A new analyzer for spin resolved electron spectroscopiesBERTACCO, R; DUO, L; ISELLA, G et al.Journal of magnetism and magnetic materials. 2001, Vol 226-30, pp 2076-2077, issn 0304-8853, 2Conference Paper

Hairpin-filament electron guns for low-energy useBOESTEN, L; OKADA, K.Measurement science & technology (Print). 2000, Vol 11, Num 5, pp 576-583, issn 0957-0233Article

Thin film properties and surface morphology of metal free phthalocyanine films grown by organic molecular beam depositionBAYLISS, S. M; HEUTZ, S; RUMBLES, G et al.PCCP. Physical chemistry chemical physics (Print). 1999, Vol 1, Num 15, pp 3673-3676, issn 1463-9076Article

An apparatus for high resolution field emission spectroscopyOSHIMA, C.Advances in colloid and interface science. 1997, Vol 71-72, pp 353-369, issn 0001-8686Article

Characterization of triazine derivatives on silicon wafers studied by photoelectron spectroscopy (XPS, UPS) and metastable impact electron spectroscopy (MIES)DIECKHOFF, S; SCHLETT, V; POSSART, W et al.Applied surface science. 1996, Vol 103, Num 3, pp 221-229, issn 0169-4332Article

Electron spectroscopy study of the Cu/SrTiO₃(100) interfaceCONARD, T; ROUSSEAU, A.-C; YU, L. M et al.Surface science. 1996, Vol 359, Num 1-3, pp 82-92, issn 0039-6028Article

Enhanced resolution of depth profiles using two-dimensional XPS dataAMINOV, K. L; JORGENSEN, J. S; BOIDEN PEDERSEN, J et al.Surface and interface analysis. 1996, Vol 24, Num 1, pp 23-27, issn 0142-2421Article

Savitzky and Golay differentiation in AESGILMORE, I. S; SEAH, M. P.Applied surface science. 1996, Vol 93, Num 3, pp 273-280, issn 0169-4332Article

Reactive and unreactive interfaces studied by means of metastable deexcitation spectroscopyPASQUALI, L; FANTINI, P; NANNARONE, S et al.Surface science. 1996, Vol 352-54, pp 383-386, issn 0039-6028Conference Paper

Delocalization in inelastic scatteringMULLER, D. A; SILCOX, J.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 195-213, issn 0304-3991Conference Paper

Interactive image-spectrum EELS: application to elemental mapping of lubricant colloidsMARTIN, J.-M; LAVERGNE, J.-L; VACHER, B et al.Microscopy microanalysis microstructures (Les Ulis). 1995, Vol 6, Num 1, pp 53-63, issn 1154-2799Conference Paper

Measurement of TEM primary energy with an electron energy-loss spectrometerMEYER, C. E; BOOTHROYD, C. B; GUBBENS, A. J et al.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 283-285, issn 0304-3991Conference Paper

The use of elastic peak spectroscopy in depth profilingMENYHARD, M; KONKOL, A; GERGELY, G et al.Vacuum. 1995, Vol 46, Num 8-10, issn 0042-207X, p. 1171Conference Paper

Properties of ultrathin silver layers deposited on the Cu(011) faceNOWICKI, M; MROZ, S.Vacuum. 1995, Vol 46, Num 5-6, pp 537-540, issn 0042-207XConference Paper

Optimisation and specification of Auger electron spectrometers for signal-to-noise ratio performanceSEAH, M. P; HUNT, C. P.Journal of electron spectroscopy and related phenomena. 1994, Vol 67, Num 1, pp 151-157, issn 0368-2048Article

Total photo-yield imaging of stripe patterns using soft X-ray microbeam formed by Wolter-type mirrorNINOMIYA, K; HASEGAWA, M.Japanese journal of applied physics. 1994, Vol 33, Num 4A, pp L550-L552, issn 0021-4922, 2Article

A through the lens reflection remoderator for positronsUHLMANN, K; BRITTON, D. T; KÖGEL, G et al.Optik (Stuttgart). 1994, Vol 98, Num 1, pp 5-10, issn 0030-4026Article

Calculations of a CHA transmission function for quantitative analysis in the constant pass energy mode. I: Point sources for AESKATO, M; SEKINE, T.Surface and interface analysis. 1994, Vol 21, Num 9, pp 606-614, issn 0142-2421Article

The interaction of Al and O atoms on W(110) studies with metastable impact electron spectroscopy (MIES) and UPSHITZKE, A; GÜNSTER, J; KOŁACZKIEWICZ, J et al.Surface science. 1994, Vol 318, Num 1-2, pp 139-150, issn 0039-6028Article

Surface and 2D magnetism with spin polarized cascade electronsSIEGMANN, H. C.Surface science. 1994, Vol 307-309, pp 1076-1086, issn 0039-6028, bConference Paper

The new perspectives in surface and interface analysisMARGARITONDO, G.Surface and interface analysis. 1994, Vol 22, Num 1-12, pp 1-8, issn 0142-2421Conference Paper

True Auger spectral shapes : a step to standard spectraGOTO, K; SAKAKIBARA, N; TAKEICHI, Y et al.Surface and interface analysis. 1994, Vol 22, Num 1-12, pp 75-78, issn 0142-2421Conference Paper

Excitation processes in collisions of inert gas ions with a Mg surfaceLACOMBE, S; GUILLEMOT, L; HUELS, M et al.Surface science. 1993, Vol 295, Num 1-2, pp L1011-L1016, issn 0039-6028Article

Scattering in electron spectrometers, diagnosis and avoidance. II: Cylindrical mirror analysersSEAH, M. P.Surface and interface analysis. 1993, Vol 20, Num 11, pp 876-890, issn 0142-2421Article

Prise en compte des effets topographiques en analyse par spectroscopie d'électrons Auger. Application à l'analyse de dispositifs submicroniques réalisés par gravure plasma = Topographical effects in scanning Auger microscopy analysis. Application to plasma etched submicronic devives analysisSagnol, Philippe; Rivory, Josette.1993, 177 p.Thesis