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X-ray diffraction line profile analysis for defect study in Cu-1 wt.% Cr-0.1 wt.% Zr alloyKAPOOR, K; LAHIRI, D; BATRA, I. S et al.Materials characterization. 2005, Vol 54, Num 2, pp 131-140, issn 1044-5803, 10 p.Article

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