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Results 1 to 25 of 10772

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Matrix-enhanced secondary ion mass spectrometry : The Alchemist's solution?DELCORTE, Arnaud.Applied surface science. 2006, Vol 252, Num 19, pp 6582-6587, issn 0169-4332, 6 p.Conference Paper

Estimation of useful yields for electrospray droplet impact/secondary ion mass spectrometry (EDI/SIMS)HIRAOKA, Kenzo; ASAKAWA, Daiki; TAKAISHI, Rio et al.Surface and interface analysis. 2013, Vol 45, Num 6, pp 968-972, issn 0142-2421, 5 p.Article

G-SIMS of thermosetting polymersHAWTIN, P. N; ABEL, M.-L; WATTS, J. F et al.Applied surface science. 2006, Vol 252, Num 19, pp 6676-6678, issn 0169-4332, 3 p.Conference Paper

Mass accuracy- : TOF-SIMSGREEN, F. M; GILMORE, I. S; SEAH, M. P et al.Applied surface science. 2006, Vol 252, Num 19, pp 6591-6593, issn 0169-4332, 3 p.Conference Paper

Characterization of organic solar cell materials by G-SIMSFRANQUET, A; CONARD, T; VOROSHAZI, E et al.Surface and interface analysis. 2013, Vol 45, Num 1, pp 430-433, issn 0142-2421, 4 p.Conference Paper

Analysis of volatile nanoparticles emitted from diesel engine using TOF-SIMS and metal-assisted SIMS (MetA-SIMS)INOUE, Masae; MURASE, Atsushi; YAMAMOTO, Masami et al.Applied surface science. 2006, Vol 252, Num 19, pp 7014-7017, issn 0169-4332, 4 p.Conference Paper

Characterisation of irradiated nuclear fuel with SIMSDESGRANGES, L; VALOT, Ch; PASQUET, B et al.Applied surface science. 2006, Vol 252, Num 19, pp 7048-7050, issn 0169-4332, 3 p.Conference Paper

Direct ToF-SIMS analysis of organic halides and amines on TLC platesPARENT, Alexander A; ANDERSON, Thomas M; MICHAELIS, David J et al.Applied surface science. 2006, Vol 252, Num 19, pp 6746-6749, issn 0169-4332, 4 p.Conference Paper

Detection of peptides in high concentration of salts by electrospray droplet impact/secondary ion mass spectrometryASAKAWA, Daiki; HIRAOKA, Kenzo.Surface and interface analysis. 2011, Vol 43, Num 10, pp 1341-1345, issn 0142-2421, 5 p.Article

Isotope ratio measurement with a multicollector detector on the cameca IMS nfLORINCIK, Jan; HERVIG, Richard; FRANZREB, Klaus et al.Applied surface science. 2006, Vol 252, Num 19, pp 7301-7303, issn 0169-4332, 3 p.Conference Paper

Characterisation of electrospun nanowebs with static secondary ion mass spectrometry (S-SIMS)VAN ROYEN, P; DOS SANTOS, A. M; SCHACHT, E et al.Applied surface science. 2006, Vol 252, Num 19, pp 6992-6995, issn 0169-4332, 4 p.Conference Paper

ToF-SIMS characterisation of diterpenoic acids after chromatographic separationORINAK, Andrej; ORINAKOVA, Renata; ARLINGHAUS, Heinrich F et al.Applied surface science. 2006, Vol 252, Num 19, pp 6668-6671, issn 0169-4332, 4 p.Conference Paper

Investigation of methods to enhance the secondary ion yields in TOF-SIMS of organic samplesHEILE, A; LIPINSKY, D; VAN VAECK, L et al.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 538-542, issn 0142-2421, 5 p.Conference Paper

Empirical evaluation of metal deposition for the analysis of organic compounds with static secondary ion mass spectrometry (S-SIMS)DE MONDT, R; ADRIAENSEN, L; VANGAEVER, F et al.Applied surface science. 2006, Vol 252, Num 19, pp 6652-6655, issn 0169-4332, 4 p.Conference Paper

G-SIMS of biodegradable homo-polyestersOGAKI, R; GREEN, F; LI, S et al.Applied surface science. 2006, Vol 252, Num 19, pp 6797-6800, issn 0169-4332, 4 p.Conference Paper

Surface characterization and stability of an epoxy resin surface modified with polyamines grafted on polydopamineSCHAUBROECK, David; VERCAMMEN, Yannick; VAN VAECK, Luc et al.Applied surface science. 2014, Vol 303, pp 465-472, issn 0169-4332, 8 p.Article

Oxidation effect on the SIMS analysis of samples sputtered and deposited by the Storing Matter techniqueMANSILLA, C; WIRTZ, T.Applied surface science. 2012, Vol 258, Num 15, pp 5698-5702, issn 0169-4332, 5 p.Article

Surface characterization of plasma-modified resist patterns by ToF-SIMS analysisPARK, Jong S; KIM, Hyung-Jun.Applied surface science. 2010, Vol 256, Num 5, pp 1604-1608, issn 0169-4332, 5 p.Article

ToF-SIMS studies of Bacillus using multivariate analysis with possible identification and taxonomic applicationsTHOMPSON, C. E; ELLIS, J; FLETCHER, J. S et al.Applied surface science. 2006, Vol 252, Num 19, pp 6719-6722, issn 0169-4332, 4 p.Conference Paper

Rapid discrimination of the causal agents of urinary tract infection using ToF-SIMS with chemometric cluster analysisFLETCHER, John S; HENDERSON, Alexander; JARVIS, Roger M et al.Applied surface science. 2006, Vol 252, Num 19, pp 6869-6874, issn 0169-4332, 6 p.Conference Paper

SIMS analysis of residual gas elements with a cameca IMS-6f ion microprobeKUDRIAVTSEV, Yu; VILLEGAS, A; GODINES, A et al.Applied surface science. 2006, Vol 252, Num 10, pp 3406-3412, issn 0169-4332, 7 p.Article

Development towards label- and amplification-free genotyping of genomic DNABRANDT, O; FELDNER, J; HELLWEG, S et al.Applied surface science. 2006, Vol 252, Num 19, pp 6935-6940, issn 0169-4332, 6 p.Conference Paper

Mass spectrometric characterization of DNA microarrays as a function of primary ion speciesHELLWEG, S; JACOB, A; HOHEISEL, J. D et al.Applied surface science. 2006, Vol 252, Num 19, pp 6742-6745, issn 0169-4332, 4 p.Conference Paper

SIMS analytical technique for N profile in SiON/SiN/SiKIM, Sung-Kyu; LEE, B. H; PARK, C. G et al.Surface and interface analysis. 2012, Vol 44, Num 11-12, pp 1488-1491, issn 0142-2421, 4 p.Conference Paper

Improvements in SIMS continue Is the end in sight?WINOGRAD, Nicholas; POSTAWA, Zbigniew; JUAN CHENG et al.Applied surface science. 2006, Vol 252, Num 19, pp 6836-6843, issn 0169-4332, 8 p.Conference Paper

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