Scanning force microscopy : Close to absolute zeroHUG, Hans Josef.GIT laboratory journal Europe. 2006, Vol 10, Num 2, pp 49-49, issn 1611-6038, 1 p.Article

Field induced THz wave emission with nanometer resolutionTAO YUAN; PARK, Hongkyu; JINGZHOU XU et al.SPIE proceedings series. 2005, pp xxix-xxxvi, isbn 0-8194-5610-1Conference Paper

Effects of electrostatic fields and Casimir force on cantilever vibrationsCHUMAK, A. A; MILONNI, P. W; BERMAN, G. P et al.Physical review B. Condensed matter and materials physics. 2004, Vol 70, Num 8, pp 085407.1-085407.9, issn 1098-0121Article

A compact sensor head for simultaneous scanning force and near-field optical microscopySAVIO, C. Dal; WOLFF, H; DZIOMBA, T et al.Precision engineering. 2002, Vol 26, Num 2, pp 199-203, issn 0141-6359Article

Scanning probe microscopyPOGGI, Mark A; BOTTORNLEY, Lawrence A; LILLEHEI, Peter T et al.Analytical chemistry (Washington, DC). 2002, Vol 74, Num 12, pp 2851-2862, issn 0003-2700Article

Investigation of the electrostatic forces in scanning probe microscopy at low bias voltagesPATIL, Shivprasad; DHARMADHIKARI, C. V.Surface and interface analysis. 2002, Vol 33, Num 2, pp 155-158, issn 0142-2421Conference Paper

Combining scanning probe microscopy and Raman microscopyHAYWARD, Ian.Spectra 2000 analyse. 2002, Vol 31, Num 227, pp 35-38, issn 1255-2909Article

Design aspects of a fast 3D surface scanner based on DMD technology and confocal microscopyTIFTIKCI, K. A; VELZEL, C. H; SCHELLEKENS, P. H. J et al.euspen : european society for precision engineering and nanotechnology. International conference. 2001, pp 418-421, 2VolConference Paper

The role of shear forces in scanning force microscopy : a comparison between the jumping mode and tapping modeMORENO-HERRERO, F; DE PABLO, P. J; COLCHERO, J et al.Surface science. 2000, Vol 453, Num 1-3, pp 152-158, issn 0039-6028Article

Elektrische Signale in Mikrobauteilen: Messungen mit dem Rastersondenmikroskop = Measuring of electrical signals in integrated microelectronic circuits by means of scanning probe microscopyMERTIN, W; BANGERT, J; KLEIN, M. A et al.Materialprüfung. 1999, Vol 41, Num 10, pp 414-417, issn 0025-5300Article

Non-contact feedback for scanning capillary microscopyENG, L; WIRTH, E; SUTER, T et al.Electrochimica acta. 1998, Vol 43, Num 19-20, pp 3029-3033, issn 0013-4686Conference Paper

Nanoscapes : Coupled SPM-VR analysis of environmental surfacesSHEVCHENKO, S. M; BAILEY, G. W; YU, Y. S et al.American laboratory (Fairfield). 1997, Vol 29, Num 7, issn 0044-7749, p. 18Article

Nanoscale modification of conducting lines with a scanning force microscopeRANK, R; BRÜCKL, H; KRETZ, J et al.Vacuum. 1997, Vol 48, Num 5, pp 467-472, issn 0042-207XArticle

Force modulation microscopy for the study of stiff materialsTROYON, M; WANG, Z; PASTRE, D et al.Nanotechnology (Bristol. Print). 1997, Vol 8, Num 4, pp 163-171, issn 0957-4484Article

Self-oscillating micro-SQUIDs for application in a scanning SQUID microscopeDECHERT, J; KRISCHKER, K; GÖDDENHENRICH, T et al.IEEE transactions on applied superconductivity. 1997, Vol 7, Num 2, pp 3143-3146, issn 1051-8223, 3Conference Paper

A compact confocal interference microscope based on a four-port single-mode fibre couplerZHOU, H; SHEPPARD, C. J. R; GU, M et al.Optik (Stuttgart). 1996, Vol 103, Num 1, pp 45-48, issn 0030-4026Article

A double-axis microscope and its three-dimensional image position adjustment based and an optical marker methodKIKUCHI, S; SONOBE, K; SHINOHARA, D et al.Optics communications. 1996, Vol 129, Num 3-4, pp 237-244, issn 0030-4018Article

Deformation, contact time, and phase contrast in tapping mode scanning force microscopyTAMAYO, J; GARCIA, R.Langmuir. 1996, Vol 12, Num 18, pp 4430-4435, issn 0743-7463Article

Thermomechanical deflection of microcantilever beams in scanning force microscopesLI, B. Q; LIN, J; WANG, W et al.Journal of micromechanics and microengineering (Print). 1996, Vol 6, Num 3, pp 330-336, issn 0960-1317Article

Efficient real-time confocal microscopy with white light sourcesJUSKAITIS, R; WILSON, T; NEIL, M. A. A et al.Nature (London). 1996, Vol 383, Num 6603, pp 804-806, issn 0028-0836Article

Resolving fluorescence beads at 100-200 nm axial distance with a two-photon 4Pi-microscope operating in the near infraredHELL, S. W; SCHRADER, M; HÄNNINEN, P. E et al.Optics communications. 1995, Vol 120, Num 3-4, pp 129-133, issn 0030-4018Article

Plasmonic nano-imaging and nanofabrication (3-4 August 2005, San Diego, California, USA)Kawata, Satoshi; Shalaev, Vladimir M; Tsai, Din Ping et al.Proceedings of SPIE. 2005, isbn 0-8194-5933-X, 1Vol, pagination multiple, isbn 0-8194-5933-XConference Proceedings

Numerical analysis of enhanced optical trapping force based on centripetal evanescent wavesGANG WANG.Proceedings of SPIE. 2005, pp 59300U.1-59300U.8, isbn 0-8194-5935-6, 1VolConference Paper

Submicron particle localization using evanescent fieldSILER, Martin; SERY, Mojmir; CIZMAR, Tomas et al.Proceedings of SPIE. 2005, pp 59300R.1-59300R.19, isbn 0-8194-5935-6, 1VolConference Paper

Nanoelectromechanics of piezoresponse force microscopyKALININ, Sergei V; KARAPETIAN, Edgar; KACHANOV, Mark et al.Physical review B. Condensed matter and materials physics. 2004, Vol 70, Num 18, pp 184101.1-184101.24, issn 1098-0121, 2Article