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Results 1 to 25 of 437

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On the cleaning of monocrystalline metallic samples from impuritiesARABCZYK, W; NARKIEWICZ, U.Applied surface science. 2005, Vol 252, Num 1, pp 98-103, issn 0169-4332, 6 p.Conference Paper

Optical systems degradation, contamination and stray light (effects, measurements, and control II)Uy, O. Manuel.Proceedings of SPIE, the International Society for Optical Engineering. 2006, issn 0277-786X, isbn 0-8194-6370-1, 1Vol, various pagings, isbn 0-8194-6370-1Conference Proceedings

Study of the surface contamination of copper with the improved positron annihilation-induced Auger electron spectrometer at NEPOMUCMAYER, J; HUGENSCHMIDT, C; SCHRECKENBACH, K et al.Applied surface science. 2008, Vol 255, Num 1, pp 220-222, issn 0169-4332, 3 p.Article

High frequency eddy current device for near surface material characterizationsHILLMANN, S; HEUER, H; MEYENDORF, N et al.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7293, issn 0277-786X, isbn 978-0-8194-7553-4 0-8194-7553-X, 1Vol, 72930S.1-72930S.9Conference Paper

Modeling particle distributions for stray light analysisFLEMING, John; MATHESON, Bruce; DITTMAN, Michael G et al.Proceedings of SPIE, the International Society for Optical Engineering. 2006, pp 62910T.1-62910T.8, issn 0277-786X, isbn 0-8194-6370-1, 1VolConference Paper

Formation of contaminant droplets on surfacesLUEY, Kenneth T; COLEMAN, Dianne J.Proceedings of SPIE, the International Society for Optical Engineering. 2006, pp 62910G.1-62910G.13, issn 0277-786X, isbn 0-8194-6370-1, 1VolConference Paper

A numerical evaluation of the correlation of surface cleanliness level and percent area coveragePERRY, Radford L.Proceedings of SPIE, the International Society for Optical Engineering. 2006, pp 62910L.1-62910L.8, issn 0277-786X, isbn 0-8194-6370-1, 1VolConference Paper

Contamination of surfaces : origin, detection and effect on adhesionDAVIS, G. D.Surface and interface analysis. 1993, Vol 20, Num 5, pp 368-372, issn 0142-2421Conference Paper

Stray light in packaged detectorsWATERS, D. M; BLOUKE, M. M; HARWIT, A et al.Proceedings of SPIE, the International Society for Optical Engineering. 2006, pp 62910U.1-62910U.8, issn 0277-786X, isbn 0-8194-6370-1, 1VolConference Paper

Effect of RCA cleaning on the surface chemistry of glass and polysilicon films as studied by ToF-SIMS and XPSONYIRIUKA, E. C; MOORE, C. B; FEHLNER, F. P et al.Surface and interface analysis. 1998, Vol 26, Num 4, pp 270-277, issn 0142-2421Article

Determination of 2,4,6-trinitrotoluene surface contamination on M107 artillery projectiles and sampling method evaluationGROSSMAN, S.Proceedings of SPIE, the International Society for Optical Engineering. 2005, issn 0277-786X, isbn 0-8194-5779-5, 2Vol, vol 2, 717-723Conference Paper

Interaction of vacuum ultraviolet radiation with molecular depositsALBYN, K; BURNS, H. D.Proceedings of SPIE, the International Society for Optical Engineering. 2006, pp 62910H.1-62910H.15, issn 0277-786X, isbn 0-8194-6370-1, 1VolConference Paper

Potential biofouling of spacecraft propellant systems due to contaminated deionized waterHOGUE, Patrick.Proceedings of SPIE, the International Society for Optical Engineering. 2006, pp 62910N.1-62910N.8, issn 0277-786X, isbn 0-8194-6370-1, 1VolConference Paper

Contamination control of space based laser instrumentsCHEN, Philip; HEDGELAND, Randy; RAMSEY, Larry et al.Proceedings of SPIE, the International Society for Optical Engineering. 2006, pp 629104.1-629104.12, issn 0277-786X, isbn 0-8194-6370-1, 1VolConference Paper

Particle deposition in confined vesselsLESNIEWSKI, Thomas K.Proceedings of SPIE, the International Society for Optical Engineering. 2006, pp 62910M.1-62910M.12, issn 0277-786X, isbn 0-8194-6370-1, 1VolConference Paper

GOES-12 Molecular ContaminationSANDERS, Jack; ROSECRANS, Glenn.Proceedings of SPIE, the International Society for Optical Engineering. 2006, pp 62910E.1-62910E.9, issn 0277-786X, isbn 0-8194-6370-1, 1VolConference Paper

Measuring reality, solving the slope dilemma and redefining the particle size distribution modelWILKERSON, Kerri J; MAGALLANES, Philip G; ELDERS, Jonathan P et al.Proceedings of SPIE, the International Society for Optical Engineering. 2006, pp 62910I.1-62910I.11, issn 0277-786X, isbn 0-8194-6370-1, 1VolConference Paper

Investigation of organic impurities adsorbed on and incorporated into electroplated copper layersSTANGL, M; DITTEL, V; ACKER, J et al.Applied surface science. 2005, Vol 252, Num 1, pp 158-161, issn 0169-4332, 4 p.Conference Paper

Failure analysis of liquid crystal display panel by time-of-flight secondary ion mass spectrometryMIYAKI, S; YOSHIDA, A; YAMAMOTO, Y et al.Applied surface science. 2003, Vol 203-04, pp 836-841, issn 0169-4332, 6 p.Conference Paper

Angular-resolved photoelectron spectroscopy of corrugated surfacesOLEJNIK, K; ZEMEK, J; WERNER, W. S. M et al.Surface science. 2005, Vol 595, Num 1-3, pp 212-222, issn 0039-6028, 11 p.Article

TOF-SIMS characterization of industrial materials: from silicon wafer to polymerKAREN, Akiya; MAN, Naoki; SHIBAMORI, Takahiro et al.Applied surface science. 2003, Vol 203-04, pp 541-546, issn 0169-4332, 6 p.Conference Paper

Surface tritium detection by imaging plate techniqueTANABE, T; MIYASAKA, K; SAZE, T et al.Fusion science and technology. 2002, Vol 41, Num 3, pp 528-531, 4 p., 2Conference Paper

Novel low-cost approach for removal of surface contamination before texturization of commercial monocrystalline silicon solar cellsGANGOPADHYAY, U; DHUNGEL, S. K; MONDAL, A. K et al.Solar energy materials and solar cells. 2007, Vol 91, Num 12, pp 1147-1151, issn 0927-0248, 5 p.Article

Monitoring tritium activity on surfaces: Recent developmentsSHMAYDA, C. R; SHMAYDA, W. T; KHERANI, N. P et al.Fusion science and technology. 2002, Vol 41, Num 3, pp 500-504, 5 p., 2Conference Paper

Analysis of amine contamination on silicon oxide surfaces using ToF-SIMSLU, D; MO, Z.-Q; XING, Z.-X et al.Applied surface science. 2004, Vol 233, Num 1-4, pp 352-359, issn 0169-4332, 8 p.Article

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