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X-ray Spectrometry : FUNDAMENTAL AND APPLIED REVIEWS IN ANALYTICAL CHEMISTRYTSUJI, Kouichi; NAKANO, Kazuhiko; TAKAHASHI, Yoshio et al.Analytical chemistry (Washington). 2012, Vol 84, Num 2, pp 636-668, issn 0003-2700, 33 p.Article

A new approach to pile-up modelling in PIXEMAXWELL, J. A; CAMPBELL, J. L.X-ray spectrometry. 2005, Vol 34, Num 4, pp 320-322, issn 0049-8246, 3 p.Conference Paper

European X-ray Spectrometry Conference. EXRS 2006. ConferenceLEPY, Marie-Christine; SIMIONOVICI, Alexandre.X-ray spectrometry. 2007, Vol 36, Num 1, pp 1-26, issn 0049-8246, 25 p.Conference Paper

Energy dispersive X-ray spectroscopyOIKAWA, Tetsuo.Japanese journal of tribology. 2006, Vol 51, Num 1, pp 33-38, issn 1045-7828, 6 p.Article

Novel theoretical analyses of some features of X-ray spectrometry. III: Concentration correction equations derived for scattered radiationKUCZUMOW, A.Spectrochimica acta. Part B : Atomic spectroscopy. 1988, Vol 43, Num 6-7, pp 737-742, issn 0584-8547Article

Compositional mapping with the electron probe microanalyzer. Part INEWBURY, D. E; FIORI, C. E; MARINENKO, R. B et al.Analytical chemistry (Washington, DC). 1990, Vol 62, Num 22, pp 1159A-1166A, issn 0003-2700Article

EFFECT OF ABSORPTION EDGE FILTERS ON DIAGNOSTIC X-RAY SPECTRA = EFFET DES FILTRES D'ABSORPTION AGISSANT SUR LES EXTREMITES DU SPECTRE DE RAYONNEMENT X UTILISE EN RADIODIAGNOSTICATKINS HL; FAIRCHILD RG; ROBERTSON JS et al.1975; RADIOLOGY; U.S.A.; DA. 1975; VOL. 115; NO 2; PP. 431-437; BIBL. 19 REF.Article

SPECTROMETRIC PROPERTIES OF CRYSTALS FOR X-RAY ASTRONOMY. I.BUREK AJ; BARRUS DM; BLAKE RL et al.1974; ASTROPHYS. J.; U.S.A.; DA. 1974; VOL. 191; NO 2 PART. 1; PP. 533-543; BIBL. 29 REF.Article

LINE-FOCUSING X-RAY MONOCHROMATOR FOR THE ANALYSIS OF TRACE ELEMENTS IN BIOLOGICAL SPECIMENS.ONG PS; COX HL JR.1976; MED. PHYS.; U.S.A.; DA. 1976; VOL. 3; NO 2; PP. 74-79; BIBL. 28 REF.Article

THE SPECTRA OF S XIII AND S XIV IN THE REGION 25-40 A.GOLSMITH S; OREN L; COHEN L et al.1974; ASTROPHYS. J.; U.S.A.; DA. 1974; VOL. 188; NO 1 PART. 1; PP. 197-200; BIBL. 14 REF.Article

STUDY OF SURFACE EFFECTS DURING THE MANUFACTURING OF SYNTHETIC LUBRICANTS BY APPLYING THE X-RAY DIFRACTION ANALYSISCOVIC HORVAT S; PROTIC G; BIDJIN D et al.1975; NAFTA; JUGOSL.; DA. 1975; VOL. 26; NO 7-8; PP. 429-432; ABS. ANGL. RUSSE; BIBL. 16 REF.Article

Ted Hall and the science of biological microprobe X-ray analysis : a historical perspective of methodology and biological dividendsGUPTA, B. L.Scanning microscopy. 1991, Vol 5, Num 2, pp 379-426, issn 0891-7035Article

Principles and recent developments of XANES spectroscopyDAVOLI, I; PARIS, E.European meeting on absorption spectroscopy in mineralogy. 1990, pp 205-226Conference Paper

Starch crystal transformations and their industrial importance = Transformations des cristaux d'amidon et leur importance industrielleZOBEL, H. F.Stärke. 1988, Vol 40, Num 1, pp 1-7, issn 0038-9056Conference Paper

An economical transfer vessel with detachable reactor for XPS studiesDEBIES, T. P; SCHRALL, D. M.Journal of electron spectroscopy and related phenomena. 1983, Vol 31, Num 2, pp 191-196, issn 0368-2048Article

EXAFS : a powerful probe of local structure in disordered materialsFORNASINI, P.La Chimica e l'industria (Milano). 2000, Vol 82, Num 2, pp 177-182, issn 0009-4315Article

Studies of irritant reactions on epidermis : the application of energy dispersive X-ray microanalysisLINDBERG, M.Scanning microscopy. 1991, Vol 5, Num 1, pp 229-238, issn 0891-7035Article

Enhanced Raman scattering of silver benzenethiolateTAE GEOL LEE; HAN WOONG YEOM; SE-JUNG OH et al.Chemical physics letters. 1989, Vol 163, Num 1, pp 98-104, issn 0009-2614, 7 p.Article

Vanadium K-edge X-ray absorption spectroscopy of bromoperoxidase from Ascophyllum nodosumARBER, J. M; DE BOER, E; GARNER, C. D et al.Biochemistry (Easton). 1989, Vol 28, Num 19, pp 7968-7973, issn 0006-2960, 6 p.Article

K and L X-ray emission intensities of some radionuclidesVERMA, H. R; DHARMINDER PAL.X-ray spectrometry. 1985, Vol 14, Num 1, pp 23-26, issn 0049-8246Article

Rentgenospektralni analyza silikatů na tenkych vrstvach = Analyse par spectrométrie RX des silicates en couche mince = X-ray spectral analysis of silicates in thin layersERSEPKE, Z; JAHODOVA, A; KRAJICKOVA, M et al.Silikáty. 1984, Vol 28, Num 3, pp 249-260, issn 0037-5241Article

Röntgenspektrometrische Analyse silikatischer Proben mit dem Röntgenspektrometer VRA-20 = Analyse par spectrométrie RX d'échantillons silicatés avec le spectromètre RX VRA-20 = X-ray spectrometer analysis of silicate samples with the X-ray spectrometer VRA-20LECHMANN, E.Zeitschrift für angewandte Geologie. 1984, Vol 30, Num 5, pp 257-261, issn 0044-2259Article

Characteristics of concave curved crystals for X-ray diagnostics of high-temperature plasmaMORITA, S; KADOTA, K; FUJITA, J et al.Japanese journal of applied physics. 1983, Vol 22, Num 1, pp L52-L53, issn 0021-4922Article

Enhanced spatial and spectral resolution in laser plasma spectroscopy using band-shaped implants on plane targetsGAUTHIER, J.-C; GEINDRE, J.-P; NAJMABADI, K et al.Journal of physics. D, Applied physics (Print). 1983, Vol 16, Num 10, pp 1929-1941, issn 0022-3727Article