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HYDROGEN PROFILES OF ANODIC ALUMINUM OXIDE FILMS = PROFILS D'H2 DANS LES FILMS D'OXYDES ANODIQUES SUR ALLANFORD WA; ALWITT RS; DYER CK et al.1980; J. ELECTROCHEM. SOC.; ISSN 0013-4651; USA; DA. 1980; VOL. 127; NO 2; PP. 405-411; BIBL. 24 REF.Article

SIMS EVIDENCE CONCERNING WATER IN PASSIVE LAYERS = MISE EN EVIDENCE PAR SPECTROMETRIE SIMS D'EAU DANS LES COUCHES PASSIVESMURPHY OJ; BOCKRIS JOM; POU TE et al.1982; J. ELECTROCHEM. SOC.; ISSN 0013-4651; USA; DA. 1982; VOL. 129; NO 9; PP. 2149-2151; BIBL. 20 REF.Article

A STUDY OF THE INITIAL OXIDATION OF CHROMIUM-NICKEL STEEL BY SIMSBLASEK G; WEIHERT M.1979; SURF. SCI.; NLD; DA. 1979; VOL. 82; NO 1; PP. 215-227; BIBL. 25 REF.Article

A NEW TECHNIQUE TO STUDY THE STAGES OF OXIDATION OF METALS USING OXIDATION INDUCED CHANGES IN THE SHAPE OF SECONDARY ION ENERGY SPECTRA = UNE NOUVELLE TECHNIQUE POUR ETUDIER LES ETAPES DE L'OXYDATION DES METAUX GRACE A LA SPECTROMETRIE SIMSSNOWDON KJ.1980; CORROS. SCI.; ISSN 0010-938X; GBR; DA. 1980; VOL. 20; NO 1; PP. 53-61; BIBL. 20 REF.Article

Caractérisation physico-chimique, simulation et modélisation d'une technologie analogique avancée BIC MOS = Physico-chemical characterization, simulation and modelization of an BICMOS Advanced Analog TechnologyTarabbia, Marc; Dupuy, J. C.1993, 164 p.Thesis

ESCA AND SIMS STUDIES OF THE PASSIVE FILM ON IRON = ETUDE PAR ESCA ET SIMS DU FILM PASSIF SUR FETJONG SC; YEAGER E.1981; J. ELECTROCHEM. SOC.; ISSN 0013-4651; USA; DA. 1981; VOL. 128; NO 10; PP. 2251-2254; BIBL. 7 REF.Article

APPLICATION OF SIMS TO ANALYSIS OF STEELSTSUNOYAMA K; SUZUKI T; OHASHI Y et al.1980; MASS SPECTROSC.; JPN; DA. 1980; VOL. 28; NO 1; PP. 1-8; BIBL. 34 REF.Article

UNTERSUCHUNGEN ZUR SELEKTIVEN OXIDATION VON GOLD-KUPFER-CADMIUM-LEGIERUNGEN MIT EINEM SEKUNDAERIONENMASSENSPEKTROMETER = RECHERCHES SUR L'OXYDATION SELECTIVE DES ALLIAGES AU-CU-CD A L'AIDE D'UN SPECTROMETRE DE MASSE SECONDAIREBECKER S; BLANK P; FELLER HG et al.1979; METALL; DEU; DA. 1979; VOL. 33; NO 7; PP. 751-757; ABS. ENG; BIBL. 18 REF.Article

POROUS ANODIC FILMS FORMED ON ALUMINIUM IN CHROMIC ACID = FILMS D'ANODISATION POREUX FORMES SUR AL DANS L'ACIDE CHROMIQUETHOMPSON GE; WOOD GC; HUTCHINGS R et al.1980; TRANS. INST. MET. FINISH.; ISSN 0020-2967; GBR; DA. 1980; VOL. 58; NO 1; PP. 21-25; BIBL. 14 REF.Article

APPLICATION DE LA SPECTROMETRIE DE MASSE D'IONS SECONDAIRES A L'ANALYSE DE SURFACES ET DES FILMS MINCES = APPLICATION OF SECONDARY ION MASS SPECTROMETRY TO THE ANALYSIS OF SURFACES AND THIN FILMSSIMONDET MF.1983; SURFACES; ISSN 0585-9840; FRA; DA. 1983; NO 158; PP. 14-16; 2 P.Article

BUTTLE FRACTURE ANALYSIS OF MO BY SIMSKITAJIMA M; NODA T; OKADA M et al.1981; NIPPON KINZOKU GAKKAISHI (1952); ISSN 0021-4876; JPN; DA. 1981; VOL. 45; NO 2; PP. 219-220; BIBL. 5 REF.Article

Introduction to the Cameca SIMS instrumentsSCHUHMACHER, M.Le Vide (1995). 1999, Vol 54, Num 292, issn 1266-0167, 139, 231-244 [15 p.]Article

Shave-off depth profiling for nano-devicesNOJIMA, Masashi; TOI, Masayuki; MAEKAWA, Ayaka et al.Mikrochimica acta (1966. Print). 2006, Vol 155, Num 1-2, pp 219-223, issn 0026-3672, 5 p.Conference Paper

Sputtered neutral mass spectrometryREUTER, W.TrAC. Trends in analytical chemistry (Regular ed.). 1989, Vol 8, Num 6, pp 203-208, issn 0165-9936Article

Static SIMS investigation of Ag-supported amino acidsTAMAKI, S; SICHTERMANN, W; BENNINGHOVEN, A et al.Japanese journal of applied physics. 1984, Vol 23, Num 5, pp 544-549, issn 0021-4922, 1Article

Detection of gaseous organophosphorus compounds using secondary ion mass spectrometryGROENEWOLD, G. S; TODD, P. J.Analytical chemistry (Washington, DC). 1985, Vol 57, Num 4, pp 886-890, issn 0003-2700Article

Secondary ion mass spectrometer design considerations for organic and inorganic analysisMAGEE, C. W.A.C.S. symposium series. 1985, Num 291, pp 97-112, issn 0097-6156Article

The effect of oxygen flooding on the secondary ion yield of Cs in the cameca IMS 3fSYKES, D. E; CHEW, A; CRAPPER, M. D et al.Vacuum. 1992, Vol 43, Num 1-2, pp 159-162, issn 0042-207XConference Paper

Sources of uncertainty in the experimental determination of sample heterogeneity in secondary ion mass spectrometryMICHIELS, F. P. L; ADAMS, F. C. V.Analytical chemistry (Washington, DC). 1991, Vol 63, Num 23, pp 2735-2743, issn 0003-2700Article

Isotopic studies of oxidation of Si3N4 and Si using SIMSHONGHUA DU; HOUSER, C. A; TRESSLER, R. E et al.Journal of the Electrochemical Society. 1990, Vol 137, Num 2, pp 741-742, issn 0013-4651, 2 p.Article

Relative sensitivity factors of elements in quantitative secondary ion mass spectrometric analysis of biological reference materialsRAMSEYER, G. O; MORRISON, G. H.Analytical chemistry (Washington, DC). 1983, Vol 55, Num 12, pp 1963-1970, issn 0003-2700Article

Proceedings of the Eighteenth International Conference on Secondary Ion Mass Spectrometry, SIMS XVIII, Riva Del Garda, Trento, Italy, September 18-23, 2011Surface and interface analysis. 2013, Vol 45, Num 1, issn 0142-2421, 611 p.Conference Proceedings

Elimination of cluster interferences in secondary ion mass spectrometry using extreme energy filteringSCHAUER, S. N; WILLIAMS, P.International journal of mass spectrometry and ion processes. 1990, Vol 103, Num 1, pp 21-29, issn 0168-1176, 9 p.Article

Measurement and visual observation of sample charging effects on primary beam focusing in secondary ion mass spectrometryAPPELHANS, A. D.International journal of mass spectrometry and ion processes. 1989, Vol 88, Num 2-3, pp 161-173, issn 0168-1176Article

Spectromètre de masse pour l'analyse des ions secondairesDAUKEEV, D. K; KARETSKAYA, S. P; KASYMOV, S. I et al.Žurnal tehničeskoj fiziki. 1985, Vol 55, Num 3, pp 632-635, issn 0044-4642Article

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