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kw.\*:("Silicium nitrure")

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Effect of stoichiometry on mechanochemical reaction between Ti and Si3N4 powdersBYUN, Jung-Soo; SHIM, Jae-Hyeok; YOUNG WHAN CHO et al.Scripta materialia. 2004, Vol 50, Num 2, pp 279-283, issn 1359-6462, 5 p.Article

Synthesis of β-Silicon nitride by SHS: fiber growthCANO, Irene G; RODRIGUEZ, Miguel A.Scripta materialia. 2004, Vol 50, Num 3, pp 383-386, issn 1359-6462, 4 p.Article

Oxydation, fluage et fissuration lente, sous air et sous gaz brûlés, d'un nitrure de silicium élaboré par frittage naturel = Oxidation, creep and slow crack growth, in air or in exhaust gases, of a sintered silicon nitrideFournel, Bénoit; Boussuge, Michel.1991, 115 p.Thesis

Influence des condition d'élaboration sur la microstructure et les propriétés mécaniques du nitrure de silicium = The influence of processing parameters on the microstructure and mechanical properties of silicon nitrideOlagnon, Christian; Fantozzi, Gilbert.1990, 138 p.Thesis

PROPRIETES MECANIQUES DES MATERIAUX DU SYSTEME MGOSI3N4SAMSONOV GV; KAZAKOV VK; GORODETSKIJ SS et al.1973; IZVEST. AKAD. NAUK S.S.S.R., NEORG. MATER.; S.S.S.R.; DA. 1973; VOL. 9; NO 4; PP. 608-610; BIBL. 8 REF.Serial Issue

Polyimide adhesion: mechanical and surface analytical characterizationNARECHANIA, R. G; BRUCE, J. A; FRIDMANN, S. A et al.Journal of the Electrochemical Society. 1985, Vol 132, Num 11, pp 2700-2705, issn 0013-4651Article

Breakdown and conduction phenomena in MIS structuresLIM, K. J; KIM, M. N; CHAE, H. I et al.IEEE transactions on electrical insulation. 1992, Vol 27, Num 3, pp 623-628, issn 0018-9367Conference Paper

Monolithic low sideband guided-mode resonance filter based on two-layer structureHSU, Che-Lung; CHOU, Yu-Hong; WANG, Chih-Ming et al.SPIE proceedings series. 2005, pp 593116.1-593116.8, isbn 0-8194-5936-4, 1VolConference Paper

α-β phase transformation of silicon nitride : compute simulationSAJGALIK, P.Journal of materials science. 1991, Vol 26, Num 22, pp 6083-6090, issn 0022-2461Article

Application of development-free vapor photolithography in etching silicon nitrideXIAOYIN HONG; SHENGQUAN DUAN; JIANPING LU et al.SPIE proceedings series. 1998, pp 478-486, isbn 0-8194-2776-4Conference Paper

BREVET 2.124.013 (B) (7139380). A 3 NOVEMBRE 1971. PROCEDE DE FABRICATION DE PIECES CERAMIQUES ET PIECES FABRIQUEES PAR CE PROCEDEsdPatent

SILICON NITRIDE A HARD, HIGH TEMPERATURE CERAMICSVEC JJ.1973; CERAM. INDUSTRY; U.S.A.; DA. 1973; VOL. 100; NO 2; PP. 20-22Serial Issue

Processing of concentrated aqueous Si3N4 slips stabilized with tetramethylammonium hydroxideALBANO, M. P; GARRIDO, L. B.Journal of materials engineering and performance. 1999, Vol 8, Num 2, pp 184-189, issn 1059-9495Article

A novel method for determining the strength of PECVD silicon (oxy)nitride filmsOGBUJI, L. U. J. T; HARDING, D. R.Thin solid films. 1995, Vol 263, Num 2, pp 194-197, issn 0040-6090Article

Properties of silicon nitride films prepared by magnetron sputteringHIROHATA, Y; SHIMAMOTO, N; HINO, T et al.Thin solid films. 1994, Vol 253, Num 1-2, pp 425-429, issn 0040-6090Conference Paper

Deterministic micro asperities on bearings and seals using a modified LIGA processSTEPHENS, L. S; SIRIPURAM, R; HAYDEN, M et al.Journal of engineering for gas turbines and power. 2004, Vol 126, Num 1, pp 147-154, issn 0742-4795, 8 p.Conference Paper

On the nature of the paramagnetic defects in hydrogenated amorphous silicon nitrideCHEN, D. Q; VINER, J. M; TAYLOR, P. C et al.Solid state communications. 1996, Vol 98, Num 8, pp 745-750, issn 0038-1098Article

Ultrasensitive nanomechanical photonic microsensorANGULO BARRIOS, Carlos.Proceedings of SPIE, the International Society for Optical Engineering. 2007, pp 65930X.1-65930X.5, issn 0277-786X, isbn 978-0-8194-6721-8, 1VolConference Paper

Bias-dependent atomic images of a quadruplet silicon-nitride monolayer on the Si (111) surfaceMORITA, Yukinori; TOKUMOTO, Hiroshi.Surface science. 2000, Vol 466, Num 1-3, pp L802-L806, issn 0039-6028Article

Grain bridging of highly anisotropic silicon nitrideOHJI, T; KONDO, N; SUZUKI, Y et al.Materials letters (General ed.). 1999, Vol 40, Num 1, pp 5-10, issn 0167-577XArticle

Modelling the short-time response of ISFET sensorsWOIAS, P; MEIXNER, L; AMANDI, D et al.Sensors and actuators. B, Chemical. 1995, Vol 24, Num 1-3, pp 211-217, issn 0925-4005Conference Paper

Self-joining of Si3N4 using metal interlayersLEMUS-RUIZ, José; LEON-PATINO, Carlos A; DREW, Robin A. L et al.Metallurgical and materials transactions. A, Physical metallurgy and materials science. 2006, Vol 37, Num 1, pp 69-75, issn 1073-5623, 7 p.Conference Paper

Atomic scale friction and wear of micaHU, J; XIAO, X.-D; OGLETREE, D. F et al.Surface science. 1995, Vol 327, Num 3, pp 358-370, issn 0039-6028Article

Isotopic studies of oxidation of Si3N4 and Si using SIMSHONGHUA DU; HOUSER, C. A; TRESSLER, R. E et al.Journal of the Electrochemical Society. 1990, Vol 137, Num 2, pp 741-742, issn 0013-4651, 2 p.Article

Properties of isostatically hot-pressed silicon nitrideRICHERSON, D. W; WIMMER, J. M.Journal of the American Ceramic Society. 1983, Vol 66, Num 9, pp C173-C176, issn 0002-7820Article

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