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Evaluation of corrosion behaviour in a 317L stainless steel strip welding using scanning Kelvin probe force microscopySATHIRACHINDA, N; WESSMAN, S; PETTERSSON, R et al.Materials and corrosion (1995). 2011, Vol 62, Num 12, pp 1092-1099, issn 0947-5117, 8 p.Article

Object size effect on the contact potential difference measured by scanning Kelvin probe methodPOLYAKOV, B; KRUTOKHVOSTOV, R; KUZMIN, A et al.EPJ. Applied physics (Print). 2010, Vol 51, Num 2, issn 1286-0042, 21201.p1-21210.p5Article

Contrast Formation in Kelvin Probe Force Microscopy of Single π-Conjugated MoleculesSCHULER, Bruno; LIU, Shi-Xia; YAN GENG et al.Nano letters (Print). 2014, Vol 14, Num 6, pp 3342-3346, issn 1530-6984, 5 p.Article

An SKP and EIS investigation of amine adsorption on zinc oxide surfacesNAZAROV, A; THIERRY, D; VOLOVITCH, P et al.Surface and interface analysis. 2011, Vol 43, Num 10, pp 1286-1298, issn 0142-2421, 13 p.Article

Work function alternation on peierls transition of K_0.3MoO₃MORIKAWA, K; SHINJO, N; HAYASHI, N et al.Journal de physique. IV. 2005, Vol 131, pp 351-353, issn 1155-4339, 3 p.Conference Paper

Delamination of organic coating on carbon steel studied by scanning Kelvin probe force microscopyTONGYAN PAN.Surface and interface analysis. 2013, Vol 45, Num 6, pp 978-984, issn 0142-2421, 7 p.Article

Scanning Kelvin probe force microscopy as a means of predicting the electrochemical characteristics of the surface of a modified AA4xxx/AA3xxx (Al alloys) brazing sheetNOROUZI AFSHAR, F; DE WIT, J. H. W; TERRYN, H et al.Electrochimica acta. 2013, Vol 88, pp 330-339, issn 0013-4686, 10 p.Article

In situ measurements of surface (photo)voltage of roll-to-roll deposited thin film silicon solar cellsVAN AKEN, Bas B; BAKKER, Klaas J; HEIJNA, Maurits C. R et al.Physica status solidi. A, Applications and materials science (Print). 2010, Vol 207, Num 3, pp 682-685, issn 1862-6300, 4 p.Conference Paper

Electrochemical soft lithography of an 1,7-octadiene monolayer covalently linked to hydrogen-terminated silicon using scanning probe microscopyLEE, S. H; ISHIZAKI, T; SAITO, N et al.Surface science. 2007, Vol 601, Num 18, pp 4206-4211, issn 0039-6028, 6 p.Conference Paper

Effect of surface geometrical configurations induced by microcracks on the electron work functionLI, W; LI, D. Y.Acta materialia. 2005, Vol 53, Num 14, pp 3871-3878, issn 1359-6454, 8 p.Article

Surface potential mapping of dispersed proteinsLAOUDJ, Dalila; GUASCH, Cathy; RENAULT, Eric et al.Analytical and bioanalytical chemistry. 2005, Vol 381, Num 7, pp 1476-1479, 4 p.Article

Local Voltage Drop in a Single Functionalized Graphene Sheet Characterized by Kelvin Probe Force MicroscopyLIANG YAN; PUNCKT, Christian; AKSAY, Ilhan A et al.Nano letters (Print). 2011, Vol 11, Num 9, pp 3543-3549, issn 1530-6984, 7 p.Article

Ion transport processes at polymer/oxide/metal interfaces under varying corrosive conditionsPOSNER, R; GIZA, G; MARAZITA, M et al.Corrosion science. 2010, Vol 52, Num 5, pp 1838-1846, issn 0010-938X, 9 p.Article

Imaging Surface Charges of Individual BiomoleculesLEUNG, Carl; KINNS, Helen; HOOGENBOOM, Bart W et al.Nano letters (Print). 2009, Vol 9, Num 7, pp 2769-2773, issn 1530-6984, 5 p.Article

Kelvin probe force microscopy for characterizing doped semiconductors for future sensor applications in nano- and biotechnologySCHMIDT, Heidemarie; HABICHT, Stefan; FESTE, Sebastian et al.Applied surface science. 2013, Vol 281, pp 24-29, issn 0169-4332, 6 p.Conference Paper

Magnetic order in graphite: Experimental evidence, intrinsic and extrinsic difficultiesESQUINAZI, P; BARZOLA-QUIQUIA, J; SPEMANN, D et al.Journal of magnetism and magnetic materials. 2010, Vol 322, Num 9-12, pp 1156-1161, issn 0304-8853, 6 p.Conference Paper

The kinetics and mechanisms of filiform corrosion on aluminium alloy AA6111MCMURRAY, H. N; HOLDER, A; WILLIAMS, G et al.Electrochimica acta. 2010, Vol 55, Num 27, pp 7843-7852, issn 0013-4686, 10 p.Conference Paper

High-resolution Kelvin probe microscopy in corrosion science : Scanning Kelvin probe force microscopy (SKPFM) versus classical scanning Kelvin probe (SKP)ROHWERDER, Michael; TURCU, Florin.Electrochimica acta. 2007, Vol 53, Num 2, pp 290-299, issn 0013-4686, 10 p.Conference Paper

Influence of surface morphology on corrosion and electronic behaviorLI, W; LI, D. Y.Acta materialia. 2006, Vol 54, Num 2, pp 445-452, issn 1359-6454, 8 p.Article

Direct determination of the hole density of states in undoped and doped amorphous organic films with high lateral resolutionTAL, O; ROSENWAKS, Y; PREEZANT, Y et al.Physical review letters. 2005, Vol 95, Num 25, pp 256405.1-256405.4, issn 0031-9007Article

Measurements of potential barrier height of grain boundaries in polycrystalline silicon by Kelvin probe force microscopyTSUREKAWA, S; KIDO, K; WATANABE, T et al.Philosophical magazine letters. 2005, Vol 85, Num 1, pp 41-49, issn 0950-0839, 9 p.Article

A simultaneous Kelvin Probe and Raman spectroscopy approach for in situ surface and interface analysisPOSNER, R; JUB, A. M; FRANKEL, G. S et al.Electrochimica acta. 2012, Vol 76, pp 34-42, issn 0013-4686, 9 p.Article

Potential profile and photovoltaic effect in nanoscale lateral pn junction observed by Kelvin probe force microscopyNOWAK, Roland; MORARU, Daniel; MIZUNO, Takeshi et al.Thin solid films. 2014, Vol 557, pp 249-253, issn 0040-6090, 5 p.Conference Paper

Scanning Kelvin probe study of photolabile silane surface modification of indium tin oxideELAINE YEE LING CHAK; PAWLOWSKA, Natalia Maria; BLASZYKOWSKI, Christophe et al.Surface and interface analysis. 2013, Vol 45, Num 9, pp 1347-1352, issn 0142-2421, 6 p.Article