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Results 1 to 25 of 6960

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Effect of the projectile parameters on the charge state formation process in solid sputteringBELYKH, S. F; PALITSIN, V. V; ADRIAENS, A et al.Applied surface science. 2003, Vol 203-04, pp 126-129, issn 0169-4332, 4 p.Conference Paper

Introduction to the Cameca SIMS instrumentsSCHUHMACHER, M.Le Vide (1995). 1999, Vol 54, Num 292, issn 1266-0167, 139, 231-244 [15 p.]Article

Proton incorporation in yttria-stabilized zirconia during atomic layer depositionKIHO BAE; KYUNG SIK SON; JUN WOO KIM et al.International journal of hydrogen energy. 2014, Vol 39, Num 6, pp 2621-2627, issn 0360-3199, 7 p.Article

Detection of gaseous organophosphorus compounds using secondary ion mass spectrometryGROENEWOLD, G. S; TODD, P. J.Analytical chemistry (Washington, DC). 1985, Vol 57, Num 4, pp 886-890, issn 0003-2700Article

Secondary ion mass spectrometer design considerations for organic and inorganic analysisMAGEE, C. W.A.C.S. symposium series. 1985, Num 291, pp 97-112, issn 0097-6156Article

Characterization of sample heterogeneity in secondary ion mass spectrometry by the use of a sampling constant modelMICHIELS, F. P. L; ADAMS, F. C. V; BRIGHT, D. S et al.Analytical chemistry (Washington, DC). 1991, Vol 63, Num 23, pp 2727-2734, issn 0003-2700Article

Comparison of polyatomic and atomic primary beams for secondary ion mass spectrometry of organicsAPPELHANS, A. D; DELMORE, J. E.Analytical chemistry (Washington, DC). 1989, Vol 61, Num 10, pp 1087-1093, issn 0003-2700, 7 p.Article

Post-implantation as an aid in scale calibration for SIMS depth profilingZALM, P. C; JANSSEN, K. T. F; FONTIJN, G. M et al.Surface and interface analysis. 1989, Vol 14, Num 11, pp 781-786, issn 0142-2421, 6 p.Article

Distinction of oxygen and sulfur in secondary ion mass spectrometryINOUE, K.Japanese journal of applied physics. 1986, Vol 25, Num 9, pp L734-L735, issn 0021-4922, 2Article

Sequence analysis for an unknown peptide by molecular secondary ion mass spectrometrySEKI, S; KAMBARA, H; NAOKI, H et al.Organic mass spectrometry. 1985, Vol 20, Num 1, pp 18-24, issn 0030-493XArticle

Secondary ion mass spectrometric analysis of polymer and coal surfaces for trace inorganic elementsMCINTYRE, N. S; CHAUVIN, W. J; MARTIN, R. R et al.Analytical chemistry (Washington, DC). 1984, Vol 56, Num 8, pp 1519-1521, issn 0003-2700Article

Fast-atom molecular secondary-ion mass spectrometryROSS, M. M; WYATT, J. R; COLTON, R. J et al.International journal of mass spectrometry and ion processes. 1983, Vol 54, Num 3, pp 237-247Article

The effect of oxygen flooding on the secondary ion yield of Cs in the cameca IMS 3fSYKES, D. E; CHEW, A; CRAPPER, M. D et al.Vacuum. 1992, Vol 43, Num 1-2, pp 159-162, issn 0042-207XConference Paper

Sources of uncertainty in the experimental determination of sample heterogeneity in secondary ion mass spectrometryMICHIELS, F. P. L; ADAMS, F. C. V.Analytical chemistry (Washington, DC). 1991, Vol 63, Num 23, pp 2735-2743, issn 0003-2700Article

Isotopic studies of oxidation of Si3N4 and Si using SIMSHONGHUA DU; HOUSER, C. A; TRESSLER, R. E et al.Journal of the Electrochemical Society. 1990, Vol 137, Num 2, pp 741-742, issn 0013-4651, 2 p.Article

Relative sensitivity factors of elements in quantitative secondary ion mass spectrometric analysis of biological reference materialsRAMSEYER, G. O; MORRISON, G. H.Analytical chemistry (Washington, DC). 1983, Vol 55, Num 12, pp 1963-1970, issn 0003-2700Article

Shave-off depth profiling for nano-devicesNOJIMA, Masashi; TOI, Masayuki; MAEKAWA, Ayaka et al.Mikrochimica acta (1966. Print). 2006, Vol 155, Num 1-2, pp 219-223, issn 0026-3672, 5 p.Conference Paper

Sputtered neutral mass spectrometryREUTER, W.TrAC. Trends in analytical chemistry (Regular ed.). 1989, Vol 8, Num 6, pp 203-208, issn 0165-9936Article

Static SIMS investigation of Ag-supported amino acidsTAMAKI, S; SICHTERMANN, W; BENNINGHOVEN, A et al.Japanese journal of applied physics. 1984, Vol 23, Num 5, pp 544-549, issn 0021-4922, 1Article

Proceedings of the Eighteenth International Conference on Secondary Ion Mass Spectrometry, SIMS XVIII, Riva Del Garda, Trento, Italy, September 18-23, 2011Surface and interface analysis. 2013, Vol 45, Num 1, issn 0142-2421, 611 p.Conference Proceedings

Mechanism of MCs+ formation in Cs based secondary ion mass spectrometryWITTMAACK, Klaus.Surface science. 2012, Vol 606, Num 3-4, issn 0039-6028, L18-L21Article

Elimination of cluster interferences in secondary ion mass spectrometry using extreme energy filteringSCHAUER, S. N; WILLIAMS, P.International journal of mass spectrometry and ion processes. 1990, Vol 103, Num 1, pp 21-29, issn 0168-1176, 9 p.Article

Measurement and visual observation of sample charging effects on primary beam focusing in secondary ion mass spectrometryAPPELHANS, A. D.International journal of mass spectrometry and ion processes. 1989, Vol 88, Num 2-3, pp 161-173, issn 0168-1176Article

Spectromètre de masse pour l'analyse des ions secondairesDAUKEEV, D. K; KARETSKAYA, S. P; KASYMOV, S. I et al.Žurnal tehničeskoj fiziki. 1985, Vol 55, Num 3, pp 632-635, issn 0044-4642Article

Sulfur Isotope Studies in Solid Organics: A Protocol for Utilizing Heterogeneous Standards and Secondary Ion Mass SpectrometryKING, Hubert E; ZIMMER, Mindy M; HORN, William C et al.Energy & fuels. 2014, Vol 28, Num 3-4, pp 2446-2453, issn 0887-0624, 8 p.Article

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