RETARDING-FIELD-CYLINDRICAL-MIRROR ANALYZERGERLACH RL.1973; J. VACUUM SCI. TECHNOL.; U.S.A.; DA. 1973; VOL. 10; NO 1; PP. 122-125; BIBL. 9 REF.Serial Issue

COMPARISON OF MODULATED RETARDING POTENTIAL DIFFERENCE AND RETARDED ENERGY MODULATED ELECTRON SPECTROMETERSGOLDEN DE; KOEPNICK NG; FORNARI L et al.1972; REV. SCI. INSTRUM.; U.S.A.; DA. 1972; VOL. 43; NO 9; PP. 1249-1252; BIBL. 12 REF.Serial Issue

A NOVEL DETECTION CIRCUIT FOR AUGER SPECTROSCOPY.PATERSON PJK; DENNE DR; LECKEY RCG et al.1976; J. PHYS. E; G.B.; DA. 1976; VOL. 9; NO 4; PP. 304-307; BIBL. 5 REF.Article

ON THE RESOLUTION OF RETARDING FIELD ENERGY ANALYSERS. I.DE JAGHER PC; HOPMAN HJ; VRIJDAGHS JB et al.1974; J. PHYS., E; G.B.; DA. 1974; VOL. 7; NO 6; PP. 486-489; BIBL. 12 REF.Article

A NEW RETARDING FIELD ELECTRON SPECTROMETER WITH DIFFERENTIAL OUTPUTLINDAU I; HELMER JC; UEBBING J et al.1973; REV. SCI. INSTRUM.; U.S.A.; DA. 1973; VOL. 44; NO 3; PP. 265-274; BIBL. 16 REF.Serial Issue

SPECTROMETRIE DES ELECTRONS AUGER.BURGGRAF C; CARRIERE B; GOLDSZTAUB S et al.1976; REV. PHYS. APPL.; FR.; DA. 1976; VOL. 11; NO 1; PP. 13-21; ABS. ANGL.; BIBL. 32 REF.; (METHODES ACTUELLES ANAL. SOLIDES. COLLOQ. EXPO. COMMUN.; DIJON; 1975)Article

CALCULATIONS AND MEASUREMENTS TO A PHASE-FREE ACCELERATING STAGE USING ELECTRIC AC-FIELDS IN A TRIANGULAR SHAPED ELECTRODE SYSTEM.WINTER HJ; SCHOTT W.1975; Z. PHYS. A; DTSCH.; DA. 1975; VOL. 273; NO 2; PP. 167-175; BIBL. 11 REF.Article

VOLTAGE CONTRAST LINEARIZATION WITH A HEMISPHERICAL RETARDING ANALYSER.FENTEM PJ; GOPINATH A.1974; J. PHYS. E; G.B.; DA. 1974; VOL. 7; NO 11; PP. 930-933; BIBL. 5 REF.Article

A NEW COMPACT ENERGY ANALYZER FOR AUGER AND ESCA SPECTROSCOPYSTAIB P.1972; VACUUM; G.B.; DA. 1972; VOL. 22; NO 10; PP. 481-484; BIBL. 6 REF.Serial Issue

A LOW-ENERGY ELECTRON SPECTROMETER USING CONCENTRIC HEMISPHERES AND A GRID RETARDING FIELDDUC BM; JARDIN C; GAUTHIER JP et al.1979; J. PHYS. E; GBR; DA. 1979; VOL. 12; NO 1; PP. 43-46; BIBL. 2 REF.Article

PETIT ANALYSEUR D'ENERGIE A CHAMP RETARDATEUR AVEC MULTIPLICATEUR D'ELECTRON TUBULAIREMATSUDAIRA T; ONCHI M.1975; J. VACUUM SOC. JAP.; JAP.; DA. 1975; VOL. 18; NO 12; PP. 468-472; ABS. ANGL.; BIBL. 14 REF.Article

IMPROVED VOLTAGE MEASUREMENT SYSTEM USING THE SCANNING ELECTRON MICROSCOPE.TEE WJ; GOPINATH A.1977; REV. SCI. INSTRUM.; U.S.A.; DA. 1977; VOL. 48; NO 3; PP. 350-355; BIBL. 5 REF.Article

METHOD OF CONTINUOUSLY MEASURING WORK FUNCTION CHANGESTAYLOR JL; WEINBERG WH.1978; J. VACUUM SCI. TECHNOL.; USA; DA. 1978; VOL. 15; NO 6; PP. 1811-1814; BIBL. 10 REF.Article

A FIELD-EMISSION RETARDING-POTENTIAL DEVICE FOR ABSOLUTE WORK FUNCTION MEASUREMENTS.BARNES SC; SINGER KE.1977; J. PHYS. E; G.B.; DA. 1977; VOL. 10; NO 7; PP. 737-740; BIBL. 12 REF.Article

AN APPARATUS FOR ELECTRON ENERGY ANALYSIS IN GLOW DISCHARGE PLASMASNEISWENDER DD; KOHOUT FC.1972; REV. SCI. INSTRUM.; U.S.A.; DA. 1972; VOL. 43; NO 10; PP. 1475-1480; BIBL. 23 REF.Serial Issue

ON THE RESOLUTION OF RETARDING FIELD ENERGY ANALYSERS. II. THE INFLUENCE OF SPACE CHARGE.DE JAGNER PC; HOPMAN HJ; WRIJDAGHS JB et al.1975; J. PHYS. E; G.B.; DA. 1975; VOL. 8; NO 2; PP. 117-122; BIBL. 4 REF.Article

A CYLINDRICAL-MIRROR ANALYSER INCORPORATING PRE-RETARDATION.BAKER JH; WILLIAMS EM.1975; VACUUM; G.B.; DA. 1975; VOL. 25; NO 8; PP. 373-376; BIBL. 23 REF.Article

FALSE PEAKS IN THE ENERGY DISTRIBUTION OF SECONDARY ELECTRONS MEASURED WITH A SPHERICAL RETARDING FIELD ANALYSERCROSS JA.1973; J. PHYS. D; G.B.; DA. 1973; VOL. 6; NO 5; PP. 622-627; BIBL. 4 REF.Serial Issue

APPARATUS FOR THE STUDY OF ELECTRON STIMULATED DESORPTION OF IONS FROM SURFACESASHCROFT KW; LECK JH; SANDSTROM DR et al.1972; J. PHYS. E; G.B.; DA. 1972; VOL. 5; NO 11; PP. 1106-1112; BIBL. 12 REF.Serial Issue

DISTORTION OF ELASTICALLY SCATTERED ELECTRON ENERGY SPECTRUM IN A RETARDING FIELD TYPE SPECTROMETER.SAEKI N; SHIMIZU R; HASHIMOTO H et al.1976; JAP. J. APPL. PHYS.; JAP.; DA. 1976; VOL. 15; NO 7; PP. 1415-1416; BIBL. 4 REF.Article

INSTRUMENTAL EFFECTS IN THE ELECTRON LOSS SPECTRA FROM SURFACES DUE TO THE USE LEED OPTICS.AVERY NR.1976; J. PHYS. E; G.B.; DA. 1976; VOL. 9; NO 8; PP. 676-678; BIBL. 7 REF.Article

EFFECT OF FINITE ANALYZER SIZE ON THE DISTRIBUTION FUNCTIONS MEASURED IN FIELD-FREE PLASMASDENEEF CP; THEISS AJ.1979; REV. SCI. INSTRUM.; USA; DA. 1979; VOL. 50; NO 3; PP. 378-381; BIBL. 7 REF.Article

VARIATION OF MEASURED PARTICLE VELOCITY DISTRIBUTIONS WITH DISTANCE FROM A FINITE-SIZE PLASMADENEEF CP; THEISS AJ.1979; J. APPL. PHYS.; USA; DA. 1979; VOL. 50; NO 4; PP. 2684-2688; BIBL. 18 REF.Article

A NEW ELECTRON ENERGY ANALYSER FOR VOLTAGE MEASUREMENT IN THE SEM.GOPINATH A; TEE WJ.1977; J. PHYS. E; G.B.; DA. 1977; VOL. 10; NO 6; PP. 660-663; BIBL. 4 REF.Article

SPURIOUS EFFECTS OF ELECTRON EMISSION FROM THE GRIDS OF A RETARDING FIELD ANALYSER ON SECONDARY ELECTRON EMISSION MEASUREMENTS. RESULTS ON A(111) COPPER SINGLE CRYSTAL.PILLON J; ROPTIN D; CAILLER M et al.1976; REV. PHYS. APPL.; FR.; DA. 1976; VOL. 11; NO 6; PP. 751-759; ABS. FR.; BIBL. 14 REF.Article