Engineering cubic silicon carbide surfaces properties using hydrogen : Metallization versus passivation : Surface physicsSOUKIASSIAN, P.Applied physics. A, Materials science & processing (Print). 2006, Vol 82, Num 3, pp 421-430, issn 0947-8396, 10 p.Article

Optically transparent Au{111} substrates : Flat gold nanoparticle platforms for high-resolution scanning tunneling microscopyDAHANAYAKA, Daminda H; WANG, Jane X; HOSSAIN, Sohrab et al.Journal of the American Chemical Society. 2006, Vol 128, Num 18, pp 6052-6053, issn 0002-7863, 2 p.Article

XPS study of porous dental implants fabricated by electro-discharge-sintering of spherical Ti-6Al-4V powders in a vacuum atmosphereLEE, W. H; HYUN, C. Y.Applied surface science. 2006, Vol 252, Num 12, pp 4250-4256, issn 0169-4332, 7 p.Article

Influence of temperature-pressure treatment on heavily hydrogenated silicon surfaceCIOSEK, J; RATAJCZAK, J.Applied surface science. 2006, Vol 252, Num 18, pp 6115-6118, issn 0169-4332, 4 p.Conference Paper

Hydrogen-induced instability of the Ge(105) surfaceFUJIKAWA, Yasunori; NAGAO, T; YAMADA-TAKAMURA, Y et al.Physical review letters. 2005, Vol 94, Num 8, pp 086105.1-086105.4, issn 0031-9007Article

Characterization and performances of an Algerian diatomite-based gas chromatography supportHADJADJ-AOUL, O; BELABBES, R; BELKADI, M et al.Applied surface science. 2005, Vol 240, Num 1-4, pp 131-139, issn 0169-4332, 9 p.Article

Hydrosilation of 1-alkyne at nearly flat, terraced, homogeneously hydrogen-terminated silicon (100) surfacesCEROFOLINI, G. F; GALATI, C; REINA, S et al.Surface and interface analysis. 2005, Vol 37, Num 1, pp 71-76, issn 0142-2421, 6 p.Article

Nano- and microscopic surface wrinkles of linearly increasing heights prepared by periodic precipitationSMOUKOV, Stoyan K; BITNER, Agnieszka; CAMPBELL, Christopher J et al.Journal of the American Chemical Society. 2005, Vol 127, Num 50, pp 17803-17807, issn 0002-7863, 5 p.Article

Non-contact atomic force microscopy study of the Sn/Si(111) mosaic phaseSUGIMOTO, Y; ABE, M; YOSHIMOTO, K et al.Applied surface science. 2005, Vol 241, Num 1-2, pp 23-27, issn 0169-4332, 5 p.Conference Paper

Statistical analysis of topographic images of nanoporous silicon and model surfacesDA SILVA, J. B; DE VASCONCELOS, E. A; DOS SANTOS, B. E. C. A et al.Microelectronics journal. 2005, Vol 36, Num 11, pp 1011-1015, issn 0959-8324, 5 p.Conference Paper

Ab initio study of yttria-stabilized cubic zirconia surfacesBALLABIO, G; BERNASCONI, M; PIETRUCCI, F et al.Physical review B. Condensed matter and materials physics. 2004, Vol 70, Num 7, pp 075417.1-075417.6, issn 1098-0121Article

Atomic structure of the cleaved Si(111)-(2×1) surface refined by dynamical LEEDGENG XU; BINGCHENG DENG; ZHAOXIAN YU et al.Physical review B. Condensed matter and materials physics. 2004, Vol 70, Num 4, pp 045307.1-045307.7, issn 1098-0121Article

Nonlinear optical spectroscopy of suboxides at oxidized Si(111) interfacesBERGFELD, S; BRAUNSCHWEIG, B; DAUM, W et al.Physical review letters. 2004, Vol 93, Num 9, pp 097402.1-097402.4, issn 0031-9007Article

Rumpled relaxation and surface core-level shift in Pbs(001)BATYREV, Iskander G; KLEINMAN, Leonard; LEIRO, Jarkko et al.Physical review B. Condensed matter and materials physics. 2004, Vol 70, Num 7, pp 073310.1-073310.3, issn 1098-0121Article

X-ray standing waves imagingZEGENHAGEN, Jörg.Surface science. 2004, Vol 554, Num 2-3, pp 77-79, issn 0039-6028, 3 p.Article

Influence of substrate domain boundaries on surface reconstructions of Ga/Si(1 1 1)GANGOPADHYAY, Subhashis; SCHMIDT, Thomas; FALTA, Jens et al.Surface science. 2004, Vol 552, Num 1-3, pp 63-69, issn 0039-6028, 7 p.Article

Structural and statistical analysis of Yb/Si(111) and Eu/Si(1 1 1) reconstructionsKUZMIN, M; VAARA, R.-L; LAUKKANEN, P et al.Surface science. 2004, Vol 549, Num 3, pp 183-195, issn 0039-6028, 13 p.Article

Surface alloying of Pd on Cu(1 1 1)CANZIAN, Adrian; MOSCA, Hugo O; BOZZOLO, Guillermo et al.Surface science. 2004, Vol 551, Num 1-2, pp 9-22, issn 0039-6028, 14 p.Article

Interlayer surface relaxations and energies of fcc metal surfaces by a tight-binding methodHAFTEL, Michael I; BERNSTEIN, Noam; MEHL, Michael J et al.Physical review B. Condensed matter and materials physics. 2004, Vol 70, Num 12, pp 125419.1-125419.15, issn 1098-0121Article

Ripple structure of crystalline layers in ion-beam-induced Si wafersHAZRA, S; CHINI, T. K; SANYAL, M. K et al.Physical review B. Condensed matter and materials physics. 2004, Vol 70, Num 12, pp 121307.1-121307.4, issn 1098-0121Article

Surface structure of phosphorus-terminated GaP(001)-(2 x 1)KADOTANI, N; SHIMOMURA, M; FUKUDA, Y et al.Physical review B. Condensed matter and materials physics. 2004, Vol 70, Num 16, pp 165323.1-165323.5, issn 1098-0121Article

Manganese dioxides surface properties studied by XPS and gas adsorptionPOINSIGNON, Christiane; BERTHOME, Gregory; PRELOT, Bénédicte et al.Journal of the Electrochemical Society. 2004, Vol 151, Num 10, pp A1611-A1616, issn 0013-4651Article

Dihydride chain formation on a Si(100)-2 x 1-H surfaceFUJIMORI, Masaaki; SUWA, Yuji; HEIKE, Seiji et al.Applied surface science. 2004, Vol 237, Num 1-4, pp 58-62, issn 0169-4332, 5 p.Conference Paper

Influence of wet chemical treatments on the evolution of epoxy polymer layer surface roughness for use as a build-up layerSIAU, Sam; VERVAET, Alfons; VAN CALSTER, Andre et al.Applied surface science. 2004, Vol 237, Num 1-4, pp 456-461, issn 0169-4332, 6 p.Conference Paper

A photoelectron diffraction study of the surface-V₂O₃ (2 x 2) layer on Pd(1 1 1)SAMBI, M; PETUKHOV, M; DOMENICHINI, B et al.Surface science. 2003, Vol 529, Num 1-2, pp L234-L238, issn 0039-6028Article