SILAFUNCTIONAL COMPOUNDS. SYNTHESIS AND REACTIVITY: ANNUAL SURVEY FOR THE YEAR 1980COREY JY.1982; J. ORGANOMET. CHEM. LIBR.; ISSN 0378-5203; NLD; DA. 1982; VOL. 13; PP. 1-125; BIBL. 512 REF.Article

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SILICON. THE SILICON-CARBON BOND: ANNUAL SURVEY FOR THE YEAR 1980LARSON GL.1982; J. ORGANOMET. CHEM. LIBR.; ISSN 0378-5203; NLD; DA. 1982; VOL. 13; PP. 387-486; BIBL. 290 REF.Article

ETUDE DE LA PHOTOSENSIBILITE DU SYSTEME SI-SIO₂IVANOV EI; LOPATINA LB; SUKHANOV VL et al.1981; FIZ. TEH. POLUPROVODN.; ISSN 0015-3222; SUN; DA. 1981; VOL. 15; NO 7; PP. 1343-1348; BIBL. 14 REF.Article

POLYTYPISME DU CARBURE DE SILICIUM: LOCALISATION ET STRUCTURE DU POLYTYPE 102R BASE SUR LA SEQUENCE (34).GAUTHIER JP; MICHEL P.1977; ACTA CRYSTALLOGR., A; DANEM.; DA. 1977; VOL. 33; NO 4; PP. 676-677; H.T. 1; ABS. ANGL.; BIBL. 7 REF.Article

MOLECULAR STRUCTURE, MICROSTRUCTURE, MACROSTRUCTURE AND PROPERTIES OF SILICON NITRIDE.JENNINGS HM; EDWARDS JO; RICHMAN MH et al.1976; INORG. CHIM. ACTA; ITAL.; DA. 1976; VOL. 20; NO 2; PP. 167-181; BIBL. 28 REF.Article

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ANALYSIS OF PARALLEL SCHOTTKY CONTACTS BY DIFFERENTIAL INTERNAL PHOTOEMISSION SPECTROSCOPYOKUMURA T; TU KN.1983; JOURNAL OF APPLIED PHYSICS; ISSN 0021-8979; USA; DA. 1983; VOL. 54; NO 2; PP. 922-927; BIBL. 14 REF.Article

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CERAMICS: IS THE U.S. LOSING OUT AGAIN.HARVEY RE.1983; IRON AGE; ISSN 0164-5137; USA; DA. 1983-02; VOL. 226; NO 4; PP. 34-36Article

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A REVISED ANALYSIS OF DRY OXIDATION OF SILICONFARGEIX A; GHIBAUDO G; KAMARINOS G et al.1983; JOURNAL OF APPLIED PHYSICS; ISSN 0021-8979; USA; DA. 1983; VOL. 54; NO 5; PP. 2878-2880; BIBL. 12 REF.Article

DETERMINATION OF SILICON IN METALLIC TITANIUM AND IN TITANIUM BASE ALLOYS BY ATOMIC ABSORPTIONGORLOVA MN; VELLER ND; SKORSKAYA OL et al.1982; IND. LAB.; ISSN 0019-8447; USA; DA. 1982-12; VOL. 48; NO 6; PP. 560-562; BIBL. 1 REF.Article

SELECTIVE ISOTROPIC DRY ETCHING OF SI₃N₄ OVER SIO₂SANDERS FHM; DIELEMAN J; PETERS HJB et al.1982; JOURNAL OF THE ELECTROCHEMICAL SOCIETY; ISSN 0013-4651; USA; DA. 1982; VOL. 129; NO 11; PP. 2559-2561; BIBL. 7 REF.Article

SUBMICROMETER POLYSILICON GATE CMOS/SOS TECHNOLOGYIPRI AC; SOKOLOSKI JC; FLATLEY DW et al.1980; I.E.E.E. TRANS. ELECTRON DEVICES; USA; DA. 1980; VOL. 27; NO 7; PP. 1275-1279; BIBL. 9 REF.Article

KERAMOGRAPHIE: GEFUEGEANALYSE KERAMISCHER WERKSTOFFE = CERAMOGRAPHY: MICROSTRUCTURAL ANALYSIS OF CERAMIC MATERIALSGUGEL E.1980; RADEX-RUNDSCH.; AUT; DA. 1980-05; VOL. 1/2; PP. 83-90Conference Paper

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NON-AXIAL DISLOCATIONS IN REACTION-SINTERED SILICON NITRIDE.MARQUIS PM; BUTLER E.1977; J. MATER. SCI.; G.B.; DA. 1977; VOL. 12; NO 2; PP. 424-426; BIBL. 4 REF.Article

ULTRAFILTRATION-LIGHT SPECTROPHOTOMETRIC DETERMINATION OF SILICON IN BLOODIHNAT M.1982; ANALYTICAL BIOCHEMISTRY; ISSN 0003-2697; USA; DA. 1982; VOL. 124; NO 2; PP. 380-395; BIBL. 14 REF.Article

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