. I; KLEKNER, A. P; DOBAI, J et al.Surgical neurology. 2000, Vol 53, Num 1, pp 2-7, issn 0090-3019Article

Energy utilization from industrial sludge processingORAL, J; STEHLIK, P; SIKULA, J et al.Energy (Oxford). 2005, Vol 30, Num 8, pp 1343-1352, issn 0360-5442, 10 p.Conference Paper

Polarization and fluctuation characteristics of tantalum solid electrolyte capacitors : Quality and reliability aspects of passive componentsZEDNICEK, T; SIKULA, J; HRUSKA, P et al.Quality and reliability engineering international. 1998, Vol 14, Num 2, pp 73-77, issn 0748-8017Conference Paper