Structures in irrational singular interfacesZHANG, W.-Z; QIU, D; YANG, X.-P et al.Metallurgical and materials transactions. A, Physical metallurgy and materials science. 2006, Vol 37, Num 3A, pp 911-927, issn 1073-5623, 17 p.Conference Paper

Si/Cu interface structure and adhesionWANG, Xiao-Gang; SMITH, John R.Physical review letters. 2005, Vol 95, Num 15, pp 156102.1-156102.4, issn 0031-9007Article

Proceedings of the Session on Surface Science of the 4th Vacuum and Surface Sciences Conference of Asia and AustraliaOURA, Kenjiro; ARAKAWA, Ichiro; FUKUTANI, Katsuyuki et al.Applied surface science. 2009, Vol 256, Num 4, issn 0169-4332, 345 p.Conference Proceedings

Surfaces and interfaces in materialsMISRA, R. D. K.Surface and interface analysis. 2001, Vol 31, Num 7, issn 0142-2421, 205 p.Serial Issue

Quasiperiodic interfaces and tilt boundaries of finite extentOVID'KO, I. A.Materials science & engineering. A, Structural materials : properties, microstructure and processing. 2000, Vol 280, Num 2, pp 354-357, issn 0921-5093Article

Thermodynamics of interfacial segregation in solute dragLIU, Z.-K; AGREN, J; SUEHIRO, M et al.Materials science & engineering. A, Structural materials : properties, microstructure and processing. 1998, Vol 247, Num 1-2, pp 222-228, issn 0921-5093Article

Electronic properties of the Ag/Ge (111) interfaceWELTERING, H. H; CARPINELLI, J. M.Surface science. 1997, Vol 384, Num 1-3, pp 240-253, issn 0039-6028Article

The motion of interfaces and the similarity dimensionTOYOKI, H; HONDA, K.Physics letters. A. 1985, Vol 111, Num 7, pp 367-368, issn 0375-9601Article

Interfacial microstructure of anodic-bonded Al/glassXING QINGFENG; SASAKI, G; FUKUNAGA, H et al.Journal of materials science. Materials in electronics. 2002, Vol 13, Num 2, pp 83-88, issn 0957-4522Article

Asia-Pacific Surface and Interface Analysis Conference, Beijing, China, 23-26 October 2000WATTS, J. F; XUE, Q.Surface and interface analysis. 2001, Vol 32, Num 1, issn 0142-2421, 317 p.Conference Proceedings

Correlation between the magnetoresistance ratio and the interface structure investigated by ⁵⁹Co NMRSAITO, Y; INOMATA, K; GOTO, A et al.Journal of magnetism and magnetic materials. 1993, Vol 126, Num 1-3, pp 466-469, issn 0304-8853Conference Paper

Heteroepitaxy of cubic GaNTRAMPERT, A; BRANDT, O; YANG, H et al.Journal de physique. III (Print). 1997, Vol 7, Num 12, pp 2309-2316, issn 1155-4320Conference Paper

Influence of interface structure on transversal electron transportBRAGINSKY, L; SHKLOVER, V.Solid state communications. 1998, Vol 105, Num 11, pp 701-704, issn 0038-1098Article

Structure on an adsorbed dimyristoylphosphatidylcholine bilayer measured with specular reflection of neutronsJOHNSON, J. J; BAYERL, T. M; MCDERMONT, D. C et al.Biophysical journal. 1991, Vol 59, Num 2, pp 289-294, issn 0006-3495Article

High resolution microstructure characterization of the interface between cold sprayed Al coating and Mg alloy substrateQIANG WANG; DONG QIU; YUMING XIONG et al.Applied surface science. 2014, Vol 289, pp 366-369, issn 0169-4332, 4 p.Article

Interfacial mixing in as-deposited Si/Ni/Si layers analyzed by x-ray and polarized neutron reflectometryBHATTACHARYA, Debarati; BASU, Saibal; SINGH, Surendra et al.Applied surface science. 2012, Vol 263, pp 666-670, issn 0169-4332, 5 p.Article

Interface and electronic characterization of thin epitaxial Co₃O₄ filmsVAZ, C. A. F; WANG, H.-Q; ZHU, Y et al.Surface science. 2009, Vol 603, Num 2, pp 291-297, issn 0039-6028, 7 p.Article

Polymer density around a sphereTUINIER, R; LEKKERKERKER, H. N. W.Macromolecules. 2002, Vol 35, Num 8, pp 3312-3313, issn 0024-9297Article

Energy level alignment and band bending at TPD/metal interfaces studied by Kelvin probe methodHAYASHI, N; ITO, E; ISHII, H et al.Synthetic metals. 2001, Vol 121, Num 1-3, pp 1717-1718, issn 0379-6779Conference Paper

Interface shape effects on reducing the residual stress for a ceramic-metal joined materialNAGASAWA, S; FUKUZAWA, Y; TAKAHASHI, H et al.Advances in science and technology. 1999, pp C1129-C1133, isbn 88-86538-14-6, 5VolConference Paper

Optical model of excitons in a quantum well with randomly rough interfacesKOSOBUKIN, V. A.Solid state communications. 1998, Vol 108, Num 2, pp 83-87, issn 0038-1098Article

Growth and doping of cubic GaN films for optoelectronic devicesPLOOG, K. H; BRANDT, O; YANG, B et al.SPIE proceedings series. 1998, pp 20-29, isbn 0-8194-2722-5, 2VolConference Paper

Differences between silicon oxycarbide regions at SiC-SiO₂ prepared by plasma-assisted oxidation and thermal oxidationsLUCOVSKY, G; NIIMI, H; GÖLZ, A et al.Applied surface science. 1998, Vol 123-24, pp 435-439, issn 0169-4332Conference Paper

X-ray studies of the thickness and roughness of thin adsorbed fluid layersPERSHAN, P. S.Berichte der Bunsen-Gesellschaft. 1994, Vol 98, Num 3, pp 372-375, issn 0940-483XConference Paper

The role of electron microscopy in the study of adhesion to aluminium substratesBISHOPP, J. A; THOMPSON, G. E.Surface and interface analysis. 1993, Vol 20, Num 5, pp 485-494, issn 0142-2421Conference Paper