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In vitro characterization of optical property of mouse myoblast cells by spectroscopic ellipsometryYANG, S. M; CHOI, S. J; KIM, H. S et al.Thin solid films. 2014, Vol 571, pp 468-472, issn 0040-6090, 5 p., 3Conference Paper

Systematic combination of X-ray reflectometry and spectroscopic ellipsometry: A powerful technique for reliable in-fab metrologyNOLOT, E; ANDRE, A.Thin solid films. 2011, Vol 519, Num 9, pp 2782-2786, issn 0040-6090, 5 p.Conference Paper

Optical properties of hybrid polymers as barrier materialsGEORGIOU, D; LASKARAKIS, A; LOGOTHETIDIS, S et al.Applied surface science. 2009, Vol 255, Num 18, pp 8023-8029, issn 0169-4332, 7 p.Article

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Spectroscopic ellipsometry (SE) studies on vacuum-evaporated ZnSe thin filmsVENKATACHALAM, S; SOUNDARARAJAN, D; PERANANTHAM, P et al.Materials characterization. 2007, Vol 58, Num 8-9, pp 715-720, issn 1044-5803, 6 p.Conference Paper

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L'ellipsométrie spectroscopique = On spectroscopic ellipsometryCASTELLON, Bernard.Photoniques (Orsay). 2002, Num 7, pp 56-59, issn 1629-4475Article

Proper choice of the error function in modeling spectroellipsometric dataKIM, S. Y; VEDAM, K.Applied optics. 1986, Vol 25, Num 12, pp 2013-2021, issn 0003-6935Article

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Ellipsometric study of near band gap optical properties of Sr_xBa_1―xNb₂O₆ crystalsDORYWALSKI, K; ANDRIYEVSKY, B; COBET, C et al.Optical materials (Amsterdam). 2013, Vol 35, Num 5, pp 887-892, issn 0925-3467, 6 p.Article

Optical and structural properties of hydrogenated silicon films prepared by rf-magnetron sputtering at low growth temperatures: Study as function of argon gas dilutionBOUIZEM, Y; KEFIF, K; SIB, J. D et al.Journal of non-crystalline solids. 2012, Vol 358, Num 4, pp 854-859, issn 0022-3093, 6 p.Article

Optical characterization of nanoporous GaN by spectroscopic ellipsometryLEE, Jeong-Hae; LEE, Baro; KANG, Jin-Ho et al.Thin solid films. 2012, Vol 525, pp 84-87, issn 0040-6090, 4 p.Article