Application of the pattern recognition method to electron spectroscopies (AES and XPS)LESIAK, B.Le Vide (1995). 1996, Vol 52, Num 279, pp 99-102, issn 1266-0167Conference Paper

Two-stage electron energy analyzer for angle-resolved photoemission spectroscopyROYER, W. A; SMITH, N. V.Review of scientific instruments. 1984, Vol 55, Num 6, pp 909-911, issn 0034-6748Article

Etude théorique du fonctionnement d'un spectromètre de rayonnement par photoionisationBUTIKOV, E. I; TUMARKIN, YA. N.Optika i spektroskopiâ. 1984, Vol 56, Num 3, pp 512-517, issn 0030-4034Article

Angle-resolving photoelectron energy analyzer: mode calculations, ray-tracing analysis and performance evaluationSTEVENS, H. A; DONOHO, A. W; TURNER, A. M et al.Journal of electron spectroscopy and related phenomena. 1983, Vol 32, Num 4, pp 327-341, issn 0368-2048Article

A simultaneous angle-resolved photoelectron spectrometerBOSCH, A; FEIL, H; SAWATZKY, G. A et al.Journal of physics. E. Scientific instruments. 1984, Vol 17, Num 12, pp 1187-1192, issn 0022-3735Article

Magnetoelectric, Raman, and XPS Properties of Pb_0.7Sr_0.3[(Fe_2/3Ce_1/3)_0.012Ti_0.988]O₃ and Pb_0.7Sr_0.3[(Fe_2/3La_1/3)_0.012Ti_0.988]O₃ NanopartidesVERMA, Kuldeep Chand; KUMAR, Manoj; KOTNALA, R. K et al.Metallurgical and materials transactions. A, Physical metallurgy and materials science. 2014, Vol 45, Num 3, pp 1409-1414, issn 1073-5623, 6 p.Article

Study of air oxidation of amorphous Zr₆₅Cu_17.5Ni₁₀Al_7.5 by X-ray photoelectron spectroscopy (XPS)DHAWAN, A; ZAPOROJTCHENKO, V; FAUPEL, F et al.Journal of materials science. 2007, Vol 42, Num 21, pp 9037-9044, issn 0022-2461, 8 p.Article

Submolecular potential profiling across organic monolayersFILIP-GRANIT, Neta; VAN DER BOOM, Milko E; YERUSHALMI, Roie et al.Nano letters (Print). 2006, Vol 6, Num 12, pp 2848-2851, issn 1530-6984, 4 p.Article

Augmentation de la sensibilité de seuil d'un spectromètre de rayonnement de photoionisation par collisionsMISHCHENKO, E. D; REBO, I. L.Optika i spektroskopiâ. 1987, Vol 62, Num 2, pp 437-440, issn 0030-4034Article

Fast optical position-sensitive detector for McPherson ESCA-36BERTRAND, P. A; KALINOWSKI, W. J; TRIBBLE, L. E et al.Review of scientific instruments. 1983, Vol 54, Num 3, pp 387-389, issn 0034-6748Article

X-RAY PHOTOELECTRON SPECTROSCOPY STUDIES OF NICKEL-OXYGEN SURFACES USING OXYGEN AND ARGON ION-BOMBARDMENTKIM KS; NINOGRAD N.1974; SURF. SCI.; NETHERL.; DA. 1974; VOL. 43; NO 2; PP. 625-643; BIBL. 1 P. 1/2Article

Metastable surface phase for Na_xC_6oSCHIESSLING, J; MARENNE, I; KJELDGAARD, L et al.Surface science. 2007, Vol 601, Num 18, pp 3933-3936, issn 0039-6028, 4 p.Conference Paper

The Material Research Society Symposium on the Spectroscopy of HeterojunctionsJournal of physics. D, Applied physics (Print). 1997, Vol 30, Num 10, pp 1411-1445, issn 0022-3727Conference Proceedings

Transition state spectroscopyNEUMARK, D. M.Science (Washington, D.C.). 1996, Vol 272, Num 5267, pp 1446-1447, issn 0036-8075Article

Influence de la méthode de soustraction du fond inélastique en XPS sur la forme des spectres et l'intensité intégrée = Effect of XPS inelastic noise soustraction method on spectrum shape and integrated intensityCARDINAUD, C.Le Vide (1995). 1996, Vol 52, Num 279, pp 96-98, issn 1266-0167Conference Paper

A novel soft X-ray source (hν = 151.6 eV) for core level and valence band photoemission spectroscopy with high surface sensitivityDUO, L; DE MICHELIS, B; FASANA, A et al.Journal of electron spectroscopy and related phenomena. 1993, Vol 62, Num 4, pp 309-316, issn 0368-2048Article

Final-state symmetry and polarization effects in angle-resolved photoemission spectroscopyHERMANSON, J.Solid state communications. 1993, Vol 88, Num 11-12, pp 1097-1099, issn 0038-1098Article

ESCA features of ligninsVARMA, A. J.Polymer testing. 1986, Vol 6, Num 1, pp 79-80, issn 0142-9418Article

Inexpensive and high-precision digital power supply and counting interface for UPS, XPS, and Auger spectrometersLICHTENBERGER, D. L; KELLOGG, G. E; KRISTOFZSKI, J. G et al.Review of scientific instruments. 1986, Vol 57, Num 9, issn 0034-6748, 2366Article

Film thicknesses determined by X-ray photoelectron spectrometryEBEL, M. F; ZUBA, G; EBEL, H et al.Spectrochimica acta. Part B : Atomic spectroscopy. 1984, Vol 39, Num 5, pp 637-647, issn 0584-8547Article

An X-ray photoelectron spectroscopic investigation of the oxidation of manganese = Etude par spectrométrie de photoélectron RX de l'oxydation du manganèseFOORD, J. S; JACKMAN, R. B; ALLEN, G. C et al.Philosophical magazine. A. Physics of condensed matter. Defects and mechanical properties. 1984, Vol 49, Num 5, pp 657-663, issn 0141-8610Article

Electron spectroscopy for chemical analysis studies on oxyligated holmium compoundsMILLIGAN, W. O; MULLICA, D. F; PERKINS, H. O et al.Journal of physical chemistry (1952). 1983, Vol 87, Num 26, pp 5411-5417, issn 0022-3654Article

Electronic structure of palladium = Structure électronique du palladiumBORDOLOI, A. K; AULUCK, S.Physical review. B, Condensed matter. 1983, Vol 27, Num 8, pp 5116-5118, issn 0163-1829Article

A study of electrochemically treated PAN based carbon fibres by IGC and XPSLINDSAY, Beatrice; ABEL, Marie-Laure; WATTS, John F et al.Carbon (New York, NY). 2007, Vol 45, Num 12, pp 2433-2444, issn 0008-6223, 12 p.Article

Work function of carbon nanotubesSHIRAISHI, Masashi; ATA, Masafumi.Carbon (New York, NY). 2001, Vol 39, Num 12, pp 1913-1917, issn 0008-6223Article