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QUELQUES SPECTROMETRES ET SPECTROPHOTOMETRES RUSSES1972; JEMNA MECH. OPT.; CESKOSL.; DA. 1972; VOL. 17; NO 12; PP. 333-335Serial Issue

CALCUL DES CONSTANTES POUR UN FAISCEAU INFINIMENT ETROIT DANS LES INSTRUMENTS SPECTRAUX.MEDVEDEV VE.1973; OPT. I SPEKTROSK.; S.S.S.R.; DA. 1973; VOL. 34; NO 2; PP. 382-386; BIBL. 5 REF.Serial Issue

A 0.3-40 MICRON WAVELENGTH MODULATION SPECTROMETERHART GP; NEELY JA; KEARNEY RJ et al.1973; REV. SCI. INSTRUM.; U.S.A.; DA. 1973; VOL. 44; NO 1; PP. 37-43; BIBL. 9 REF.Serial Issue

SPECTROGRAPH USING THE ZONE PLATE AS A DISPERSING ELEMENTYOSHIDA M; YOSHIHARA K.1973; JAP. J. APPL. PHYS.; JAP.; DA. 1973; VOL. 12; NO 1; PP. 158-159; BIBL. 5 REF.Serial Issue

REALISATION D'UN SYSTEME D'ENTRAINEMENT LINEAIRE EN LONGUEUR D'ONDEGILIBERT Y.1973; ANN. SCI. UNIV. REIMS A.R.E.R.S.; FR.; DA. 1973; VOL. 11; NO 1-2; PP. 1-10; ABS. ANGL.; BIBL. 7 REF.Serial Issue

REFRACTOMETER ASSOCIATED WITH THE FABRY-PEROT SPECTROMETERGAGNE JM; GIROUX M; SAINT DIZIER JP et al.1973; APPL. OPT.; U.S.A.; DA. 1973; VOL. 12; NO 3; PP. 522-527; BIBL. 3 REF.Serial Issue

SPECTROMETRE DERIVATEUR DU TYPE IKS-21IL'INSKIJ AV; SHADRIN EB.1973; PRIBORY TEKH. EKSPER.; S.S.S.R.; DA. 1973; NO 3; PP. 257; BIBL. 2 REF.Serial Issue

A DIGITALLY CONTROLLED SCANNING DEVICE FOR A HIGH RESOLUTION SPECTROGRAPHDE SA A; MCCARTAN DG.1972; J. PHYS. E; G.B.; DA. 1972; VOL. 5; NO 12; PP. 1183-1185; BIBL. 1 REF.Serial Issue

PLANE GRATING DISPERSION FORMULAELOCKWOOD DJ.1973; APPL. OPT.; U.S.A.; DA. 1973; VOL. 12; NO 4; PP. 896-897; BIBL. 1 REF.Serial Issue

POSSIBILITES DE DERIVATION ET DE CORRELATION DE SPECTRES DANS LES SPECTROMETRES INTERFERENTIELS A GRILLEFORTUNATO G; MARECHAL.1973; C.R. ACAD. SCI., B; FR.; DA. 1973; VOL. 276; NO 13; PP. 527-530; BIBL. 1 REF.Serial Issue

OPTICAL EMISSION SPECTROMETERS. SYMPOSIUM. CLEVELAND, OHIO, 8 MARCH 19721972; A.S.T.M. SPEC. TECH. PUBL.; U.S.A.; DA. 1972; NO 517; PP. 1-317; CASSETTESSerial Issue

ABERRATION ELIMINATION IN PLANE GRATING SPECTROGRAPHS AND MONOCHROMATORSSINGH M.1972; INDIAN J. THEOR. PHYS.; INDIA; DA. 1972; VOL. 20; NO 4; PP. 85-90; BIBL. 3 REF.Serial Issue

REGLAGE ET MISE AU POINT D'UN SPECTROMETRE EBERT-FASTIE A FENTES COURBESAUBERT D; BALDY A.1971; ANN. UNIV. PROVENCE, SCI.; FR.; DA. 1971; VOL. 45; PP. 19-24; ABS. ANGL.; BIBL. 3 REF.Serial Issue

SPECTROMETRE RAPIDE AVEC MONOCHROMATEUR IKS-6DENISOV GS; DMITRIEVSKIJ OD; TOKHADZE KG et al.1972; PRIBORY TEKH. EKSPER.; S.S.S.R.; DA. 1972; NO 5; PP. 197-198; BIBL. 7 REF.Serial Issue

ETUDE ET MISE AU POINT D'UN SPECTROMETRE ULTRA-RAPIDEDA SILVA E.1971; DGRST-7072339; FR.; DA. 1971; PP. 1-30; (RAPP. FINAL, ACTION CONCERTEE: INSTRUM. ET MES.)Report

COUPLING TO SURFACE WAVES WITH PRISMS VIA ATTENUATED TOTAL REFLECTIONBELL RJ; FISCHER B; TYLER IL et al.1973; APPL. OPT.; U.S.A.; DA. 1973; VOL. 12; NO 4; PP. 832-836; BIBL. 34 REF.Serial Issue

NEW FOURIER TRANSFORM ALL-REFLECTION INTERFEROMETERKRUGER RA; ANDERSON LW; ROESLER FL et al.1973; APPL. OPT.; U.S.A.; DA. 1973; VOL. 12; NO 3; PP. 533-540; BIBL. 4 REF.Serial Issue

A COOLED OPTICS SPECTROMETER FOR HIGH RESOLUTION MEASUREMENTS IN SUPPORT OF ATMOSPHERIC RESEARCHSTROW LL; KORB L; GENTRY BM et al.1980; SPECTROSCOPY IN SUPPORT OF ATMOSPHERIC MEASUREMENTS. TOPICAL MEETING ON SPECTROSCOPY IN SUPPORT OF ATMOSPHERIC MEASUREMENTS/1980/SARASOTA FL; USA; WASHINGTON: OPTICAL SOCIETY OF AMERICA; DA. 1980; PP. TUP21.1-TUP21.4; BIBL. 1 REF.Conference Paper

THE PLATE DIAGRAM AND ITS APPLICATION TO OFF-AXIS SYSTEMS AND SPECTROGRAPHSSIMON JM.1973; OPT. ACTA; G.B.; DA. 1973; VOL. 20; NO 5; PP. 345-353; BIBL. 6 REF.Serial Issue

SPECTROMETRE SISAM A DETECTION SYNCHRONEPINSON P; GUILLOTIN JP.1972; REV. PHYS. APPL.; FR.; DA. 1972; VOL. 7; NO 4; PP. 335-337; ABS. ANGL.; BIBL. 6 REF.Serial Issue

DISPOSITIFS ORIGINAUX D'UN MONOCHROMATEUR INFRAROUGE (1-33 MU ) POUR ETUDES MULTIPLESCADENE M; BENOIT C.1972; REV. PHYS. APPL.; FR.; DA. 1972; VOL. 7; NO 4; PP. 395-402; ABS. ANGL.; BIBL. 16 REF.Serial Issue

DIFFRACTION LIMITATIONS OF THE LAMELLAR GRATING INTERFEROMETER IN FAR-INFRARED FOURIER TRANSFORM SPECTROSCOPYWIRGIN A.1973; OPT. COMMUNIC.; NETHERL.; DA. 1973; VOL. 7; NO 3; PP. 205-210; BIBL. 14 REF.Serial Issue

CONDITIONS DE STIGMATISME POUR LES MONTAGES DE ROWLAND EQUIPES DE RESEAUX HOLOGRAPHIQUES CONCAVESPOUEY M.1973; C.R. ACAD. SCI., B; FR.; DA. 1973; VOL. 276; NO 13; PP. 531-534; BIBL. 7 REF.Serial Issue

TECHNIQUE ET PRATIQUE DE LA SPECTROSCOPIEZAJDEL AN; OSTROVSKAYA GV; OSTROVSKIJ YU I et al.1972; MOSKVA; NAUKA; DA. 1972; PP. 1-375; BIBL. 5 P.Book

Thermo Optek : cap sur la croissance interne et l'innovation : Laboratoire = Thermo Optek : heading for internal growth and innovationInfo chimie magazine. 2000, Num 416, pp 80-82, issn 1286-0921Article

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