Study of the interaction of highly charged ions with SiO₂ surfacePENG, H. B; CHENG, R; YANG, X. Y et al.Surface & coatings technology. 2009, Vol 203, Num 17-18, pp 2387-2389, issn 0257-8972, 3 p.Conference Paper

Structural, optical and electrical characterization of ITO, ITO/Ag and ITO/Ni transparent conductive electrodesAHMAD HADI ALI; SHUHAIMI, Ahmad; HASSAN, Zainuriah et al.Applied surface science. 2014, Vol 288, pp 599-603, issn 0169-4332, 5 p.Article

An investigation of an industrial coating environment with planar probe technologyCOOKE, K. E; GOODYEAR, A; HAMPSHIRE, J et al.Surface & coatings technology. 2004, Vol 188-89, pp 750-755, issn 0257-8972, 6 p.Conference Paper

Investigation on fabricating continuous vivid sharkskin surface by bio-replicated rolling methodLUO YUEHAO; ZHANG DEYUAN.Applied surface science. 2013, Vol 282, pp 370-375, issn 0169-4332, 6 p.Article

Formation of Si_m⁺ and Si_mC_n⁺ clusters by C₆₀⁺ sputtering of SiLYON, Ian; HENKEL, Torsten; ROST, Detlef et al.Applied surface science. 2010, Vol 256, Num 21, pp 6480-6487, issn 0169-4332, 8 p.Article

Magnetic null discharge sputtering with full target erosionSUNG, Youl-Moon.Surface & coatings technology. 2005, Vol 193, Num 1-3, pp 123-128, issn 0257-8972, 6 p.Conference Paper

Ionization enhancement of zirconium atoms in inductively coupled dischargeNAKAMURA, Keiji; YOSHINAGA, Hiroaki; YUKIMURA, Ken et al.Surface & coatings technology. 2005, Vol 196, Num 1-3, pp 188-191, issn 0257-8972, 4 p.Conference Paper

GaN-core/SiO_x-sheath nanowiresHYOUN WOO KIM; JONG WOO LEE; HYO SUNG KIM et al.Surface & coatings technology. 2008, Vol 203, Num 5-7, pp 666-669, issn 0257-8972, 4 p.Conference Paper

SiC nanotubes arrays fabricated by sputtering using electrospun PVP nanofiber as templatesJINYUAN ZHOU; MING ZHOU; ZHIYONG CHEN et al.Surface & coatings technology. 2009, Vol 203, Num 20-21, pp 3219-3223, issn 0257-8972, 5 p.Article

Improved optoelectronics properties of ITO-based transparent conductive electrodes with the insertion of Ag/Ni under-layerAHMAD HADI ALI; AHMAD SHUHAIMI ABU BAKAR; HASSAN, Zainuriah et al.Applied surface science. 2014, Vol 315, pp 387-391, issn 0169-4332, 5 p.Article

Ag- and Cu-doped multifunctional bioactive nanostructured TiCaPCON filmsSHTANSKY, D. V; BATENINA, I. V; KIRYUKHANTSEV-KORNEEV, Ph. V et al.Applied surface science. 2013, Vol 285, pp 331-343, issn 0169-4332, 13 p., bArticle

Comparative study of the influence of two distinct sulfurization ramping rates on the properties of Cu₂ZnSnS₄ thin filmsJIE GE; YUNHUA WU; CHUANJUN ZHANG et al.Applied surface science. 2012, Vol 258, Num 19, pp 7250-7254, issn 0169-4332, 5 p.Article

Recollections of fifty years with splutteringSIGMUND, Peter.Thin solid films. 2012, Vol 520, Num 19, pp 6031-6049, issn 0040-6090, 19 p.Article

Ti_1-xAg_x electrodes deposited on polymer based sensorsMARQUES, S. M; MANNINEN, N. K; FERDOV, Stanislav et al.Applied surface science. 2014, Vol 317, pp 490-495, issn 0169-4332, 6 p.Article

Microstructural revolution of CIGS thin film using CuInGa ternary target during sputtering processLIAO, Kuang-Hsiang; SU, Cherng-Yuh; DING, Yu-Ting et al.Applied surface science. 2012, Vol 263, pp 476-480, issn 0169-4332, 5 p.Article

The sputtering properties of artificial polymorphic AB binary compound crystalsKAROLEWSKI, M. A.Applied surface science. 2011, Vol 257, Num 21, pp 8864-8870, issn 0169-4332, 7 p.Article

Attachment limited versus diffusion limited nucleation of organic molecules: Hexaphenyl on sputter-modified micaTUMBEK, L; WINKLER, A.Surface science. 2012, Vol 606, Num 15-16, issn 0039-6028, L55-L58Article

Influence of sputtering power on composition, structure and electrical properties of RF sputtered CuIn_1―xGa_xSe₂ thin filmsZHOU YU; CHUANPENG YAN; TAO HUANG et al.Applied surface science. 2012, Vol 258, Num 13, pp 5222-5229, issn 0169-4332, 8 p.Article

Effects of the thickness of the channel layer on the device performance of InGaZnO thin-film-transistorsWOO, C. H; KIM, Y. Y; KONG, B. H et al.Surface & coatings technology. 2010, Vol 205, issn 0257-8972, S168-S171, SUP1Conference Paper

High-intensity Si cluster ion emission from a silicon target bombarded with large Ar cluster ionsNINOMIYA, Satoshi; AOKI, Takaaki; SEKI, Toshio et al.Applied surface science. 2006, Vol 252, Num 19, pp 6550-6553, issn 0169-4332, 4 p.Conference Paper

Secondary ion measurements for oxygen cluster ion SIMSNINOMIYA, Satoshi; AOKI, Takaaki; SEKI, Toshio et al.Applied surface science. 2006, Vol 252, Num 19, pp 7290-7292, issn 0169-4332, 3 p.Conference Paper

Effect of post-sulfurization on the composition, structure and optical properties of Cu₂ZnSnS₄ thin films deposited by sputtering from a single quaternary targetJUN HE; LIN SUN; KEZHI ZHANG et al.Applied surface science. 2013, Vol 264, pp 133-138, issn 0169-4332, 6 p.Article

Diffusion barrier performance of TiVCr alloy film in Cu metallizationTSAI, Du-Cheng; HUANG, Yen-Lin; LIN, Sheng-Ru et al.Applied surface science. 2011, Vol 257, Num 11, pp 4923-4927, issn 0169-4332, 5 p.Article

Bombardment induced surface chemistry on Si under keV C₆₀impactKRANTZMAN, Kristin D; KINGSBURY, David B; GARRISON, Barbara J et al.Applied surface science. 2006, Vol 252, Num 19, pp 6463-6465, issn 0169-4332, 3 p.Conference Paper

Detection of sputtered molecular doubly charged anions: a comparison of secondary-ion mass spectrometry (SIMS) and accelerator mass spectrometry (AMS)GNASER, Hubert; GOLSER, Robin; KUTSCHERA, Walter et al.Applied surface science. 2004, Vol 231-32, pp 117-121, issn 0169-4332, 5 p.Conference Paper