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Results 1 to 25 of 93633

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Depth profiling of emerging materials for semiconductor devicesRONSHEIM, P. A.Applied surface science. 2006, Vol 252, Num 19, pp 7201-7204, issn 0169-4332, 4 p.Conference Paper

State of the art program on compound semiconductors XL; Narrow bandgap optoelectronic materials and devices II (San Antonio TX 9-14 May 2004)Buckley, D.N; Chang, P.C; Fox, P.D et al.Proceedings - Electrochemical Society. 2004, issn 0161-6374, isbn 1-56677-407-1, IX, 282 p, isbn 1-56677-407-1Conference Proceedings

State-of-the-art program on compound semiconductors XLI; Nitride and wide bandgap semiconductors for sensors, photonics, and electronics V (Honolulu HI, 3-8 October 2004)Ng, H.M; Baca, A.G.Proceedings - Electrochemical Society. 2004, issn 0161-6374, isbn 1-56677-419-5, XII, 600 p, isbn 1-56677-419-5Conference Proceedings

XVII Latin American Symposium on Solid State PhysicsSANCHEZ, Maria; DE MELO, Osvaldo.Physica status solidi. B. Basic research. 2005, Vol 242, Num 9, issn 0370-1972, 213 p.Conference Proceedings

A mechanism of electron hole pair separation in illuminated semiconductor particlesGERISCHER, H.Journal of physical chemistry (1952). 1984, Vol 88, Num 25, pp 6096-6097, issn 0022-3654Article

The preparation of large semiconductor clusters via the pyrolysis of a molecular precursorBRENNAN, J. G; SIEGRIST, T; CARROLL, P. J et al.Journal of the American Chemical Society. 1989, Vol 111, Num 11, pp 4141-4143, issn 0002-7863, 3 p.Article

First Gerischer Symposium - Semiconductor ElectrochemistryALLONGUE, P; KOLB, D. M; WILLIG, F et al.Electrochimica acta. 2000, Vol 45, Num 28, issn 0013-4686, 179 p.Conference Proceedings

The future of semiconductor manufacturingPILLAI, Devadas.IEEE robotics & automation magazine. 2006, Vol 13, Num 4, pp 16-24, issn 1070-9932, 9 p.Article

Optical bistability in bulk ZnSe due to increasing absorption and self-focusingTAGHIZADEH, M. R; JANOSSY, I; SMITH, S. D et al.Applied physics letters. 1985, Vol 46, Num 4, pp 331-333, issn 0003-6951Article

Excited state localisation cascades in inorganic semiconductor nanoparticlesZWIJNENBURG, Martijn A.PCCP. Physical chemistry chemical physics (Print). 2013, Vol 15, Num 26, pp 11119-11127, issn 1463-9076, 9 p.Article

2006 ROCS (Reliability of Compound Semiconductors) WorkshopERSLAND, Peter; MENOZZI, Roberto.Microelectronics and reliability. 2007, Vol 47, Num 8, pp 1156-1193, issn 0026-2714, 37 p.Conference Paper

Selection of Papers From the 2007 Semiconducting and Insulating Materials Conference (SIMC-XIV)WANG, Zhiming M; KIESEL, Peter.Journal of materials science. Materials in electronics. 2008, Vol 19, Num 8-9, issn 0957-4522, 241 p.Conference Proceedings

Semiconductor photodetectors III (25 January 2006, San Jose, California, USA)Cohen, Marshall J; Dereniak, Eustace L.Proceedings of SPIE, the International Society for Optical Engineering. 2006, issn 0277-786X, isbn 0-8194-6161-X, 1Vol, pagination multiple, isbn 0-8194-6161-XConference Proceedings

Small-sized semiconductor storage subsystem (H-6916-1/5)OKA, T; HASHIMOTO, T.Hitachi review. 1988, Vol 37, Num 5, pp 295-302, issn 0018-277XArticle

Propriétés catalytiques des semi-conducteurs compensésVOL'KENSHTEJN, F. F; KULIKOVA, E. V.Žurnal fizičeskoj himii. 1986, Vol 60, Num 2, pp 453-456, issn 0044-4537Article

Frontiers in semiconductor nanoscience (Part A): In honour of Gerhard AbstreiterBOUGEARD, Dominique; FINLEY, Jonathan; GRAYSON, Matthew et al.Physica status solidi. A, Applications and materials science (Print). 2006, Vol 203, Num 14, issn 1862-6300, 227 p.Serial Issue

Recent experimental advances in precision Casimir force measurements with the atomic force microscopeCHEN, F; MOHIDEEN, U.Journal of physics. A, mathematical and general. 2006, Vol 39, Num 21, pp 6233-6244, issn 0305-4470, 12 p.Conference Paper

Commercialization of Organic ElectronicsLOO, Yueh-Lin; MCCULLOCH, Iain.MRS bulletin. 2008, Vol 33, Num 7, issn 0883-7694, [53 p.]Serial Issue

Self-assembled molecular corrals on a semiconductor surfaceDOBRIN, S; HARIKUMAR, K. R; HOFER, W. A et al.Surface science. 2006, Vol 600, Num 5, issn 0039-6028, L43-L47Article

MicrocavitiesBAUMBERG, J. J; VINA, L.Semiconductor science and technology. 2003, Vol 18, Num 10, issn 0268-1242, 158 p.Serial Issue

RNA-templated semiconductor nanocrystalsNAN MA; DOOLEY, Chad J; KELLEY, Shana O et al.Journal of the American Chemical Society. 2006, Vol 128, Num 39, pp 12598-12599, issn 0002-7863, 2 p.Article

Historical review of compound semiconductor reliabilityROESCH, William J.Microelectronics and reliability. 2006, Vol 46, Num 8, pp 1218-1227, issn 0026-2714, 10 p.Conference Paper

Explosive systems utilizing semiconductor bridge, SCB, technologyBICKES, R. W.Propellants, explosives, pyrotechnics. 1996, Vol 21, Num 3, pp 146-149, issn 0721-3115Article

Semiconductor manufacturing education at San Jose State UniversityGWOZDZ, P. S.IEEE transactions on semiconductor manufacturing. 1992, Vol 5, Num 2, pp 153-156, issn 0894-6507Article

Epitaxial films of semiconducting FeSi2 on (001) siliconMAHAN, J. E; GEIB, K. M; ROBINSON, G. Y et al.Applied physics letters. 1990, Vol 56, Num 21, pp 2126-2128, issn 0003-6951Article

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