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Results 1 to 25 of 791

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Deep trench etching in macroporous siliconGEPPERT, T; SCHWEIZER, S. L; GÖSELE, U et al.Applied physics. A, Materials science & processing (Print). 2006, Vol 84, Num 3, pp 237-242, issn 0947-8396, 6 p.Article

Galactosylated poly(N-isopropylacrylamide) hydrogel submicrometer particles for specific cellular uptake within hepatocytesSEUNG HO CHOI; JUN JIN YOON; TAE GWAN PARK et al.Journal of colloid and interface science. 2002, Vol 251, Num 1, pp 57-63, issn 0021-9797Article

Video microscope with submicrometer resolutionMECHELS, S; YOUNG, M.Applied optics. 1991, Vol 30, Num 16, pp 2202-2211, issn 0003-6935, 10 p.Article

Application of an x-ray stepper for subquarter micrometer fabricationYONG CHEN; HAGHIRI-GOSNET, A. M; DECANINI, D et al.Journal of vacuum science & technology. B. Microelectronics and nanometer structures. Processing, measurement and phenomena. 1992, Vol 10, Num 6, pp 3243-3247, issn 1071-1023Conference Paper

Mounting an individual submicrometer sized single crystalNEDER, R. B; BURGHAMMER, M; GRASL, T et al.Zeitschrift für Kristallographie. 1996, Vol 211, Num 6, pp 365-367, issn 0044-2968Article

Low voltage alternative for electron beam lithographyLEE, Y.-H; BROWNING, R; MALUF, N et al.Journal of vacuum science & technology. B. Microelectronics and nanometer structures. Processing, measurement and phenomena. 1992, Vol 10, Num 6, pp 3094-3098, issn 1071-1023Conference Paper

Successful definition of nanowire and porous Si regions of different porosity levels by regular positive photoresist using metal-assisted chemical etchingZAHEDINEJAD, Mohammad; KHAJE, Mahdi; ERFANIAN, Alireza et al.Journal of micromechanics and microengineering (Print). 2011, Vol 21, Num 6, issn 0960-1317, 065006.1-065006.8Article

Submicrometer displacement sensing using inner-product multimode fiber speckle fieldsYU, F. T. S; WEN, M; YIN, S et al.Applied optics. 1993, Vol 32, Num 25, pp 4685-4689, issn 0003-6935Article

Distant detection of submicrometre displacements and vibrations using laser diode module and fibre opticsELISEEV, P. G; TSOTSORIA, M. V.Soviet lightwave communications. 1991, Vol 1, Num 2, pp 147-154Article

Submicrosecond characteristics of lightning return-stroke currentsLETEINTURIER, C; HAMELIN, J. H; EYBERT-BERARD, A et al.IEEE transactions on electromagnetic compatibility. 1991, Vol 33, Num 4, pp 351-357, issn 0018-9375Article

Strength of submicrometer diameter pillars of metallic glasses investigated with in situ transmission electron microscopyCHEN, C. Q; PEI, Y. T; DE HOSSON, J. Th. M et al.Philosophical magazine letters. 2009, Vol 89, Num 10, pp 633-640, issn 0950-0839, 8 p.Article

Operation of submicrometre lateral bipolar transistors down to 10KJAYADEV, T. S; WOO, J. C. S; VERDONCKT-VANDEBROEK, S et al.Electronics Letters. 1991, Vol 27, Num 11, pp 998-1000, issn 0013-5194Article

Quantum interference effects in semiconductors : a bibliographyGAYLORD, T. K; GLYTSIS, E. N; HENDERSON, G. N et al.Proceedings of the IEEE. 1991, Vol 79, Num 8, pp 1159-1180, issn 0018-9219Article

Preparation of chitosan microfibres using electro-wet-spinning and their electroactuation propertiesCHANG KEE LEE; SEON JEONG KIM; KIM, Sun I et al.Smart materials and structures. 2006, Vol 15, Num 2, pp 607-611, issn 0964-1726, 5 p.Article

Optique submicronique : une nouvelle perspective pour l'optique intégrée = Submicronic opticDEREUX, A.Journées nationales de microélectronique et optoélectronique. 1999, 2Vol, 5 p.Conference Paper

A laser-interference microscopy for sub-micron scalingYAMANISHI, Y; TAMURA, K; SHIMIZU, K et al.Chemical and pharmaceutical bulletin. 1994, Vol 42, Num 7, pp 1534-1535, issn 0009-2363Article

Submicron particle removal using ultrasonic cleaningKASHKOUSH, I; BUSNAINA, A.Particulate science and technology. 1993, Vol 11, Num 1-2, pp 11-24, issn 0272-6351Conference Paper

Properties of the Nb thin-film nanobridges prepared by nanometer fabrication processHARADA, Y; HIROSE, N; UZAWA, Y et al.Japanese journal of applied physics. 1991, Vol 30, Num 12B, pp 3933-3937, issn 0021-4922, 1Article

Electron beam irradiation of porous silicon for application in micromachining and sensingBORINI, S; ROCCHIA, M; ROSSI, A. M et al.Physica status solidi. A. Applied research. 2005, Vol 202, Num 8, pp 1648-1652, issn 0031-8965, 5 p.Article

Submicrometer period silicon diffraction gratings by porous etchingNAGY, N; VOLK, J; HAMORI, A et al.Physica status solidi. A. Applied research. 2005, Vol 202, Num 8, pp 1639-1643, issn 0031-8965, 5 p.Conference Paper

Resist development mechanism study : its effect on the submicron microlithography process windowCHANG-MING DAI; HWANG-KUEN LIN; HAO-TIEN LEE, D et al.Japanese journal of applied physics. 1994, Vol 33, Num 12B, pp 7001-7004, issn 0021-4922, 1Article

A high-accuracy alignment technique using single- and double-pitch dual gratingsUNE, A; TAKEUCHI, N; TORII, Y et al.Journal of vacuum science and technology. B. Microelectronics processing and phenomena. 1990, Vol 8, Num 1, pp 51-56, issn 0734-211X, 6 p.Article

Submicrometer lithography using lensless high-efficiency holographic systemsCHEN, R. T; SADOVNIK, L; AYE, T. M et al.Optics letters. 1990, Vol 15, Num 15, pp 869-871, issn 0146-9592, 3 p.Article

Three-dimensional microfabrication by two-photon lithographyDA YANG; JHAVERI, Shalin J; OBER, Christopher K et al.MRS bulletin. 2005, Vol 30, Num 12, pp 976-982, issn 0883-7694, 7 p.Article

Magnetization reversal of submicrometer Co rings with uniaxial anisotropy via scanning magnetoresistance microscopyXIAOYONG LIU; MAZUMDAR, D; SCHRAG, B. D et al.Physical review B. Condensed matter and materials physics. 2004, Vol 70, Num 1, pp 014407.1-014407.5, issn 1098-0121Article

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