SPACE-CHARGE CAPACITANCE OF THIN NON-DEGENERATE SEMICONDUCTOR FILMS.JERHOT J; SNEJDAR V.1975; THIN SOLID FILMS; NETHERL.; DA. 1975; VOL. 26; NO 2; PP. 329-340; BIBL. 7 REF.Article

ON THE DETERMINATION OF THE ELECTRONIC PROPERTIES OF THE INACCESSIBLE THIN FILM SEMICONDUCTOR-SOLID SUBSTANCE INTERFACE BY THE MIS CAPACITANCE METHOD.SNEJDAR V; JERHOT J.1975; THIN SOLID FILMS; NETHERL.; DA. 1975; VOL. 26; NO 2; PP. 341-348; BIBL. 10 REF.Article

URCOVANI POVRCHOVEHO POTENCIALU NA VOLNEM POVRCHU POLOVODICOVYCH TENKYCH VRSTEV METODOU KMITAJICI ELEKTRODY. = DETERMINATION DU POTENTIEL DE SURFACE SUR DES SURFACES LIBRES DE COUCHES MINCES SEMICONDUCTRICES PAR LA METHODE D'ELECTRODE OSCILLANTESNEJDAR V; JERHOT J; VAVRA B et al.1974; ELEKTROTECH. CAS.; CESKOSL.; DA. 1974; VOL. 25; NO 7; PP. 531-539; ABS. RUSSE ALLEM. ANGL.; BIBL. 9 REF.Article

SMALL SIGNAL FREQUENCY CHARACTERISTIC OF ELECTROLUMINESCENT DIODESKUCERA L; SNEJDAR V; BARANKOVA H et al.1979; ACTA TECH. C.S.A.V.; CSK; DA. 1979; VOL. 24; NO 4; PP. 466-476; BIBL. 13 REF.Article

ULTRASTRUCTURAL CHANGES, CAUSED BY THE NEW ANTIBIOTIC MUCIDIN IN CANDIDA PSEUDOTROPICALISSNEJDAR V; SASEK V; MUSILEK V et al.1976; ZBL. BAKTERIOL. PARASITENKDE INFEKT.-KRANKH. HYG., 2; DTSCH.; DA. 1976; VOL. 131; NO 2; PP. 97-100; ABS. ALLEM.; BIBL. 4 REF.Article

ELECTRICAL PROPERTIES OF CDSE THIN FILMS COVERED BY DIELECTRIC LAYERS OF SI_XO_Y OR DY₂O₃SNEJDAR V; JERHOT J; BERKOVA D et al.1973; PHYS. STATUS SOLIDI, A; ALLEM.; DA. 1973; VOL. 15; NO 2; PP. 691-696; ABS. ALLEM.; BIBL. 13 REF.Serial Issue