INTEGRAL BREADTH ANALYSIS OF STRUCTURAL DEFECTS IN VACUUM-EVAPORATED THIN FILMS OF SILVER.CHAUDHURI AK; MISRA NK.1973; INDIAN J. PURE APPL. PHYS.; INDIA; DA. 1973; VOL. 11; NO 12; PP. 935-937; BIBL. 5 REF.Article

A MINIATURE HIGH-VALUED RESISTORAWATAR SINGH.1981; VACUUM; ISSN 0042-207X; GBR; DA. 1981; VOL. 31; NO 2; PP. 129-130; BIBL. 9 REF.Article

GRAIN GROWTH OF EVAPORATED TE FILMS ON A HEATED AND COOLED SUBSTRATE.OKUYAMA K; KUMAGAI Y.1975; J. APPL. PHYS.; U.S.A.; DA. 1975; VOL. 46; NO 4; PP. 1473-1477; BIBL. 7 REF.Article

CROISSANCE DE COUCHES MONOCRISTALLINES SOUS UNE COUCHE PROTECTRICE)PALATNIK LS; FEDORENKO AI; EDYKIN V YA et al.1975; PRIBORY TEKH. EKSPER.; S.S.S.R.; DA. 1975; NO 6; PP. 243-245; BIBL. 3 REF.Article

BEHAVIOR OF GOLD METAL AS AN IMPURITY FOR THE CHEMICAL VAPOUR DEPOSITION OF TITANIUM NITRIDE ON QUARTZ GLASS.SUGIYAMA K; TAKAHASHI Y; MOTOJIMA S et al.1975; CHEM. LETTERS; JAP.; DA. 1975; NO 4; PP. 363-366; BIBL. 3 REF.Article

EINE SPEKTROSKOPISCHE METHODE ZUR UNTERSUCHUNG DES ANFANGSSTADIUMS DER METALLSCHICHTBILDUNG AUF GLAS = METHODE SPECTROSCOPIQUE POUR L'ETUDE DU STADE INITIAL DE LA FORMATION DE COUCHES METALLIQUES SUR DU VERREDEMME U; MEYER K; TILLER HJ et al.1975; KRISTALL U. TECH.; DTSCH.; DA. 1975; VOL. 10; NO 4; PP. 433-442; ABS. ANGL.; BIBL. 21 REF.Article

ETCHING METHODS FOR INDIUM OXIDE/TIN OXIDE FILMS.BRADSHAW G; HUGHES AJ.1976; THIN SOLID FILMS; NETHERL.; DA. 1976; VOL. 33; NO 2; PP. L5-L8; BIBL. 1 REF.Article

INFLUENCE OF DEPOSITION CONDITIONS AND SUBSTRATE STRUCTURE ON THE STRUCTURE OF SPUTTERED TELLURIUM FILMS.MARINKOVIC Z; ROY R.1974; THIN SOLID FILMS; NETHERL.; DA. 1974; VOL. 24; NO 2; PP. 355-359; BIBL. 6 REF.Article

AMORPHOUS BISMUTH-GERMANIUM THIN FILMS. I. STRUCTURAL AND ELECTRICAL PROPERTIES.VASS RW; MEININGER MA; ANDERSON RM et al.1974; J. APPL. PHYS.; U.S.A.; DA. 1974; VOL. 45; NO 2; PP. 843-854; BIBL. 39 REF.Article

COUCHES DE SULFURE DE CADMIUM DEPOSEES A PARTIR DE SOLUTION AQUEUSE FORMANT UN SYSTEME DE JONCTIONS N-NRUDYAK VM; ZHAROV SN.1980; IZV. AKAD. NAUK SSSR, NEORG. MATER.; ISSN 0002-337X; SUN; DA. 1980; VOL. 16; NO 6; PP. 968-971; BIBL. 13 REF.Article

X-RAY STUDIES OF LATTICE DEFECTS IN CHEMICALLY DEPOSITED THIN FILMS OF SILVER.CHAUDHURI AK; MISRA NK.1974; INDIAN J. PURE APPL. PHYS.; INDIA; DA. 1974; VOL. 12; NO 2; PP. 156-158; BIBL. 9 REF.Article

GROWTH OF GERMANIUM FILMS ON GLASSARORA RK.1973; INTERNATION. J. ELECTRON.; G.B.; DA. 1973; VOL. 34; NO 2; PP. 193-199; BIBL. 16 REF.Serial Issue

MESURE DE L'ENERGIE D'ADHESION DES COUCHES MINCESNESMELOV EA; NIKITIN AS; GUSEV AG et al.1982; OPT.-MEH. PROM.; ISSN 0030-4042; SUN; DA. 1982; NO 10; PP. 34-37; BIBL. 12 REF.Article

THE EFFECT OF A GLASS SUBSTRATE ON COOLING RATE IN SPLAT-QUENCHING.SCOTT MG.1974; J. MATER. SCI.; G.B.; DA. 1974; VOL. 9; NO 8; PP. 1372-1374; BIBL. 13 REF.Article

OBTENTION DU SELENIUM DE LA MODIFICATION MONOCLINIQUEBAGIROV SB; MAMEDOV KP; MAMEDALIEVA GG et al.1980; IZV. AKAD. NAUK SSSR, NEORG. MATER.; ISSN 0002-337X; SUN; DA. 1980; VOL. 16; NO 9; PP. 1666-1668; BIBL. 8 REF.Article

PARTICULARITES DE L'ETAT DE PHASES ET DE LA STRUCTURE DES COUCHES ELECTROCHROMES DE WO₃FILIPCHENKO V YA; FINKEL'SHTEJN S KH; SUROV YU I et al.1980; IZV. AKAD. NAUK SSSR, NEORG. MATER.; ISSN 0002-337X; SUN; DA. 1980; VOL. 16; NO 9; PP. 1687; H.T. 1; BIBL. 6 REF.Article

EFFECT OF SUBSTRATE TEMPRERATURE ON THE THICKNESS OF EVAPORATED SE-36.7 AT.% AS ALLOY FILMSABOWITZ G; LEDER LB.1978; J. VACUUM SCI. TECHNOL.; USA; DA. 1978; VOL. 15; NO 5; PP. 1746-1751; BIBL. 12 REF.Article

DISSOCIATION DES VAPEURS RE₂(CO)₁₀ ET OBTENTION DE COUCHES DANS UNE DECHARGE A HAUTE FREQUENCEOSIPOV KA; FOLMANIS G EH; SOBIEVA LS et al.1978; IZVEST. AKAD. NAUK S.S.S.R., NEORG. MATER.; SUN; DA. 1978; VOL. 14; NO 8; PP. 1543-1544; BIBL. 3 REF.Article

EFFECT OF DEPOSITION PARAMETERS AND THE SUBSTRATE CONDITION OF THE CRYSTALLINITY OF BISMUTH FILMS.PATEL AR; SHIVA KUMAR GK.1977; INDIAN J. PHYS., A; INDIA; DA. 1977; VOL. 51; NO 2; PP. 128-131; H.T. 3; BIBL. 7 REF.Article

CROSS-SECTIONAL STRUCTURE OF BI FILMS AND ITS PHENOMENOLOGICAL ANALYSIS.NAMBA Y; MORI T.1975; J. APPL. PHYS.; U.S.A.; DA. 1975; VOL. 46; NO 3; PP. 1159-1164; BIBL. 14 REF.Article

STRUCTURAL DEPENDENCE OF ELECTRICAL CONDUCTIVITY OF THIN TELLURIUM FILMS.DINNO MA; SCHWARTZ M; GIAMMARA B et al.1974; J. APPL. PHYS.; U.S.A.; DA. 1974; VOL. 45; NO 8; PP. 3328-3331; BIBL. 12 REF.Article

STUDIES ON DEPOSITION OF FE₂O₃ FILMS BY SPRAY PYROLYSIS METHODPAWAR SK; PAWAR SH.1983; MATERIALS RESEARCH BULLETIN; ISSN 0025-5408; USA; DA. 1983; VOL. 18; NO 2; PP. 211-215; BIBL. 9 REF.Article

ELECTROCHEMICHROMISM OF RF REACTIVELY SPUTTERED TUNGSTEN-OXIDE FILMSKANEKO H; MIYAKE K; TERAMOTO Y et al.1982; J. APPL. PHYS.; ISSN 0021-8979; USA; DA. 1982; VOL. 53; NO 6; PP. 4416-4421; BIBL. 23 REF.Article

MODELING OF CW LASER ANNEALING OF MULTILAYER STRUCTURESCALDER ID; SUE R.1982; JOURNAL OF APPLIED PHYSICS; ISSN 0021-8979; USA; DA. 1982; VOL. 53; NO 11; PART. 1; PP. 7545-7550; BIBL. 15 REF.Article

THERMAL GROOVING IN THIN SILVER FILMSSHARMA SK; SPITZ J.1981; J. MATER. SCI.; ISSN 0022-2461; GBR; DA. 1981; VOL. 16; NO 2; PP. 535-536; BIBL. 11 REF.Article