Pascal and Francis Bibliographic Databases


Search results

Your search

ct.\*:("Scanning probe microscopes, components and techniques")

Document Type [dt]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Publication Year[py]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Discipline (document) [di]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV


A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Author Country

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Results 1 to 25 of 4536

  • Page / 182

Selection :

  • and

Nonlinear Raman nano-imaging using plasmons localized at a metallic tipICHIMURA, Taro; INOUYE, Yasushi.Proceedings of SPIE. 2005, pp 592802.1-592802.9, isbn 0-8194-5933-X, 1VolConference Paper

Mean free paths for inelastic electron scattering in silicon and poly(styrene) nanospheresCHOU, T. M; LIBERA, M.Ultramicroscopy. 2003, Vol 94, Num 1, pp 31-35, issn 0304-3991, 5 p.Article

Imaging: From video games to scanning probe microscopyWEST, Paul; JONI LI.American laboratory (Fairfield). 2003, Vol 35, Num 16, pp 24-29, issn 0044-7749, 5 p.Article

Electrostatic force gradient signal: resolution enhancement in electrostatic force microscopy and improved Kelvin probe microscopyGIL, A; COLCHERO, J; GOMEZ-HERRERO, J et al.Nanotechnology (Bristol. Print). 2003, Vol 14, Num 2, pp 332-340, issn 0957-4484, 9 p.Conference Paper

Dynamic force spectroscopy: a Fokker-Planck approachDUDKO, O. K; FILIPPOV, A. E; KLAFTER, J et al.Chemical physics letters. 2002, Vol 352, Num 5-6, pp 499-504, issn 0009-2614Article

Fabrication of thermal microprobes with a sub-100 nm metal-to-metal junctionLEE, D. W; ONO, Takahito; ESASHI, Masayoshi et al.Nanotechnology (Bristol. Print). 2002, Vol 13, Num 1, pp 29-32, issn 0957-4484Article

Les microscopies à champ proche: 2e partie = Near field microscopes : second partKOPP-MARSAUDON, Sophie; COHEN-BOUHACINA, Touria; AIME, Jean-Pierre et al.Spectra 2000 analyse. 2002, Vol 31, Num 227, pp 13-21, issn 1255-2909Article

Friction between Si tip and (001)-2 x 1 surface: A molecular dynamics simulationJUN CAI; WANG, Jian-Sheng.Computer physics communications. 2002, Vol 147, Num 1-2, pp 145-148, issn 0010-4655, 4 p.Conference Paper

A low voltage point source microscope for interferometryFROST, Bernhard G; JOY, David C; THESEN, Alexander et al.SPIE proceedings series. 2002, isbn 0-8194-4435-9, 2Vol, vol 1, 576-583Conference Paper

A new method for three-dimensional measurement of surface profile based on the focused image surface algorithm and optical microscopeHEUI JAE PAHK; YOUNG MIN HWANG.euspen : european society for precision engineering and nanotechnology. International conference. 2001, pp 518-521, 2VolConference Paper

The waveform separation of displacement current and tunneling current using a scanning vibrating probeMAJIMA, Yutaka; UEHARA, Setsuri; MASUDA, Tomohiko et al.Thin solid films. 2001, Vol 393, Num 1-2, pp 204-209, issn 0040-6090Conference Paper

Specific detection of interactions between uncharged surfaces in different solvents : high-resolution imaging by chemical force microscopyPAPASTAVROU, G; AKARI, S.Nanotechnology (Bristol. Print). 1999, Vol 10, Num 4, pp 453-457, issn 0957-4484Article

Carbon nanotube tips for a scanning probe microscope : their fabrication and propertiesAKITA, S; NISHIJIMA, H; NAKAYAMA, Y et al.Journal of physics. D, Applied physics (Print). 1999, Vol 32, Num 9, pp 1044-1048, issn 0022-3727Article

Effect of adsorbed water on the resolution of scanning capacitance microscopesLANYI, S.Surface and interface analysis. 1999, Vol 27, Num 5-6, pp 348-353, issn 0142-2421Conference Paper

Forum des microscopies à sonde locale (Autrans, 29-31 mars 1999)Forum des microscopies à sonde locale. 1999, 220 p.Conference Proceedings

Effects of semiconductor surface band pinning on scanning electrostatic force microscopyHENNING, A. K.SPIE proceedings series. 1998, pp 54-65, isbn 0-8194-2971-6Conference Paper

Electrical-conductivity SFM study of an ultrafiltration membraneGALLO, P.-J; KULIK, A. J; BURNHAM, N. A et al.Nanotechnology (Bristol. Print). 1997, Vol 8, Num 1, pp 10-13, issn 0957-4484Article

Mechanical features of the SPM microprobe and nanoscale mass detectorKISLOV, V; KOLESOV, V; TARANOV, I et al.Nanotechnology (Bristol. Print). 1997, Vol 8, Num 3, pp 126-131, issn 0957-4484Article

Toward true surface recovery : Studying distortions in scanning probe microscopy image dataWILLIAMS, P. M; SHAKESHEFF, K. M; DAVIES, M. C et al.Langmuir. 1996, Vol 12, Num 14, pp 3468-3471, issn 0743-7463Article

A scanning field emission microscopeSENDECKI, S; BARWINSKI, B.Measurement science & technology (Print). 1995, Vol 6, Num 3, pp 306-309, issn 0957-0233Article

Fabrication of cantilever with ultrasharp and high-aspect-ration stylus for scanning Maxwell-stress microscopyITOH, J; TOHMA, Y; INOUE, T et al.Japanese journal of applied physics. 1994, Vol 33, Num 12B, pp 7167-7170, issn 0021-4922, 1Article

Scanning force microscopy : Close to absolute zeroHUG, Hans Josef.GIT laboratory journal Europe. 2006, Vol 10, Num 2, pp 49-49, issn 1611-6038, 1 p.Article

Field induced THz wave emission with nanometer resolutionTAO YUAN; PARK, Hongkyu; JINGZHOU XU et al.SPIE proceedings series. 2005, pp xxix-xxxvi, isbn 0-8194-5610-1Conference Paper

Effects of electrostatic fields and Casimir force on cantilever vibrationsCHUMAK, A. A; MILONNI, P. W; BERMAN, G. P et al.Physical review B. Condensed matter and materials physics. 2004, Vol 70, Num 8, pp 085407.1-085407.9, issn 1098-0121Article

A compact sensor head for simultaneous scanning force and near-field optical microscopySAVIO, C. Dal; WOLFF, H; DZIOMBA, T et al.Precision engineering. 2002, Vol 26, Num 2, pp 199-203, issn 0141-6359Article

  • Page / 182