kw.\*:("Sonde Kelvin")
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Noise and the Kelvin methodBAIKIE, I. D; MACKENZIE, S; ESTRUP, P. J. Z et al.Review of scientific instruments. 1991, Vol 62, Num 5, pp 1326-1332, issn 0034-6748Article
Magnetic Scanning Probe Calibration Using Graphene Hall SensorPANCHAL, Vishal; IGLESIAS-FREIRE, Oscar; LARTSEV, Arseniy et al.IEEE transactions on magnetics. 2013, Vol 49, Num 7, pp 3520-3523, issn 0018-9464, 4 p.Conference Paper
Evaluation of corrosion behaviour in a 317L stainless steel strip welding using scanning Kelvin probe force microscopySATHIRACHINDA, N; WESSMAN, S; PETTERSSON, R et al.Materials and corrosion (1995). 2011, Vol 62, Num 12, pp 1092-1099, issn 0947-5117, 8 p.Article
Object size effect on the contact potential difference measured by scanning Kelvin probe methodPOLYAKOV, B; KRUTOKHVOSTOV, R; KUZMIN, A et al.EPJ. Applied physics (Print). 2010, Vol 51, Num 2, issn 1286-0042, 21201.p1-21210.p5Article
Probing the beginning of corrosionANDERSON, Ken.Materials world. 2001, Vol 9, Num 3, pp 14-15, issn 0967-8638Article
PIEZOELECTRIC DRIVEN KELVIN PROBE FOR CONTACT POTENTIAL DIFFERENCE STUDIES.BESOCKE K; BERGER S.1976; REV. SCI. INSTRUM.; U.S.A.; DA. 1976; VOL. 47; NO 7; PP. 840-842; BIBL. 10 REF.Article
Degradation of organic coatings in a corrosive environment: a study by scanning Kelvin probe and scanning acoustic microscopeREDDY, B; SYKES, J. M.Progress in organic coatings. 2005, Vol 52, Num 4, pp 280-287, issn 0300-9440, 8 p.Conference Paper
Contrast Formation in Kelvin Probe Force Microscopy of Single π-Conjugated MoleculesSCHULER, Bruno; LIU, Shi-Xia; YAN GENG et al.Nano letters (Print). 2014, Vol 14, Num 6, pp 3342-3346, issn 1530-6984, 5 p.Article
An SKP and EIS investigation of amine adsorption on zinc oxide surfacesNAZAROV, A; THIERRY, D; VOLOVITCH, P et al.Surface and interface analysis. 2011, Vol 43, Num 10, pp 1286-1298, issn 0142-2421, 13 p.Article
Work function alternation on peierls transition of K0.3MoO3MORIKAWA, K; SHINJO, N; HAYASHI, N et al.Journal de physique. IV. 2005, Vol 131, pp 351-353, issn 1155-4339, 3 p.Conference Paper
Delamination of organic coating on carbon steel studied by scanning Kelvin probe force microscopyTONGYAN PAN.Surface and interface analysis. 2013, Vol 45, Num 6, pp 978-984, issn 0142-2421, 7 p.Article
Scanning Kelvin probe force microscopy as a means of predicting the electrochemical characteristics of the surface of a modified AA4xxx/AA3xxx (Al alloys) brazing sheetNOROUZI AFSHAR, F; DE WIT, J. H. W; TERRYN, H et al.Electrochimica acta. 2013, Vol 88, pp 330-339, issn 0013-4686, 10 p.Article
In situ measurements of surface (photo)voltage of roll-to-roll deposited thin film silicon solar cellsVAN AKEN, Bas B; BAKKER, Klaas J; HEIJNA, Maurits C. R et al.Physica status solidi. A, Applications and materials science (Print). 2010, Vol 207, Num 3, pp 682-685, issn 1862-6300, 4 p.Conference Paper
Electrochemical soft lithography of an 1,7-octadiene monolayer covalently linked to hydrogen-terminated silicon using scanning probe microscopyLEE, S. H; ISHIZAKI, T; SAITO, N et al.Surface science. 2007, Vol 601, Num 18, pp 4206-4211, issn 0039-6028, 6 p.Conference Paper
Effect of surface geometrical configurations induced by microcracks on the electron work functionLI, W; LI, D. Y.Acta materialia. 2005, Vol 53, Num 14, pp 3871-3878, issn 1359-6454, 8 p.Article
Surface potential mapping of dispersed proteinsLAOUDJ, Dalila; GUASCH, Cathy; RENAULT, Eric et al.Analytical and bioanalytical chemistry. 2005, Vol 381, Num 7, pp 1476-1479, 4 p.Article
Minimizing the effects of hardware marginality on charging damage during plasma-enhanced chemical vapor dielectric depositionCACCIATO, Antonio.Journal of the Electrochemical Society. 2001, Vol 148, Num 12, pp F207-F211, issn 0013-4651Article
Self-assembled monolayers as interfaces for organic opto-electronic devicesZUPPIROLI, L; SI-AHMED, L; KAMARAS, K et al.The European physical journal. B, Condensed matter physics. 1999, Vol 11, Num 3, pp 505-512, issn 1434-6028Article
Local Voltage Drop in a Single Functionalized Graphene Sheet Characterized by Kelvin Probe Force MicroscopyLIANG YAN; PUNCKT, Christian; AKSAY, Ilhan A et al.Nano letters (Print). 2011, Vol 11, Num 9, pp 3543-3549, issn 1530-6984, 7 p.Article
Ion transport processes at polymer/oxide/metal interfaces under varying corrosive conditionsPOSNER, R; GIZA, G; MARAZITA, M et al.Corrosion science. 2010, Vol 52, Num 5, pp 1838-1846, issn 0010-938X, 9 p.Article
Imaging Surface Charges of Individual BiomoleculesLEUNG, Carl; KINNS, Helen; HOOGENBOOM, Bart W et al.Nano letters (Print). 2009, Vol 9, Num 7, pp 2769-2773, issn 1530-6984, 5 p.Article
Measurements of electric potential in a laser diode by Kelvin Probe Force MicroscopyLEVEQUE, G; GIRARD, P; SKOURI, E et al.Applied surface science. 2000, Vol 157, Num 4, pp 251-255, issn 0169-4332Conference Paper
Force-distance studies with piezoelectric tuning forks below 4.2 KRYCHEN, J; IHN, T; STUDERUS, P et al.Applied surface science. 2000, Vol 157, Num 4, pp 290-294, issn 0169-4332Conference Paper
Kelvin probe force microscopy for characterizing doped semiconductors for future sensor applications in nano- and biotechnologySCHMIDT, Heidemarie; HABICHT, Stefan; FESTE, Sebastian et al.Applied surface science. 2013, Vol 281, pp 24-29, issn 0169-4332, 6 p.Conference Paper
Magnetic order in graphite: Experimental evidence, intrinsic and extrinsic difficultiesESQUINAZI, P; BARZOLA-QUIQUIA, J; SPEMANN, D et al.Journal of magnetism and magnetic materials. 2010, Vol 322, Num 9-12, pp 1156-1161, issn 0304-8853, 6 p.Conference Paper