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Results 1 to 25 of 47

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DETERMINATION OF THE STRUCTURE OF SUCCESSIVE BY DEPOSITED ORDERED LAYERS OF CD ON TI (0001) BY LOW-ENERGY ELECTRON DIFFRACTION.SHIH HD; JONA F; JEPSEN DW et al.1976; COMMUNIC. PHYS.; G.B.; DA. 1976; VOL. 1; NO 1; PP. 25-31; BIBL. 6 REF.Article

TITANIUM NITRIDE FILMS PREPARED BY ION IMPLANTATIONCHEN PA; YANG TT.1981; THIN SOLID FILMS; ISSN 0040-6090; CHE; DA. 1981; VOL. 81; NO 1; PP. L91-L92; BIBL. 2 REF.Article

ETUDE DE LA COMPOSITION DE LA COUCHE D'OXYDES FORMEE APRES L'ECHAUFFEMENT IMPULSIONNEL D'UN METALAKIMOV AG; GAGARIN AP; DAGUROV VG et al.1980; Z. TEH. FIZ.; ISSN 0044-4642; SUN; DA. 1980; VOL. 50; NO 11; PP. 2461-2463; BIBL. 10 REF.Article

ADHESION OF FILMS OF MOS2 TO OXIDIZED METAL SURFACES.STUPIAN GW; CHASE AB.1977; J. VACUUM SCI. TECHNOL.; U.S.A.; DA. 1977; VOL. 14; NO 5; PP. 1146-1152; BIBL. 16 REF.Article

ETUDE PAR DIFFRACTION ELECTRONIQUE DE LA STRUCTURE DES FILMS ANODIQUES FORMES PAR VOIE INTENSIOSTATIQUE SUR LE TITANE EN MILIEU ACIDE. CALCUL DES INTENSITES RELATIVES DES RAIES POUR DIFFERENTES STRUCTURES TI-OPOLITI A; JOUVE G; SERVANT C et al.1978; J. MICR. SPECTROSC. ELECTRON.; FRA; DA. 1978; VOL. 3; NO 6; PP. 513-531; ABS. ENG; BIBL. 18 REF.Article

ELECTRON MICROSCOPY OF PBO, DEPOSITED ON A TITANIUM SUBSTRATESTEVENS R; GILROY D.1981; J. MICROSC. (OXF.); ISSN 0022-2720; GBR; DA. 1981; VOL. 124; NO 3; PP. 265-274; BIBL. 8 REF.Conference Paper

UTILISATION DE SOURCES A CATHODE FROIDE POUR LA CARACTERISATION DES SURFACES.ROMAND M; BADOR R; ROCHE A et al.1977; J. MICR. SPECTROSC. ELECTRON.; FR.; DA. 1977; VOL. 2; NO 6; PP. 627-634; ABS. ANGL.; BIBL. 20 REF.Article

ETUDE DE COUCHES MINCES PREPAREES PAR DEPOT CHIMIQUE EN PHASE VAPEUR A PARTIR DU COMPOSE DE COORDINATION TRIS (2,2'-BIPYRIDINE) TITANE (0): INTRODUCTION A L'ETUDE DE NOUVEAUX MATERIAUX TRES DESORDONNES = VAPOUR DEPOSITION OF THIN FILMS FROM (2,2'-BIPYRIDINE) TITANIUM (0)MORANCHO ROLAND.1980; ; FRA; DA. 1980; 166 P.: ILL.; 30 CM; BIBL. 83 REF.; TH.: SCI. PHYS./TOULOUSE, I.N.P./1980/46Thesis

ETUDE DES COUCHES POREUSES FORMEES PAR OXYDATION ANODIQUE DU TITANE SOUS FORTES TENSIONS = STUDY OF POROUS ANODIC THIN FILMS ON TI FORMED WITH HIGH VOLTAGEMARCHENOIR JC; LOUP JP; MASSON J et al.1980; THIN SOLID FILMS; ISSN 0040-6090; CHE; DA. 1980; VOL. 66; NO 3; PP. 357-369; ABS. ENG; BIBL. 20 REF.Article

ETUDE ULTRAMICROSCOPIQUE DES COUCHES D'OXYDE DE SILICIUM, OBTENUES PAR DEPOT MOLECULAIRE A LA SURFACE DES METAUX ET DES SEMI-CONDUCTEURSNECHIPORENKO AP; SHEVCHENKO GK; EREMEEVA MA et al.1978; IZVEST. VYSSH. UCHEBN. ZAVED., KHIM. KHIM. TEKHNOL.; SUN; DA. 1978; VOL. 21; NO 10; PP. 1433-1436; BIBL. 4 REF.Article

CARACTERISATION PAR MICROANALYSE X, M.E.B. ET RAYONS X, DE DEPOTS DE DIBORURE DE TITANE.MORLEVAT JP; UNY G.1977; J. MICR. SPECTROSC. ELECTRON.; FR.; DA. 1977; VOL. 2; NO 6; PP. 643-649; ABS. ANGL.; BIBL. 2 REF.Article

PRODUCTION OF POLYCRYSTALLINE N-TIO2-LAYERS FOR PHOTOELECTROCHEMICAL PURPOSEHARTIG KJ; LICHTSCHEIDL J; GETOFF N et al.1981; Z. NATURFORSCH., A; ISSN 0340-4811; DEU; DA. 1981; VOL. 36; NO 1; PP. 51-56; BIBL. 27 REF.Article

LOW-ENERGY ELECTRON-DIFFRACTION DETERMINATION OF THE STRUCTURE OF SUCCESSIVELY DEPOSITED ORDERED LAYERS OF CD ON TI (0001). I. THE FIRST LAYER.SHIH HD; JONA F; JEPSEN DW et al.1977; PHYS. REV., B; U.S.A.; DA. 1977; VOL. 15; NO 12; PP. 5550-5560; BIBL. 21 REF.Article

LOW-ENERGY ELECTRON-DIFFRACTION DETERMINATION OF THE STRUCTURE OF SUCCESSIVELY DEPOSITED ORDERED LAYERS OF CD ON TI(0001). II. SECOND, THIRD, AND FOURTH LAYERS.SHIH HD; JONA F; JEPSEN DW et al.1977; PHYS. REV., B; U.S.A.; DA. 1977; VOL. 15; NO 12; PP. 5561-5566; BIBL. 4 REF.Article

EFFET DE L'OXYDATION EN SURFACE ET EN VOLUME SUR LES SPECTRES DE PERTES CARACTERISTIQUES D'ENERGIE D'ELECTRONS DANS LES COUCHES MINCES DE TITANE.BROUSSEAU B; FRANDON J; OUSTRY A et al.1978; SURF. SCI.; NETHERL.; DA. 1978; VOL. 71; NO 3; PP. 679-686; ABS. ANGL.; BIBL. 16 REF.Article

Preparation of BaTiO3 thin film by hydrothermal electrochemical methodYOSHIMURA, M; YOO, S.-E; HAYASHI, M et al.Japanese journal of applied physics. 1989, Vol 28, Num 11, pp L2007-L2009, issn 0021-4922, part 2Article

Ellipsometric study of anodic oxide growth: application to the titanium oxide systemsJOSEPH, J; GAGNAIRE, A.Thin solid films. 1983, Vol 103, Num 3, pp 257-265, issn 0040-6090Article

The bonding of protective films of amorphic diamond to titaniumCOLLINS, C. B; DAVANLOO, F; LEE, T. J et al.Journal of applied physics. 1992, Vol 71, Num 7, pp 3260-3265, issn 0021-8979Article

Electrochemical, hydrothermal, and electrochemical-hydrothermal synthesis of barium titanate thin films on titanium substratesBACSA, R; RAVINDRANATHAN, P; DOUGHERTY, J. P et al.Journal of materials research. 1992, Vol 7, Num 2, pp 423-428, issn 0884-2914Article

Effect of surface treatment on the photoanodic behaviour of thin film n-CdSeBANDYOPADHYAY, T. K; CHAKRABORTY, S. B; CHAUDHURI, S. R et al.Physica status solidi. A. Applied research. 1988, Vol 108, Num 2, pp K119-K123, issn 0031-8965Article

Preparation and deposition mechanism of ferroelectric PbTiO3 thin films by chemical vapor depositionSOON-GIL YOON; HO-GI KIM.Journal of the Electrochemical Society. 1988, Vol 135, Num 12, pp 3137-3140, issn 0013-4651Article

Forte absorption anormale du rayonnement IR de polarisation s à la fréquence harmonique d'une couche d'oxyde sur le métalVASIL'EV, A. F; GUSHANSKAYA, N. YU; ZHIZHIN, G. N et al.Optika i spektroskopiâ. 1988, Vol 64, Num 3, pp 700-702, issn 0030-4034Article

The complex AC susceptibility of superconducting Y-Ba-CuO thin film and bulk samplesLOBOTKA, P; GOMORY, F.Physica status solidi. A. Applied research. 1988, Vol 109, Num 1, pp 205-210, issn 0031-8965Article

Electrodeposited semiconducting molybdenum selenide films. I: Preparatory technique and structural characterisationCHANDRA, S; SAHU, S. N.Journal of physics. D, Applied physics (Print). 1984, Vol 17, Num 10, pp 2115-2123, issn 0022-3727Article

Electrodeposition and material characterization of CdS thin films on titanium aluminium and SnO2JAYACHANDRAN, M; CHOKALINGAM, M. J; VENKATESAN, V. K et al.Journal of materials science letters. 1989, Vol 8, Num 5, pp 563-565, issn 0261-8028, 3 p.Article

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