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au.\*:("SILVERMAN PJ")

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SUPERCONDUCTING FLUCTUATION EFFECTS IN AMORPHOUS-BISMUTH THIN FILMS IN THE PRESENCE OF A PERPENDICULAR MAGNETIC FIELDSILVERMAN PJ.1979; PHYS. REV., B; USA; DA. 1979; VOL. 19; NO 1; PP. 233-237; BIBL. 21 REF.Article

THE ROLE OF SOCIAL REINFORCEMENT IN MAINTAINING AN OBSESSIVE-COMPULSIVE NEUROSIS.SILVERMAN PJ.1977; J. BEHAV. THERAPY EXPER. PSYCHIATRY; G.B.; DA. 1977; VOL. 8; NO 3; PP. 325-326; BIBL. 7 REF.Article

SUPERCONDUCTING FLUCTUATION EFFECTS IN THE RESISTIVE TRANSITION OF AMORPHOUS BISMUTH FILMS.SILVERMAN PJ.1977; PHYS. REV., B; U.S.A.; DA. 1977; VOL. 16; NO 5; PP. 2066-2071; BIBL. 28 REF.Article

THE KONDO EFFECT IN LOW TEMPERATURE DEPOSITED CU(FE) FILMS.SILVERMAN PJ; BRISCOE CV.1975; SOLID STATE COMMUNIC.; G.B.; DA. 1975; VOL. 16; NO 4; PP. 367-369; BIBL. 9 REF.Article

SUPERCONDUCTING TUNNELING IN PDH.SILVERMAN PJ; BRISCOE CV.1975; PHYS. LETTERS, A; NETHERL.; DA. 1975; VOL. 53; NO 3; PP. 221-222; BIBL. 9 REF.Article

A RUTHERFORD SCATTERING ANALYSIS OF ANODIC TANTALUM-SILICON OXIDES.SILVERMAN PJ; SCHWARTZ N.1974; J. ELECTROCHEM. SOC.; U.S.A.; DA. 1974; VOL. 121; NO 4; PP. 550-555; BIBL. 23 REF.Article

EFFECT OF ANNEALING ON THE RESISTIVITY OF QUENCH-CONDENSED CU AND CU(FE) THIN FILMS.SILVERMAN PJ; BRISCOE CV.1978; J. LOW TEMPER. PHYS.; U.S.A.; DA. 1978; VOL. 30; NO 3-4; PP. 541-549; BIBL. 19 REF.Article

TEMPERATURE DEPENDENCE OF THE RESISTIVITY OF CUFE THIN FILMS WITH FE CONCENTRATIONS ABOVE 0,1 AT.%.SILVERMAN PJ; BRISCOE CV.1977; PHYS. REV., B; U.S.A.; DA. 1977; VOL. 15; NO 9; PP. 4336-4340; BIBL. 28 REF.Article

STRUCTURAL STUDIES OF THE RECONSTRUCTED W(001) SURFACE WITH MEV ION SCATTERINGFELDMAN LC; SILVERMAN PJ; STENSGAARD I et al.1979; SURF. SCI.; ISSN 0039-6028; NLD; DA. 1979; VOL. 87; NO 2; PP. 410-414; BIBL. 8 REF.Article

EVIDENCE OF MULTILAYER DISTORTIONS IN THE RECONSTRUCTED SI(001) SURFACESTENSGAARD I; FELDMAN LC; SILVERMAN PJ et al.1981; SURF. SCI.; ISSN 0039-6028; NLD; DA. 1981; VOL. 102; NO 1; PP. 1-6; BIBL. 13 REF.Article

USE OF THIN SI CRYSTALS IN BACKSCATTERING-CHANNELING STUDIES OF THE SI-SIO2 INTERFACEFELDMAN LC; SILVERMAN PJ; WILLIAMS JS et al.1978; PHYS. REV. LETTERS; USA; DA. 1978; VOL. 41; NO 20; PP. 1396-1399; BIBL. 5 REF.Article

CALCULATION OF THE BACKSCATTERING-CHANNELING SURFACE PEAKSTENSGAARD I; FELDMAN LC; SILVERMAN PJ et al.1978; SURF. SCI.; NLD; DA. 1978; VOL. 77; NO 3; PP. 513-522; BIBL. 17 REF.Article

CONTINGENCY AND STIMULUS CHANGE IN CHAINED SCHEDULES OF REINFORCEMENTCATANIA AC; YOHALEM R; SILVERMAN PJ et al.1980; J. EXPER. ANAL. BEHAV.; USA; DA. 1980; VOL. 33; NO 2; PP. 213-219; BIBL. 15 REF.Article

RECONSTRUCTION OF THE W(001) SURFACE AND ITS REORDERING BY HYDROGEN ADSORPTION, STUDIED BY MEV ION SCATTERINGSTENSGAARD I; FELDMAN LC; SILVERMAN PJ et al.1979; PHYS. REV. LETTERS; USA; DA. 1979; VOL. 42; NO 4; PP. 247-250; BIBL. 14 REF.Article

SURFACE SCATTERING FROM W SINGLE CRYSTALS BY MEV HE+ IONS.FELDMAN LC; KAUFFMAN RL; SILVERMAN PJ et al.1977; PHYS. REV. LETTERS; U.S.A.; DA. 1977; VOL. 39; NO 1; PP. 38-41; BIBL. 14 REF.Article

YOKED VARIABLE-RATIO AND VARIABLE-INTERVAL RESPONDING IN PIGEONS.CATANIA AC; MATTHEWS TJ; SILVERMAN PJ et al.1977; J. EXPER. ANAL. BEHAV.; U.S.A.; DA. 1977; VOL. 28; NO 2; PP. 155-161; BIBL. 1 P.Article

EPITAXY OF AU ON AG(111) STUDIED BY HIGH-ENERGY ION SCATTERING = EPITAXIE DE AU SUR AG(111) ETUDIEE PAR DIFFUSION D'IONS DE HAUTE ENERGIECULBERTSON RJ; FELDMAN LC; SILVERMAN PJ et al.1981; PHYS. REV. LETT.; ISSN 0031-9007; USA; DA. 1981; VOL. 47; NO 9; PP. 657-660; BIBL. 10 REF.Article

SIGNIFICANCE OF THE CHANNELING SURFACE PEAK IN THIN-FILM ANALYSIS.KAUFFMAN RL; FELDMAN LC; SILVERMAN PJ et al.1978; APPL. PHYS. LETTERS; U.S.A.; DA. 1978; VOL. 32; NO 2; PP. 93-94; BIBL. 8 REF.Article

ANGIOGRAPHIC FEATURES OF PERIPANCREATIC MALIGNANT LYMPHOMA = ASPECTS ANGIOGRAPHIQUES DU LYMPHOME MALIN PERIPANCREATIQUENEIMAN HL; GOLDSTEIN HM; SILVERMAN PJ et al.1975; RADIOLOGY; U.S.A.; DA. 1975; VOL. 115; NO 3; PP. 589-592; BIBL. 12REF.Article

STUDIES ON THE SI-SIO2 INTERFACE BY MEV ION CHANNELINGCHEUNG NW; FELDMAN LC; SILVERMAN PJ et al.1979; APPL. PHYS. LETT.; ISSN 0003-6951; USA; DA. 1979; VOL. 35; NO 11; PP. 859-861; BIBL. 7 REF.Article

NI ON SI (111): REACTIVITY AND INTERFACE STRUCTURECHEUNG NW; CULBERTSON RJ; FELDMAN LC et al.1980; PHYS. REV. LETT.; ISSN 0031-9007; USA; DA. 1980; VOL. 45; NO 2; PP. 120-124; BIBL. 18 REF.Article

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