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AN INFRARED PHOTOTHERMAL BEAM DEFLECTION FOURIER TRANSFORM SPECTROMETERLOW MJD; LACROIX M.1982; INFRARED PHYS.; ISSN 0020-0891; GBR; DA. 1982; VOL. 22; NO 3; PP. 139-147; BIBL. 15 REF.Article

ANALYSE PHYSICO-CHIMIQUE DES POLYMERES: SPECTROMETRIES ELECTRONIQUE ET HERTZIENNEVERDU J.1982; TECHNIQUES DE L'INGENIEUR, PLASTIQUES; FRA; PARIS: TECHNIQUES DE L'INGENIEUR; DA. 1982; NO 8; A3274; PP. 1-14; BIBL. 40 REF.Book Chapter

ACCURATE SPECTROMETER CALIBRATION IN ELECTRON SPECTROSCOPYOELHAFEN P; FREEOUF JL.1983; JOURNAL OF VACUUM SCIENCE AND TECHNOLOGY. A, VACUUM, SURFACES, AND FILMS; ISSN 512915; USA; DA. 1983; VOL. 1; NO 1; PP. 96-97; BIBL. 1 REF.Article

PHOTOEMISSION SPECTROSCOPY1979; MASSACHUSETTS INST. TECHNOL., R.L.E. PROGR. REP.; USA; DA. 1979; NO 121; PP. 9-10Article

FOURIER-TRANSFORM PHOTOACOUSTIC SPECTROSCOPYFARROW MM; BURNHAM RK; EYRING EM et al.1978; APPL. PHYS. LETTERS; USA; DA. 1978; VOL. 33; NO 8; PP. 735-737; BIBL. 14 REF.Article

PHOTOACOUSTIC CELL FOR FOURIER TRANSFORM INFRARED SPECTROMETRY OF SURFACE SPECIESKINNEY JB; STALEY RH.1983; ANALYTICAL CHEMISTRY (WASHINGTON); ISSN 0003-2700; USA; DA. 1983; VOL. 55; NO 2; PP. 343-348; BIBL. 37 REF.Article

BASED ON THE LECTURES: MATRIX ISOLATION SPECTROSCOPY/NATO ADVANCED STUDY INSTITUTE ON MATRIX ISOLATION SPECTROSCOPY, UNIVERSITE DES SCIENCES ET DES TECHNIQUES DU LANGUEDOC, MONTPELLIER, JULY 17-31, 1980BARNES AJ ED; ORVILLE THOMAS WJ ED; MUELLER A ED et al.1981; MATRIX ISOLATION SPECTROSCOPY. NORTH ATLANTIC TREATY ORGANIZATION ADVANCED STUDY INSTITUTE ON MATRIX ISOLATION SPECTROSCOPY/1980-07-17/MONTPELLIER; NLD/USA/GBR; DORDRECHT; BOSTON; LONDON: D. REIDEL PUBLISHING COMPANY; DA. 1981; 615 P.; 25 CM; ISBN 90-277-1328-6; NATO ADVANCED STUDY INSTITUTES SERIES. C: MATHEMATICAL AND PHYSICAL SCIENCES; 76Conference Proceedings

SPECTROSCOPY OF MOLTEN SALTS.VOLKOV SV.1978; REV. CHIM. MINER.; FR.; DA. 1978; VOL. 15; NO 1; PP. 59-68; ABS. FR.; BIBL. 22 REF.Article

SYMPOSIUM ON POLYMER SPECTROSCOPY.1976; POLYM. PREPR.; U.S.A.; DA. 1976; VOL. 17; NO 2; PP. 672-773; BIBL. DISSEM.Article

RESOLUTION ENHANCEMENT FOR A COMMERCIAL X-RAY FLUORESCENCE SPECTROMETERHAYCOCK DE; URCH DS.1982; J. PHYS. E; ISSN 0022-3735; GBR; DA. 1982; VOL. 15; NO 1; PP. 40-43; BIBL. 6 REF.Article

LABORANALYSENMESSTECHNIK - EINE UEBERSICHT. III: METHODEN, BEDINGT DURCH STOFFUMWANDLUNG = TECHNIQUE DE MESURE ANALYTIQUE DE LABORATOIRE - UNE SYNTHESE. III: METHODES LIEES A LA TRANSFORMATION DE MATIEREKIENITZ H.1980; TM, TECH. MESS.; ISSN 0171-8096; DEU; DA. 1980; VOL. 47; NO 12; PP. 441-448; ABS. ENG; BIBL. 50 REF.Article

METHODES SPECTROSCOPIQUES D'ANALYSE ET DE DOSAGE. CONFERENCES. I. II; LYON; 1974.sd; S.L.; DA. S.D.; PP. (533P.); BIBL. DISSEM.; 2 FASCConference Proceedings

CONTROLE PAR SPECTROMETRIE DE NEUTRONS NEUTRONIQUE DE L'EPAISSEUR ET DE LA CONTINUITE DE PIECES EN ACIERS DE GRANDE EPAISSEURGORBUNOV VI; PEKARSKIJ G SH; ELAGIN VB et al.1978; DEFEKTOSKOPIJA; SUN; DA. 1978; NO 11; PP. 54-58; BIBL. 2 REF.Article

METALLURGICAL APPLICATIONS OF XPS, AES AND SIMSRIVIERE JC.1979; MEM. SCI. REV. METALL.; ISSN 0025-9128; FRA; DA. 1979; VOL. 76; NO 12; PP. 759-776; ABS. GER/ENG/SPA; BIBL. 15 REF.Article

METHODES EXPERIMENTALES DE CARACTERISATION DES CATALYSEURS INDUSTRIELSVEDRINE JC.1981; REV. PHYS. APPL.; ISSN 0035-1687; FRA; DA. 1981; VOL. 16; NO 7; PP. 373-386; ABS. ENG; BIBL. 20 REF.Conference Paper

PROGRAM AND ABSTRACTS/27TH CANADIAN SPECTROSCOPY SYMPOSIUM, TORONTO ON, OCTOBER 6-8, 19801980; CANADIAN SPECTROSCOPY SYMPOSIUM. 27/1980-10-06/TORONTO ON; CAN; DA. 1980; 47 P.; 22 CMConference Proceedings

METHODES PHYSICO-CHIMIQUES D'ANALYSE. CARACTERISTIQUES ET COMPARAISONDELARUE G.1978; VIDE; FRA; DA. 1978; NO 192; PP. 99-104; ABS. ENGArticle

X-RAY-EXCITED AUGER AND PHOTOELECTRON SPECTROSCOPYWEIGHTMAN P.1982; REP. PROG. PHYS.; ISSN 0034-4885; GBR; DA. 1982; VOL. 45; NO 7; PP. 753-814; BIBL. 8 P.Article

A HIGH-EFFICIENCY POLARIZING INTERFEROMETER FOR FAR-INFRARED SPECTROSCOPYYOSHIHARA K; KITADE A; MATSUSHITA T et al.1982; JPN. J. APPL. PHYS.; ISSN 0021-4922; JPN; DA. 1982; VOL. 21; NO 4; PP. L206-L208; BIBL. 11 REF.Article

PHOTOELECTRON-PHOTOION COINCIDENCE SPECTROMETER WITH DOUBLE FIELD TOF MASS ANALYSISNIWA Y; NISHIMURA T; NOZOYE H et al.1979; INTERNATION. J. MASS SPECTROM. ION PHYS.; NLD; DA. 1979; VOL. 30; NO 1; PP. 63-73; BIBL. 11 REF.Article

USE OF THE OPTO-ACOUSTIC EFFECT FOR RAPID SCAN FOURIER SPECTROSCOPY.BUSSE G; BULLEMER B.1978; INFRARED PHYS.; GBR; DA. 1978; VOL. 18; NO 3; PP. 255-256; BIBL. 5 REF.Article

OBERFLAECHENANALYSE AN DUENNEN SCHICHTEN. EINE UEBERSICHT = ANALYSE DES SURFACES DES COUCHES MINCES. REVUEPOLASCHEGG HD.1978; VAKUUM-TECH.; DEU; DA. 1978; VOL. 27; NO 8; PP. 238-245; ABS. ENG/FRE; BIBL. 11 REF.Article

PROTON MAGNETIC RESONANCE & INFRARED STUDIES ON HUMAN BONE POWDER.SRINIVASA RAO A; SRINIVASA MANJA K.1977; INDIAN J. PURE APPL. PHYS.; INDIA; DA. 1977; VOL. 15; NO 8; PP. 565-567; BIBL. 13 REF.Article

THE ACRONYMS USED IN THE WORLD OF SPECTROSCOPY, MICROSCOPY AND DIFFRACTOMETRY. II: GLOSSARY OF ABBREVIATIONSDELAEY L; ARKENS O.1981; SPECTROCHIM. ACTA, B; GBR; DA. 1981; VOL. 36; NO 4; PP. 361-372Article

DETERMINATION OF OFFSET BETWEEN A FIXED WAVELENGTH LASER AND AN ABSORPTION LINE USING FREQUENCY MODULATION SPECTROSCOPYPOKROWSKY P; WHITTAKER EA; BJORKLUND GC et al.1983; OPTICS COMMUNICATIONS; ISSN 0030-4018; NLD; DA. 1983; VOL. 45; NO 3; PP. 196-200; BIBL. 12 REF.Article

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