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Results 1 to 25 of 950

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Electrical properties of thin yttria-stabilized zirconia overlayers produced by atomic layer deposition for solid oxide fuel cell applicationsBRAHIM, C; RINGUEDE, A; CASSIR, M et al.Applied surface science. 2007, Vol 253, Num 8, pp 3962-3968, issn 0169-4332, 7 p.Article

Effect of Al overlayers on the magnetic properties of Fe thin filmsFERMIN, J. R; AZEVEDO, A; DE AGUIAR, F. M et al.Journal of magnetism and magnetic materials. 2001, Vol 226-30, pp 1621-1623, issn 0304-8853, 2Conference Paper

The effect of germanium overlayers on the magnetization of chromium filmsSCHRÖDER, K; NAYAK, S.Physica status solidi. B. Basic research. 1992, Vol 172, Num 2, pp 679-686, issn 0370-1972Article

Surface modification of platinum by titanium dioxide overlayers: abstractDWYER, D. J; CAMERON, S. D; GLAND, J. L et al.Preprints - American Chemical Society. Division of Petroleum Chemistry. 1985, Vol 30, Num 1, issn 0569-3799, 136Article

Electroluminescence from deuterium terminated porous siliconMATSUMOTO, T; MASUMOTO, Y; NAKAGAWA, T et al.Japanese journal of applied physics. 1997, Vol 36, Num 8B, pp L1089-L1091, issn 0021-4922, 2Article

Sulphur overlayers on the Au(110) surface : LEED and TPD studyKRASNIKOV, Sergey A; HUGHES, Greg; CAFOLLA, Attilio A et al.Surface science. 2007, Vol 601, Num 16, pp 3506-3511, issn 0039-6028, 6 p.Article

Force measurements on hydrophobized silica surfaces by using AFMHÜTTL, G; HEGER, K; KLEMM, V et al.Fresenius' journal of analytical chemistry. 1999, Vol 363, Num 2, pp 206-208, issn 0937-0633Article

Inverse photoemission studies of two quasi-one-dimensional overlayer systemsHILL, I. G; MCLEAN, A. B.Applied surface science. 1998, Vol 123-24, pp 371-375, issn 0169-4332Conference Paper

Structure and stability of acrolein and allyl alcohol networks on Ag(111) from density functional theory based calculations with dispersion correctionsFERULLO, Ricardo M; BRANDA, Maria Marta; ILLAS, Francesc et al.Surface science. 2013, Vol 617, pp 175-182, issn 0039-6028, 8 p.Article

Structural evolution of sulfur overlayers on Pd(111)MILLER, James B; GELLMAN, Andrew J.Surface science. 2009, Vol 603, Num 13, issn 0039-6028, L82-L85Article

Metastable magnetic configurations of (V, Cr, Mn and Fe) on Ir(001) surfacesHAMAD, B. A; KHALIFEH, J. M; DEMANGEAT, C et al.Surface science. 2007, Vol 601, Num 2, pp 346-351, issn 0039-6028, 6 p.Article

A structural study of disordered sulfur overlayers on Cu(111)ROUSSEAU, G. B. D; MULLIGAN, A; BOVET, N et al.Surface science. 2006, Vol 600, Num 4, pp 897-903, issn 0039-6028, 7 p.Article

Improved capping layers for suppression of ambient ageing in porous siliconGIADDUI, T; EARWAKER, L. G; FORCEY, K. S et al.Journal of physics. D, Applied physics (Print). 1998, Vol 31, Num 10, pp 1131-1136, issn 0022-3727Article

Structure of electrodeposited Tl overlayers on Au(100) studied via surface X-ray scatteringWANG, J. X; ADZIC, R. R; MAGNUSSEN, O. M et al.Surface science. 1995, Vol 335, Num 1-3, pp 120-128, issn 0039-6028Conference Paper

Unusual low resistivities of sub-nm thick Cr overlayers on Ge substratesSCHRODER, K; LE ZHANG.Physica status solidi. B. Basic research. 1994, Vol 183, Num 1, pp K5-K8, issn 0370-1972Article

Growth of cobalt overlayers onto Si(100)BENITEZ, G; CARELLI, J. L; HERAS, J. M et al.Surface and interface analysis. 1994, Vol 22, Num 1-12, pp 214-217, issn 0142-2421Conference Paper

Quantum-size Au structures on Si(111) studied by spectroscopic ellipsometryO'MAHONY, J. D; MCGILP, J. F; MUSTERS, P. A. M et al.Surface science. 1996, Vol 365, Num 3, pp 801-806, issn 0039-6028Article

Oxide-thickness dependence of second harmonic generation from thick thermal oxides on Si(111)VAN HASSELT, C. W; MATEMAN, E; DEVILLERS, M. A. C et al.Surface science. 1995, Vol 331-333, pp 1367-1371, issn 0039-6028, bConference Paper

Application of Cr Kα X-ray photoelectron spectroscopy system to overlayer thickness determinationKOBATA, Masaaki; PIS, Igor; NOHIRA, Hiroshi et al.Surface and interface analysis. 2011, Vol 43, Num 13, pp 1632-1635, issn 0142-2421, 4 p.Article

Experimental confirmation of the EPES sampling depth paradox for overlayer/substrate systemsVOS, M; WENT, M. R.Surface science. 2007, Vol 601, Num 6, pp 1536-1543, issn 0039-6028, 8 p.Article

Quantum stability of ultrathin metal overlayers on semiconductor substratesZHENYU ZHANG.Surface science. 2004, Vol 571, Num 1-3, pp 1-4, issn 0039-6028, 4 p.Article

Next generation ceramic multilayer systemsBACHER, R. J; WANG, Y. L; SKURSKI, M. A et al.SPIE proceedings series. 2000, pp 202-207, isbn 0-930815-62-9Conference Paper

Growth of the Ge overlayer on Si(100)-(2 x 1)PI, T.-W; WU, R.-T; OUYANG, C.-P et al.Surface science. 2000, Vol 461, Num 1-3, pp L565-L569, issn 0039-6028Article

Charge correction of the binding energy scale in XPS analysis of polymers using surface deposition of PDMSBURRELL, M. C; CHERA, J. J.Surface and interface analysis. 1999, Vol 27, Num 9, pp 811-815, issn 0142-2421Article

Determination of thermal diffusivity in diathermic materials by the laser-flash techniqueHOFMANN, R; HAHN, O; RAETHER, F et al.High Temperatures. High Pressures (Print). 1997, Vol 29, Num 6, pp 703-710, issn 0018-1544Article

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