A STRAIN ANALYSIS TECHNIQUE BY SCATTERED-LIGHT SPECKLE PHOTOGRAPHYHOLOUBEK J; RUZEK J.1979; OPT. ACTA; GBR; DA. 1979; VOL. 26; NO 1; PP. 43-54; BIBL. 14 REF.Article

MEASUREMENT OF FLOW VELOCITY DISTRIBUTION BY MULTIPLE-EXPOSURE SPECKLE PHOTOGRAPHY.IWATA K; HAKOSHIMA T; NAGATA R et al.1978; OPT. COMMUNIC.; NETHERL.; DA. 1978; VOL. 25; NO 3; PP. 311-314; BIBL. 11 REF.Article

MEASUREMENT OF SUBSPECKLE-SIZE CHANGES BY LASER-SPECKLE PHOTOGRAPHYVIKRAM CS; VEDAM K.1979; OPT. LETTERS; USA; DA. 1979; VOL. 4; NO 12; PP. 406-407; BIBL. 4 REF.Article

DETERMINATION DES ABERRATIONS D'UN SYSTEME OPTIQUE PAR INTERFEROMETRIE "SPECKLE"MENU M; ROBIN ML.1979; J. OPT.; FRA; DA. 1979; VOL. 10; NO 2; PP. 71-78; ABS. ENG; BIBL. 7 REF.Article

DIFFERENTIAL SPECKLE INTERFEROMETRYBECKERS JM.1982; OPT. ACTA; ISSN 0030-3909; GBR; DA. 1982; VOL. 29; NO 4; PP. 361-362; BIBL. 2 REF.Conference Paper

EXTRACTION OF INPLANE DISPLACEMENT FROM SANDWICH HOLOGRAMS USING SPECKLE PHOTOGRAPHYSHARMA DK; SIROHI RS; KOTHIYAL MP et al.1982; OPT. COMMUN.; ISSN 0030-4018; NLD; DA. 1982; VOL. 43; NO 1; PP. 18-20; BIBL. 10 REF.Article

ACOUSTICAL MEASUREMENT OF SURFACE ROUGHNESS USING INTERFEROMETRY AND SPECKLE CORRELATIONGAZANHES C; CALAROA A; CONDAT R et al.1982; SIGNAL PROCESS.; ISSN 0165-1684; NLD; DA. 1982; VOL. 4; NO 2-3; PP. 155-167; ABS. GER/FRE; BIBL. 12 REF.Article

AN ELECTRO-OPTICAL READ-OUT SYSTEM FOR ANALYSIS OF SPECKLE PHOTOGRAPHSKAUFMANN GH; ENNOS AE; GALE B et al.1980; J. PHYS. E; ISSN 0022-3735; GBR; DA. 1980; VOL. 13; NO 5; PP. 579-584; BIBL. 9 REF.Article

SPECKLE IN ACHROMATIC-FOURIER-TRANSFORM SYSTEMSBROPHY C; MORRIS GM.1982; JOURNAL OF THE OPTICAL SOCIETY OF AMERICA (1930); ISSN 0030-3941; USA; DA. 1982; VOL. 73; NO 1; PP. 87-95; BIBL. 26 REF.Article

ERROR IN SPECKLE PHOTOGRAPHY OF LATERAL SINUSOIDAL VIBRATIONS: A SIMPLE ANALYTICAL SOLUTIONVIKRAM CS.1982; APPL. OPT.; ISSN 0003-6935; USA; DA. 1982; VOL. 21; NO 10; PP. 1710-1712; BIBL. 6 REF.Article

IMAGING WITH PHOTOGRAPHIC DIFFFUSERSGROVER LP; TREMBLAY R.1982; APPLIED OPTICS; ISSN 0003-6935; USA; DA. 1982; VOL. 21; NO 24; PP. 4500-4504; BIBL. 10 REF.Article

ELECTRONIC SPECKLE PATTERN INTERFEROMETRIC SYSTEM BASED ON A SPECKLE REFERENCE BEAMSLETTEMOEN GA.1980; APPL. OPT.; USA; DA. 1980; VOL. 19; NO 4; PP. 616-623; BIBL. 17 REF.Article

ETUDE DU RELIEF DES OBJETS A REFLEXION DIFFUSE PAR LA METHODE DE TOPOGRAPHIE A SPECKLE A OUVERTURE NON MASQUEEBOGOMOLOV AS; VLASOV NG; SHTAN'KO AE et al.1978; ZH. TEKH. FIZ.; SUN; DA. 1978; VOL. 48; NO 8; PP. 1696-1699; BIBL. 5 REF.Article

TECHNICAL DIGEST: HOLOGRAM INTERFEROMETRY AND SPECKLE METROLOGY/TOPICAL MEETING ON HOLOGRAM INTERFEROMETRY AND SPECKLE METROLOGY, NORTH FALMOUTH MA, JUNE 2-4, 19801980; HOLOGRAM INTERFEROMETRY AND SPECKLE METROLOGY. TOPICAL MEETING ON HOLOGRAM INTERFEROMETRY AND SPECKLE METROLOGY/1980-06-02/NORTH FALMOUTH MA; USA; WASHINGTON: OPTICAL SOCIETY OF AMERICA; DA. 1980; PAG. MULT.; 28 CMConference Proceedings

THE INFLUENCE OF SCANNING RATE IN SEQUENTIAL ANALYSIS OF A SPECKLE PATTERN. APPLICATION TO SPECKLE BOILINGAIME C; KADIRI S; RICORT G et al.1980; OPT. COMMUN.; ISSN 0030-4018; NLD; DA. 1980; VOL. 35; NO 2; PP. 169-174; BIBL. 41 REF.Article

TESTING THE TRUENESS OF CIRCULAR SURFACES BY LASER SPECKLE PHOTOGRAPHYVIKRAM CS; VEDAM K.1979; APPL. OPT.; USA; DA. 1979; VOL. 18; NO 14; PP. 2351-2353; BIBL. 3 REF.Article

THE VARIATION OF SPECKLE SIZE WITH FILM DENSITY: AN EXAMPLE OF BABINET'S PRINCIPLEBAKER PL; HOGAN DC; TROUP GJ et al.1979; OPT. COMMUNIC.; NLD; DA. 1979; VOL. 29; NO 3; PP. 265-269; BIBL. 4 REF.Article

ON THE ISOPLANATIC PATCH SIZE IN STELLAR SPECKLE INTERFEROMETRYRODDIER F; GILLI JM; VERNIN J et al.1982; J. OPT.; ISSN 0150-536X; FRA; DA. 1982; VOL. 13; NO 2; PP. 63-70; ABS. FRE; BIBL. 21 REF.Article

ESTIMATION OF SPECTRA FROM SPECKLED IMAGESGOLDFINGER AD.1982; IEEE TRANSACTIONS ON AEROSPACE AND ELECTRONIC SYSTEMS; ISSN 0018-9251; USA; DA. 1982; VOL. 18; NO 5; PP. 675-681; BIBL. 10 REF.Article

ACOUSTICAL-SPECKLE INTERFEROMETRYSCHAEFFEL JA; RANSON WF; SWINSON WF et al.1980; EXP. MECH.; ISSN 0014-4851; USA; DA. 1980; VOL. 20; NO 4; PP. 109-117; BIBL. 7 REF.Article

SPECKLE METROLOGY TECHNIQUES: A PARAMETRIC EXAMINATION OF THE OBSERVED FRINGESRASTOGI PK; JACQUOT P.1982; OPT. ENG.; ISSN 0091-3286; USA; DA. 1982; VOL. 21; NO 3; PP. 411-426; BIBL. 54 REF.Article

ON THE NUMERICAL PROCESSING OF SPECKLE PHOTOGRAPH FRINGESKAUFMANN GH.1980; OPT. LASER TECHNOL.; GBR; DA. 1980; VOL. 12; NO 4; PP. 207-209; BIBL. 6 REF.Article

APPLICATION OF FRINGE SHIFTING TECHNIQUE IN SPECKLE PHOTOGRAPHYVIKRAM CS; VEDAM K.1979; PRAMANA; IND; DA. 1979; VOL. 12; NO 4; PP. 341-346; BIBL. 5 REF.Article

VIRTUAL FRINGE ANALYSIS METHOD IN TIME-AVERAGE DEFOCUSED SPECKLE PHOTOGRAPHYKARPPINEN VVK.1982; OPT. ENG.; ISSN 0091-3286; USA; DA. 1982; VOL. 21; NO 1; PP. 60-62; BIBL. 6 REF.Article

A SIMPLE DEVICE TO REDUCE SECONDARY SPECKLEDE CALUWE M.1982; OPT. LASERS ENG.; ISSN 0143-8166; GBR; DA. 1982; VOL. 3; NO 3; PP. 229-233Article