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Interaction of charged particles with insulating capillary targets ― The guiding effectLEMELL, Christoph; BURGDÄRFER, Joachim; AUMAYR, Friedrich et al.Progress in surface science. 2013, Vol 88, Num 3, pp 237-278, issn 0079-6816, 42 p.Article

Absolute surface free energies of perfect low-index orientations of metals and semiconductorsBONZEL, H. P; NOWICKI, M.Physical review B. Condensed matter and materials physics. 2004, Vol 70, Num 24, pp 245430.1-245430.9, issn 1098-0121Article

Carbon nanotube/metal interface studied by cross-sectional transmission electron microscopyJIN-PHILLIPP, N. Y; RÜHLE, M.Physical review B. Condensed matter and materials physics. 2004, Vol 70, Num 24, pp 245421.1-245421.5, issn 1098-0121Article

Droplets of fine powders running uphill by vertical vibrationCABALLERO, Leonardo; MELO, Francisco.Physical review letters. 2004, Vol 93, Num 25, pp 258001.1-258001.4, issn 0031-9007Article

Reduction of Cu2O islands grown on a Cu(100) surface through vacuum annealingGUANGWEN ZHOU; YANG, Judith C.Physical review letters. 2004, Vol 93, Num 22, pp 226101.1-226101.4, issn 0031-9007Article

Temperature-dependent scattering of hyperthermal energy K+ ionsPOWERS, J; MANSON, J. R; SOSOLIK, C. E et al.Physical review B. Condensed matter and materials physics. 2004, Vol 70, Num 11, pp 115413.1-115413.8, issn 1098-0121Article

Application of the phase time and transmission coefficients to the study of transverse elastic waves in quasiperiodic systems with planar defectsAYNAOU, H; VELASCO, V. R; NOUGAOUI, A et al.Surface science. 2003, Vol 538, Num 1-2, pp 101-112, issn 0039-6028, 12 p.Article

Thin films and interfaces in microelectronics: composition and chemistry as function of depthOPILA, Robert L; ENG, Joseph JR.Progress in surface science. 2002, Vol 69, Num 4-6, pp 125-163, issn 0079-6816Article

Proceedings of the 5th European Adhesion Conference, EURADH'2000, Lyon, 18-21 September, 2000Le Vide (1995). 2000, Vol 54, Num 296, issn 1266-0167, 672 p., SUP2-4Conference Proceedings

Density-functional account of van der Waals forces between parallel surfacesANDERSSON, Y; HULT, E; APELL, P et al.Solid state communications. 1998, Vol 106, Num 5, pp 235-238, issn 0038-1098Article

Direct detection of H(D) on Si(001) and Si(111) surfaces by medium-energy recoil spectroscopyNISHIMURA, T; IKEDA, A; KOSHIKAWA, T et al.Surface science. 1998, Vol 409, Num 2, pp 183-188, issn 0039-6028Article

Rotation of a silicon dimer over the trench between dimer rows on the Si(001) surfaceGORINGE, C. M; BOWLER, D. R.Surface science. 1998, Vol 407, Num 1-3, pp L681-L686, issn 0039-6028Article

Interaction between alumina and binary glassesKUROMITSU, Y; YOSHIDA, H; TAKEBE, H et al.Journal of the American Ceramic Society. 1997, Vol 80, Num 6, pp 1583-1587, issn 0002-7820Article

Physical mechanism of hydrogen deposition from a scanning tunneling microscopy tipHUANG, D. H; YAMAMOTO, Y.Applied physics. A, Materials science & processing (Print). 1997, Vol 64, Num 4, pp 419-422, issn 0947-8396Article

STM, LEED and AES studies on the oxidation of a CrN overlayer on Fe0.8Cr0.2(100)LIN, J. S; CABIBIL, H; EKSTROM, B et al.Surface science. 1997, Vol 371, Num 2-3, pp 337-348, issn 0039-6028Article

Structure and properties of interface between dissimilar materialsECHIGOYA, J.-I; YAMAGUCHI, A.ISIJ international. 1997, Vol 37, Num 12, pp 1251-1257, issn 0915-1559Article

Energetic evidence for mixed dimer growth on the Si(001)/Ge(2 x 1) surfaceJENKINS, S. J; SRIVASTAVA, G. P.Surface science. 1997, Vol 377-79, pp 887-890, issn 0039-6028Conference Paper

Interface hydrogen between a Pb overlayer and H-saturated Si(111) studied by a resonant nuclear reactionFUKUTANI, K; IWAI, H; YAMASHITA, H et al.Surface science. 1997, Vol 377-79, pp 1010-1014, issn 0039-6028Conference Paper

Soft X-ray emission spectroscopy study of CaF2(film)/Si(111) : non-destructive buried interface analysisIWAMI, M; KUSAKA, M; HIRAI, M et al.Applied surface science. 1997, Vol 117-18, pp 434-437, issn 0169-4332Conference Paper

Thermal stability and the role of oxygen vacancy defects in strong metal support interaction : Pt on Nb-doped TiO2(100)GAO, Y; LIANG, Y; CHAMBERS, S. A et al.Surface science. 1996, Vol 365, Num 3, pp 638-648, issn 0039-6028Article

XPS analysis of Bridgman-grown CuInTe2 and of its native oxideNEUMANN, H; MAST, M; ENDERLEIN, J et al.Crystal research and technology (1979). 1996, Vol 31, Num 1, pp 75-85, issn 0232-1300Article

The interaction of Cu atoms with the Si(111)-√3 X √3 -Ag surfaceISHIKAWA, D; YUHARA, J; ISHIGAMI, R et al.Surface science. 1996, Vol 357-58, pp 432-435, issn 0039-6028Conference Paper

Tagungsband zum Seminar Angewandte Oberflächenanalytik (Dübendorf, 18 Mai 1995)Seminar Angewandte Oberflächenanalytik. 1995, 109 p.Conference Proceedings

Beilby's layers and the cause of their formationVLASOV, A. D; CHEKUNOV, E. G.Fizika i himiâ obrabotki materialov. 1994, Num 1, pp 83-88, issn 0015-3214Article

Chemical elements depth distributions in anodic aluminum oxide formed in vine-acid electroliteSURGANOV, V. F.Fizika i himiâ obrabotki materialov. 1994, Num 4-5, pp 101-105, issn 0015-3214Article

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