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ETAGE D'ENTREE POTENTIEL D'UN DISPOSITIF A COUPLAGE PAR CHARGE EN REGIME DE FAIBLES SIGNAUXVINETSKIJ YU R; TRISHENKOV MA.1981; RADIOTEKH. I ELEKTRON.; SUN; DA. 1981; VOL. 26; NO 4; PP. 852-865; BIBL. 14 REF.Article

OUTPUT INDUCTANCE OF AN EMITTER FOLLOWERCHOMA J JR.1979; IEE J. ELECTRON. CIRCUITS SYST.; GBR; DA. 1979; VOL. 3; NO 4; PP. 162-164; BIBL. 3 REF.Article

CHARACTERIZATION OF CHARGE-TRANSFER DEVICES WITH POSITION-DEPENDENT SMALL-SIGNAL TRANSFER INEFFICIENCYBARSAN RM.1980; INTERNATION. J. ELECTRON.; GBR; DA. 1980; VOL. 48; NO 2; PP. 149-164; BIBL. 27 REF.Article

THE METHOD FOR DETERMINATION SMALL-SIGNAL ADMITTANCE MATRIX OF THE RC TRANSMISSION LINE WITH VOLTAGE-CONTROLLED PARAMETERSKACPRZAK T.1980; I.E.E.E. TRANS. CIRCUITS SYST.; USA; DA. 1980; VOL. 27; NO 4; PP. 318-320; BIBL. 11 REF.Article

EIGENMODE INTERACTIONS IN GYROTRON ELECTRON BEAMSDOEHLER O; DOEHLER G; SMITH ST et al.1979; I.E.E.E. TRANS. ELECTRON DEVICES; USA; DA. 1979; VOL. 26; NO 10; PP. 1655-1661; BIBL. 10 REF.Article

INFLUENCE OF CARRIER TRANSIT TIME ON THE SMALL-SIGNAL ADMITTANCE OF SCLC DIODES.JAGER D; HEIDE MANN R; KASSING R et al.1977; PHYS. STATUS SOLIDI, A; ALLEM.; DA. 1977; VOL. 42; NO 2; PP. 657-665; ABS. ALLEM.; BIBL. 10 REF.Article

SMALL-SIGNAL RESPONSE OF A GERMANIUM MAGNETODIODE.PFLEIDERER H; STRANSKY G.1977; NACHR.-TECH. Z.; DTSCH.; DA. 1977; VOL. 30; NO 4; PP. 330-333; ABS. ALLEM.; BIBL. 22 REF.Article

PRISE EN COMPTE DE L'EFFET DYNAMIQUE DE DEPLACEMENT DANS UN MODELE A FAIBLES SIGNAUX DE TRANSISTOR HAUTE FREQUENCEBUBENNIKOV AN.1977; IZVEST. VYSSH. UCHEBN. ZAVED., RADIOELEKTRON.; UKR; DA. 1977; VOL. 20; NO 8; PP. 83-90; BIBL. 7 REF.Article

A SIMPLE SMALL-SIGNAL TWO-PORT MOST MODEL FOR THE PRE-PINCHOFF REGION.UMESH KUMAR; DUTTA ROY SC.1977; SOLID-STATE ELECTRON.; G.B.; DA. 1977; VOL. 20; NO 12; PP. 1021-1022; BIBL. 4 REF.Article

MODELLBETRACHTUNGEN ZUM LATERALTRANSISTOR MIT SEGMENT-GEGENKOPPLUNGBAUMANN P; MOELLER W.1981; NACHRITENTECH., ELEKTRON.; ISSN 0323-4657; DDR; DA. 1981; VOL. 31; NO 2; PP. 52-55; ABS. RUS/ENG/FRE; BIBL. 3 REF.Article

EFFECT OF MOBILE SPACE-CHARGE ON THE SMALL-SIGNAL ADMITTANCE OF DDR SILICON IMPATTS AT HIGH CURRENT DENSITIESSRIDHARAN M; ROY SK.1980; SOLID-STATE ELECTRON.; ISSN 0038-1101; GBR; DA. 1980; VOL. 23; NO 9; PP. 1001-1003; BIBL. 6 REF.Article

SMALL SIGNAL FREQUENCY CHARACTERISTIC OF ELECTROLUMINESCENT DIODESKUCERA L; SNEJDAR V; BARANKOVA H et al.1979; ACTA TECH. C.S.A.V.; CSK; DA. 1979; VOL. 24; NO 4; PP. 466-476; BIBL. 13 REF.Article

THE INTERNAL DYNAMICS AND SMALL SIGNAL ANALYSIS OF BARITT DIODESRAZOUK RR; GUNSHOR RL; RAZOUK LR et al.1979; SOLID-STATE ELECTRON.; GBR; DA. 1979; VOL. 22; NO 12; PP. 1011-1015; BIBL. 10 REF.Article

A LONG-CHANNEL MOSFET MODELVAN DE WIELE F.1979; SOLID-STATE ELECTRON.; GBR; DA. 1979; VOL. 22; NO 12; PP. 991-997; BIBL. 6 REF.Article

A SMALL SIGNAL NOISE ANALYSIS FOR REALISTIC GAAS IMPATT DIODE.MATHUR PC; VIJENDER SHARMA; PRAVEEN SAXENA et al.1978; PHYS. STATUS SOLIDI, A; ALLEM.; DA. 1978; VOL. 46; NO 1; PP. 321-326; ABS. ALLEM.; BIBL. 10 REF.Article

SMALL SIGNAL ANALYSIS AND OPTIMIZATION OF THE BARITT DIODE.YU SY; THOMAS G.1977; SOLID STATE ELECTRON.; G.B.; DA. 1977; VOL. 20; NO 10; PP. 831-837; BIBL. 9 REF.Article

SAFE OPERATION OF CAPACITANCE METERS USING HIGH APPLIED-BIAS VOLTAGE.GOODMAN AM.1976; R.C.A. REV.; U.S.A.; DA. 1976; VOL. 37; NO 4; PP. 491-514; BIBL. 3 REF.Article

FURTHER COMMENTS ON "EFFECTS OF CARRIER DIFFUSION ON THE SMALL-SIGNAL BEHAVIOR OF IMPATT DIODES"BRAZIL TJ; SCANLAN JO.1980; IEEE TRANS. ELECTRON DEVICES; ISSN 0018-9383; USA; DA. 1980; VOL. 27; NO 11; PP. 2167; BIBL. 2 REF.Article

COMPUTER AIDED CHARACTERIZATION OF BIPOLAR TRANSISTOR FOR CAD APPLICATIONSANTOGNETTI P; BERRINI A; VALLINI P et al.1979; ALTA FREQ.; ITA; DA. 1979; VOL. 48; NO 7; PP. 420-424; BIBL. 6 REF.Article

A SMALL-SIGNAL ANALYTICAL THEORY FOR GAAS FIELD-EFFECT TRANSISTORS AT LARGE DRAIN VOLTAGESSONE J; TAKAYAMA Y.1978; I.E.E.E. TRANS. ELECTRON. DEVICES; USA; DA. 1978; VOL. 25; NO 3; PP. 329-337; BIBL. 20 REF.Article

VIERPOLPARAMETER UND KLEINSIGNALERSATZSCHALTBILD DES BIPOLARTRANSISTORS BEI KLEINEN RUHESTROEMEN. = PARAMETRES DU QUADRIPOLE ET SCHEMA EQUIVALENT EN REGIME DE SIGNAL FAIBLE DU TRANSISTOR BIPOLAIRE DANS LE CAS DE FAIBLES COURANTS DE REPOSSEIFART M.1977; WISSENSCH. Z. TECH. HOCHSCH. OTTO VON GUERICKE MAGDEBURG; DTSCH.; DA. 1977; VOL. 21; NO 1(2); PP. 173-176; BIBL. 7 REF.Article

KLEINSIGNALVERHALTEN VON MOS-FELDEFFEKTTRANSISTOREN. = COMPORTEMENT EN REGIME DE SIGNAL FAIBLE DE TRANSISTORS A EFFET DE CHAMP MOSSCHWAB H.1976; ARCH. ELEKTROTECH.; DTSCH.; DA. 1976; VOL. 58; NO 3; PP. 141-150; ABS. ANGL.; BIBL. 6 REF.Article

SMALL-SIGNAL ADMITTANCE STUDY OF GAAS ANODIC MOS SYSTEMSAWADA T; HASEGAWA H.1979; PHYS. STATUS SOLIDI, A; DDR; DA. 1979; VOL. 54; NO 2; PP. 689-696; ABS. GER; BIBL. 18 REF.Article

PERTURBING A PARAMETER IN A "SMALL-SIGNAL" DEVICE SIMULATION.STARTIN RA.1978; I.E.E.E. J. SOLID-STATE ELECTRON DEVICES; GBR; DA. 1978; VOL. 2; NO 4; PP. 123-127; BIBL. 7 REF.Article

SCHOTTKY BARRIER IMPEDANCE MEASUREMENTS AT UHFDYER GR; HOWES MJ; MORGAN DV et al.1980; IEEE TRANS. MICROWAVE THEORY TECH.; ISSN 0018-9480; USA; DA. 1980; VOL. 28; NO 4; PP. 429-430; BIBL. 8 REF.Article

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