THE ALL ELECTRIC ADJUSTMENT OF A DOUBLE FOCUSING MASS SPECTROMETER.MATSUO T; WOLLNIK H.1975; INTERNATION. J. MASS SPECTROM. ION PHYS.; NETHERL.; DA. 1975; VOL. 18; NO 3; PP. 205-214; BIBL. 5 REF.Article

SIMPLE MODIFICATION OF A COMMERCIAL MASS SPECTROMETER FOR METASTABLE DATA COLLECTIONWACHS T; BENTE PF III; MACLAFFERTY FW et al.1972; INTERNATION. J. MASS SPECTROM. ION PHYS.; NETHERL.; DA. 1972; VOL. 9; NO 3; PP. 333-341; BIBL. 15 REF.Serial Issue

PRESENT STATUS OF THE TWO STAGE DOUBLE FOCUSING MASS SPECTROSCOPE OSAKA UNIVERSITY.KATAKUSE I; NAKABUSHI H; OGATA K et al.1975; MASS SPECTROSC.; JAP.; DA. 1975; VOL. 23; NO 4; PP. 247-269; BIBL. 24 REF.Article

EIN GESCHWINDIGKEITSFILTER FUER DIE ANALYSE VON SCHWERIONEN-REAKSPRODUKTEN. = FILTRE DE VITESSE A 2 ETAGES POUR L'ANALYSE DES PRODUITS DES REACTIONS DUES A DES IONS LOURDSMUNZENBERG G.1974; INTERNATION. J. MASS SPECTROM. ION PHYS.; NETHERL.; DA. 1974; VOL. 14; NO 4; PP. 363-387; ABS. ANGL.; BIBL. 15 REF.Article

DETERMINATION DES ERREURS DE L'ENREGISTREUR D'UN SPECTROMETRE DE MASSE A DOUBLE FOCALISATION ET A SOURCE IONIQUE A ETINCELLESGAL'BURT VA; GLAVIN GG; ZELENIN AE et al.1974; ZH. ANAL. KHIM.; S.S.S.R.; DA. 1974; VOL. 29; NO 7; PP. 1417-1420; ABS. ANGL.; BIBL. 7 REF.Article

METASTABLE ION ANALYSIS BY AUTOMATIC REPETITIVE SCANNING.DAVIES TK; MCGILLIVRAY DL; WILEY TW et al.1976; INTERNATION. J. MASS SPECTROM. ION PHYS.; NETHERL.; DA. 1976; VOL. 19; NO 4; PP. 343-350; BIBL. 10 REF.Article

ALIGNEMENT D'UN SPECTROMETRE ELECTRONIQUEMAKSYUTOV FB; KUZNETSOV VL.1976; PRIBORY TEKH. EKSPER.; S.S.S.R.; DA. 1976; NO 1; PP. 24-25; BIBL. 8 REF.Article

A 100-KV DC STABILIZED POWER SUPPLY FOR ION ACCELERATION OF TWO-STAGE DOUBLE-FOCUSING MASS SPECTROSCOPE.NAKABUSHI H; HATTORI T; OGATA K et al.1974; MASS SPECTROSC.; JAP.; DA. 1974; VOL. 22; NO 1; PP. 1-14; BIBL. 15 REF.Article

POSSIBILITES DE FOCALISATION SIMULTANEE EN ANGLE ET EN ENERGIE DE MASSES VOISINES DANS DES SPECTROMETRES DE MASSE A DEUX CASCADES ET A IMAGE INTERMEDIAIRESACHENKO VD; GALL RN; FRIDLYANSKIJ GV et al.1979; ZH. TEKH. FIZ.; SUN; DA. 1979; VOL. 49; NO 7; PP. 1491-1497; BIBL. 3 REF.Article

A NEW LINKED SCAN FOR REVERSED GEOMETRY MASS SPECTROMETERSBOYD RK; PORTER CJ; BEYNON JH et al.1981; ORG. MASS SPECTROM.; ISSN 0030-493X; GBR; DA. 1981; VOL. 16; NO 11; PP. 490-494; BIBL. 22 REF.Article

MODIFICATION OF A DOUBLE FOCUSING MASS SPECTROMETER FOR ANGULAR RESOLUTION.FRANCHETTI V; CARMODY JJ; KRAUSE DA et al.1978; INTERNATION. J. MASS SPECTROM. ION PHYS.; NETHERL.; DA. 1978; VOL. 26; NO 4; PP. 353-358; BIBL. 5 REF.Article

ADAPTATEUR A ANALYSEUR ELECTROSTATIQUE POUR SPECTROMETRES DE MASSE D'UNE SERIE UNIQUEIVANOV VP; SYSOEV AA; SAMSONOV GA et al.1977; PRIBORY TEKH. EKSPER.; S.S.S.R.; DA. 1977; NO 4; PP. 215-216; BIBL. 3 REF.Article

A SEQUENTIAL PULSING TECHNIQUE FOR THE PRODUCTION OF MONOENERGETIC ION BEAMS OF LOW ENERGY.OLUBUYIDE O; MASSON AJ; HENCHMAN MJ et al.1977; INTERNATION. J. MASS SPECTROM. ION PHYS.; NETHERL.; DA. 1977; VOL. 24; NO 4; PP. 399-401; BIBL. 5 REF.Article

CHARACTERISTICS OF ELECTROSTATIC CHARGED PARTICLE OSCILLATOR ION SOURCES.SWAMINATHAN S; VENKATASUBRAMANIAN VS.1974; PRAMANA; INDIA; DA. 1974; VOL. 2; NO 1; PP. 46-50; BIBL. 12 REF.Article

HIGH-PERFORMANCE SECONDARY ION MASS SPECTROMETERCOLTON RJ; CAMPANA JE; BARLAK TM et al.1980; REV. SCI. INSTRUM.; ISSN 0034-6748; USA; DA. 1980; VOL. 51; NO 12; PP. 1685-1689; BIBL. 14 REF.Article

SPECTROMETRE DE MASSE A DOUBLE FOCALISATION A LENTILLES HEXAPOLAIRES ELECTROSTATIQUES DE CORRECTION DE L'IMAGECUNA C; IOANOVICIU D.1980; REV. ROUM. PHYS.; ISSN 0035-4090; ROM; DA. 1980; VOL. 25; NO 7; PP. 751-758; ABS. ENG; BIBL. 7 REF.Article

AN ACCELERATING VOLTAGE SCANNING MASS SPECTROMETERTAKEDA T; SHIBATA S; MATSUDA H et al.1980; SHITSURYO BUNSEKI; ISSN 0542-8645; JPN; DA. 1980; VOL. 28; NO 3; PP. 217-226; BIBL. 4 REF.Article

A SIMPLE DOUBLE-FOCUSING MASS SPECTROMETER.TAYA S; KANOMATA I; HIROSE H et al.1978; INTERNATION. J. MASS SPECTROM. ION PHYS.; NETHERL.; DA. 1978; VOL. 26; NO 3; PP. 237-250; BIBL. 2 REF.Article

FIELD IONISATION KINETICS: REPRODUCIBILITY IN THE DETERMINATION OF SHORT LIFETIMES.DERRICK PJ; MORGAN RP; HILL JT et al.1975; INTERNATION. J. MASS SPECTROM. ION PHYS.; NETHERL.; DA. 1975; VOL. 18; NO 4; PP. 393-405; BIBL. 23 REF.Article

THE IMAGE ABERRATIONS PRODUCED BY THE FIELD ERRORS AND BY THE MECHANICAL ERRORS IN DOUBLE FOCUSING MASS SPECTROMETERS FOR MOLECULAR PROCESS STUDIES AND ISOTOPE ANALYSIS.IOANOVICIU D; CUNA C; MIHAILA A et al.1974; REV. ROUMAINE PHYS.; ROUMAN.; DA. 1974; VOL. 19; NO 9; PP. 963-973; ABS. FR.; BIBL. 7 REF.Article

SPECTROGRAPHIE DE MASSE AVEC SOURCE A EMISSION IONIQUE SECONDAIREHERNANDEZ R; LANUSSE P; SLODZIAN G et al.1972; RECH. AEROSPAT.; FR.; DA. 1972; NO 6; PP. 313-324; ABS. ANGL.; BIBL. 14 REF.Serial Issue

ANALYSEUR ENERGETIQUE D'UN SPECTROMETRE ELECTRONIQUE MAGNETIQUESHABANOVA IN; PONOMAREV YU F; SAPOZHNIKOV VP et al.1975; PRIBORY TEKH. EKSPER.; S.S.S.R.; DA. 1975; NO 5; PP. 38-39; BIBL. 3 REF.Article

ION KINETIC ENERGY SPECTROMETRY.BEYNON JH; COOKS RG.1974; J. PHYS. E; G.B.; DA. 1974; VOL. 7; NO 1; PP. 10-18; BIBL. 33 REF.Article

MODIFICATION OF A MATTAUCH-HERZOG MASS SPECTROMETER FOR ION KINETIC ENERGY MEASUREMENTSVASCAJ V; KRAMER V; MEDVED M et al.1980; INTERNATION. J. MASS SPECTROM. ION PHYS.; NLD; DA. 1980; VOL. 33; NO 4; PP. 409-416; BIBL. 10 REF.Article

UN NOUVEAU SYSTEME D'OPTIQUE IONIQUE POUR UN SPECTROMETRE DE MASSE A HAUTE RESOLUTION ET HAUTE SENSIBILITEMATSUDA H.1980; SHITSURYO BUNSEKI; ISSN 0542-8645; JPN; DA. 1980; VOL. 28; NO 3; PP. 211-215; ABS. ENG; BIBL. 12 REF.Article