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CALIBRATION OF A JUMPING BEAM EVAPORATOR BY QUANTITATIVE ESCA MEASUREMENTS.POLASCHEGG HD; SNAITH JC.1976; J. MICR. SPECTROSC. ELECTRON.; FR.; DA. 1976; VOL. 1; NO 1; PP. 53-62; BIBL. 13 REF.Article

PLENARY LECTURE: SURFACE CHARACTERIZATION USING ELECTRON SPECTROSCOPY (ESCA).HERCULES DM.1977; IN: CHARACT. MET. POLYM. SURF. SYMP. ADV. CHARACT. MET. POLYM. SURF.; NEW YORK; 1976; NEW YORK; ACADEMIC PRESS; DA. 1977; VOL. 2; PP. 399-430; BIBL. 16 REF.Conference Paper

AUGER SPECTROSCOPIC STUDY ON THE SURFACE COMPOSITION OF CU-NI ALLOYS OXIDIZED WITH NITRIC OXIDE.TAKASU Y; SHIMIZU H; MARU SI et al.1976; SURF. SCI.; NETHERL.; DA. 1976; VOL. 61; NO 1; PP. 279-282; BIBL. 8 REF.Article

HIGH VACUUM SCANNING ELECTRON MICROSCOPY AS A TOOL IN SURFACE ANALYSIS = MICROSCOPIE ELECTRONIQUE A BALAYAGE SOUS VIDE POUSSE COMME MOYEN D'ANALYSE DES SURFACESBARGERON CB.1980; JOHNS HOPKINS A.P.L. TECH. DIG.; USA; DA. 1980; VOL. 1; NO 1; PP. 38-44; BIBL. 6 REF.Article

PLENARY LECTURE: ION MICROSCOPY AND SURFACE ANALYSIS.MORRISON GH.1977; IN: CHARACT. MET. POLYM. SURF. SYMP. ADV. CHARACT. MET. POLYM. SURF.; NEW YORK; 1976; NEW YORK; ACADEMIC PRESS; DA. 1977; VOL. 2; PP. 351-366; BIBL. 27 REF.Conference Paper

AUGER ELECTRON SPECTROSCOPY OF SOLID SURFACES.GRANT JT.1977; IN: CHARACT. MET. POLYM. SURF. SYMP. ADV. CHARACT. MET. POLYM. SURF.; NEW YORK; 1976; NEW YORK; ACADEMIC PRESS; DA. 1977; VOL. 2; PP. 133-154; BIBL. 3 P.Conference Paper

EXAFS INVESTIGATION OF OXIDATION PROCESSES IN METALLIC CU = ETUDE PAR UN DETECTEUR PHOTOCATHODIQUE EXAFS DE L'OXYDATION DU CUFISCHER DA; COHEN GG; SHEVCHIK NJ et al.1980; J. PHYS. F; ISSN 0305-4608; GBR; DA. 1980; VOL. 10; NO 5; PP. L139-L142; BIBL. 8 REF.Article

SYMPOSIUM ON APPLIED SURFACE ANALYSIS = SYMPOSIUM SUR L'ANALYSE DE SURFACE1980; APPL. SURF. SCI.; NLD; DA. 1980; VOL. 4; NO 3-4; PP. 249-555; BIBL. DISSEM.Conference Paper

MOLECULAR SPECTROSCOPY BY INELASTIC ELECTRON TUNNELING.ROENKER KP; BAUN WL.1977; IN: CHARACT. MET. POLYM. SURF. SYMP. ADV. CHARACT. MET. POLYM. SURF.; NEW YORK; 1976; NEW YORK; ACADEMIC PRESS; DA. 1977; VOL. 2; PP. 477-497; BIBL. 38 REF.Conference Paper

PLENARY LECTURE: SURFACE ANALYSIS AT THE ATOMIC LEVEL USING THE ATOM-PROBE.MULLER EW; KRISHNASWAMY SV.1977; IN: CHARACT. MET. POLYM. SURF. SYMP. ADV. CHARACT. MET. POLYM. SURF.; NEW YORK; 1976; NEW YORK; ACADEMIC PRESS; DA. 1977; VOL. 2; PP. 21-48; BIBL. 2 P. 1/2Conference Paper

METHODE DE DETERMINATION DES OXYDES SUR LA SURFACE DE FEUILLE ELECTROLYTIQUE EN CUIVREKOCHEROVA AV; GOLOVINA ES; KOROTKOVA TS et al.1976; ZAVODSK. LAB.; S.S.S.R.; DA. 1976; VOL. 42; NO 11; PP. 1353-1355Article

SURFACE CHARACTERIZATION BY ION MICROPROBE ANALYSER.STEWART IM.1977; IN: CHARACT. MET. POLYM. SURF. SYMP. ADV. CHARACT. MET. POLYM. SURF.; NEW YORK; 1976; NEW YORK; ACADEMIC PRESS; DA. 1977; VOL. 2; PP. 367-373; BIBL. 4 REF.Conference Paper

SPEKTRALANALYTISCHE UNTERSUCHUNGEN AN GUSSEISERNEN OBERFLAECHEN MIT DER GLIMMLAMPE. = RECHERCHES SUR L'ANALYSE SPECTROMETRIQUE DE LA SURFACE DE FONTES A L'AIDE D'UNE LAMPE A DECHARGEHARTUNG W.1977; GIESSEREI; DTSCH.; DA. 1977; VOL. 64; NO 24; PP. 634-637; ABS. ANGL. FR.; BIBL. 6 REF.Article

L'ANALYSE DES SURFACES.BAUDIN G.1976; ANALUSIS; FR.; DA. 1976; VOL. 4; NO 7; PP. 320-322Article

APPLICATION OF PHOTOACOUSTIC SPECTROSCOPY TO METAL SURFACECHIBA A.1979; KINZOKU HYOMEN GIJUTSU; ISSN 0026-0614; JPN; DA. 1979; VOL. 30; NO 11; PP. 576-583; BIBL. 49 REF.Article

ANALYSE DE SURFACE DE L'ALUMINIUM PAR SPECTROMETRIE AUGEROTAKA Y; ODA T.1978; J. JAP. INST. LIGHT METALS; JPN; DA. 1978; VOL. 28; NO 4; PP. 202-210; BIBL. 29 REF.Article

SURFACE CHARACTERIZATION BY ELECTRON MICROPROBE.STEWART IM.1977; IN: CHARACT. MET. POLYM. SURF. SYMP. ADV. CHARACT. MET. POLYM. SURF.; NEW YORK; 1976; NEW YORK; ACADEMIC PRESS; DA. 1977; VOL. 2; PP. 127-132; BIBL. 6 REF.Conference Paper

DISPOSITIF POUR L'ETUDE DE LA STRUCTURE DE SURFACE DES CRITAUX, PAR LA METHODE DE DIFFRACTION DES ELECTRONSTITOV LA; ROMANOV SS; ZYRYANOV GK et al.1979; PRIBORY TEKH. EKSPER.; SUN; DA. 1979; NO 1; PP. 43-45; BIBL. 3 REF.Article

APPLICATION DE LA SPECTROMETRIE DE MASSE D'IONS SECONDAIRES A L'ANALYSE DE SURFACES ET DES FILMS MINCES = APPLICATION OF SECONDARY ION MASS SPECTROMETRY TO THE ANALYSIS OF SURFACES AND THIN FILMSSIMONDET MF.1983; SURFACES; ISSN 0585-9840; FRA; DA. 1983; NO 158; PP. 14-16; 2 P.Article

OBERFLAECHEN- UND DUENNSCHICHTANALYSEN AN GLASOBERFLAECHEN UND OBERFLAECHENBELAEGEN. III: ANWENDUNG DER ANALYSENVERFAHREN IN ENTWICKLUNG UND PRODUKTION = ANALYSE DE SURFACES ET DE COUCHES MINCES SUR DES SURFACES DE VERRES ET DES REVETEMENTS SUPERFICIELS. III. L'EMPLOI DES METHODES D'ANALYSE EN DEVELOPPEMENT ET EN PRODUCTIONBACH H.1983; GLASTECHNISCHE BERICHTE; ISSN 0017-1085; DEU; DA. 1983; VOL. 56; NO 3; PP. 55-62; ABS. ENG/FRE; BIBL. 2 P.Article

MODERNE METHODEN ZUR OBERFLAECHENANALYSE AN GLAESERN. III. = METHODES MODERNES D'ANALYSE DE SURFACE DES VERRES IIIHAEHNERT M; RAUSCHENBACH B.1978; SILIKATTECHNIK; DDR; DA. 1978; VOL. 29; NO 5; PP. 143-147; BIBL. 118 REF.Article

APPLICATION OF AN AL-TI ALLOY TARGET IN SURFACE ANALYSIS BY X-RAY PHOTOELECTRON SPECTROSCOPYHIROKAWA K; OKU M.1978; TALANTA; GBR; DA. 1978; VOL. 25; NO 9; PP. 539-540; BIBL. 8 REF.Article

REPLICATION - NONDESTRUCTIVE ANALYTICAL AND INSPECTION TECHNIQUE. = LES REPLIQUES. UNE TECHNIQUE ANALYTIQUE ET DE CONTROLE NON DESTRUCTIFSCOTT RH; DEGROOT PB; CARON J et al.1977; MATER. EVALUAT.; U.S.A.; DA. 1977; VOL. 35; NO 10; PP. 45-50; BIBL. 1 REF.Article

CARACTERISATION DES ETATS DE SURFACE EN METALLURGIE ET PLUS PARTICULIEREMENT DANS LE DOMAINE DES ACIERS SPECIAUX. II.MANENC J.1977; MATER. ET TECH.; FR.; DA. 1977; VOL. 65; NO 5; PP. 249; BIBL. 34 REF.Article

SYMPOSIUM PAPERS/INTERNATIONAL SYMPOSIUM ON QUANTITATIVE METALLOGRAPHY, FLORENCE, 21-23 NOVEMBRE 1978sdINTERNATIONAL SYMPOSIUM ON QUANTITATIVE METALLOGRAPHY/1978-11-21/FLORENCE; ITA; MILANO: ASSOCIAZIONE ITALIANA DI METALLURGIA; DA. S.D.; XLVI-350 P.: ILL.; 21 CM; BIBL. DISSEM.Conference Proceedings

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