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Structure of glasses in the systems Mgi2SiO4-Fe2SiO4-Fe2SiO4, Mg2SiO4-CaMgSiO4, and Mn2SiO4-CaMnSiO4COONEY, T. F; SHARMA, S. K.Journal of non-crystalline solids. 1990, Vol 122, Num 1, pp 10-32, issn 0022-3093Article

On the charge storage and decay mechanism in silicon dioxide electretsOLTHUIS, W; BERGVELD, P.IEEE transactions on electrical insulation. 1992, Vol 27, Num 4, pp 691-697, issn 0018-9367Conference Paper

Nonuniform wet etching of silicon dioxideMCANDREWS, K; SUKANEK, P. C.Journal of the Electrochemical Society. 1991, Vol 138, Num 3, pp 863-866, issn 0013-4651Article

New electrode materials with modified propertiesCRETESCU, I; SUTIMAN, D; VIZITIU, M et al.International symposium on electrets. 1999, pp 301-304, isbn 0-7803-5025-1Conference Paper

Beam charge dependence of ion-surface scatteringHIRD, B; GAUTHIER, P; BULICZ, J et al.Physical review letters. 1991, Vol 67, Num 25, pp 3575-3577, issn 0031-9007Article

Möglichkeiten zur Bandbeschichtung mit Siliciumoxid = Possibilities for strip coating with silicon oxideSCHILLER, S; NEUMAN, M; STRÜMPFEL, J et al.Chemieingenieurtechnik. 1991, Vol 63, Num 4, pp 396-397, issn 0009-286XConference Paper

Chaotic behaviour in an illuminated semiconductor-(thin insulator)-semiconductor structureMANASSON, V. A; TOVSTYUK, K. D; SHUSTER, E. M et al.Electronics Letters. 1990, Vol 26, Num 17, pp 1391-1392, issn 0013-5194Article

Vapor Pressure of Silicon MonoxideFERGUSON, Frank T; NUTH, Joseph A.Journal of chemical and engineering data (Print). 2008, Vol 53, Num 12, pp 2824-2832, issn 0021-9568, 9 p.Article

Thermal decomposition of tetraethoxysilane studied by atmospheric mass-spectrometerSIRAKAMI, K; KOBAYASHI, K; KIKUCHI, H et al.Nippon Kinzoku Gakkaishi (1952). 1996, Vol 60, Num 8, pp 751-756, issn 0021-4876Article

Photochemical characterization of the surface oxide films of Al-Pd-Si and Al-SiKOUBUCHI, Y; MORIBE, S; TANIGAKI, Y et al.Journal of the Electrochemical Society. 1992, Vol 139, Num 7, pp 2032-2037, issn 0013-4651Article

Adsorption of water vapor on silica, alumina, and their mixed oxide aerogelsKNEZ, Zeljko; NOVAK, Zoran.Journal of chemical and engineering data (Print). 2001, Vol 46, Num 4, pp 858-860, issn 0021-9568Article

The reaction of silicon with lithium and potassium hydroxidesDMITRUK, B. F; BABICH, N. N.Russian journal of inorganic chemistry. 1991, Vol 36, Num 2, pp 169-171, issn 0036-0236Article

Thermo-compression bonding of GaAs with glass using SiO2 filmJAIN, A; DAYAL, S; PARASHAR, T. R et al.SPIE proceedings series. 1998, pp 165-168, isbn 0-8194-2756-X, 2VolConference Paper

Structural stabilisation of (CoO)x clusters in ZSM5 zeolitesJENTYS, A; KLEESTORFER, K; VINEK, H et al.Catalysis letters. 1996, Vol 39, Num 1-2, pp 119-124, issn 1011-372X, 5 p.Article

Dielectric behaviour of Bi-SiO cermet filmsSUJATHA, K; REDDY, P. J.Materials letters (General ed.). 1990, Vol 9, Num 2-3, pp 77-79, issn 0167-577XArticle

Photostimulated evaporation of SiO2 films by synchrotron radiationAKAZAWA, H; UTSUMI, Y; TAKAHASHI, J et al.Applied physics letters. 1990, Vol 57, Num 22, pp 2302-2304, issn 0003-6951Article

New method of synthesis of SiO2 spheres used as raw material to colloidal sol-gel synthesisJANOSZCZYK, B; WOJCIK, J; CZYZEWSKA, L et al.SPIE proceedings series. 1997, pp 6-11, isbn 0-8194-2619-9Conference Paper

Suitability of Mn-SiO2 cermet films for strain gauge applicationRAJANNA, K; SRINIVASULU, S; NAYAK, M. M et al.Journal of materials science letters. 1993, Vol 12, Num 1, pp 37-39, issn 0261-8028Article

Dielectric properties of aerogelsHRUBESH, L. W; KEENE, L. E; LATORRE, V. R et al.Journal of materials research. 1993, Vol 8, Num 7, pp 1736-1741, issn 0884-2914Article

Large-range refractive-index control of silicon monoxide antireflection coatings using oblique incident thermal evaporationWECHT, K. W.Applied optics. 1991, Vol 30, Num 28, pp 4133-4135, issn 0003-6935Article

Oxidation property of silicon small particlesOKADA, R; IIJIMA, S.Applied physics letters. 1991, Vol 58, Num 15, pp 1662-1663, issn 0003-6951Article

Angle-resolved X-ray photoelectron spectroscopy (ARXPS) and a modified Levenberg-Marquardt fit procedure : a new combination for modeling thin layersAARNINK, W. A. M; WEISHAUPT, A; VAN SILFHOUT, A et al.Applied surface science. 1990, Vol 45, Num 1, pp 37-48, issn 0169-4332Article

Physicochemical investigation of formation of SiO2 powders and films from film-forming solutionsMAL'CHIK, A. G; BORILO, L. P; KOZIK, V. V et al.Russian journal of applied chemistry. 1996, Vol 69, Num 2, pp 198-201, issn 1070-4272Article

Shape-selective copper-loaded imogolite catalystIMAMURA, S; KOKUBU, T; YAMASHITA, T et al.Journal of catalysis (Print). 1996, Vol 160, Num 1, pp 137-140, issn 0021-9517, 3 p.Article

Partial oxidation of CH4 at low pressure over SiO2 prepared from SiONO, T; KUDO, H; MARUYAMA, J et al.Catalysis letters. 1996, Vol 39, Num 1-2, pp 73-78, issn 1011-372X, 5 p.Article

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