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A self-test hardwired control sectionMICZO, A.IEEE transactions on computers. 1983, Vol 32, Num 7, pp 695-696, issn 0018-9340Article

A simplified method to calculate failure times in fault-tolerant systemsSETH, S. C; LIPSKY, L.IEEE transactions on computers. 1983, Vol 32, Num 8, pp 754-756, issn 0018-9340Article

A fault-tolerant computer with processor reliefTASHIRO, S; TOMITA, K.Systems, computers, controls. 1982, Vol 13, Num 4, pp 91-100, issn 0096-8765Article

Fehlertolerante Rechnersysteme: Funktionsprinzipien und Realisierungs-formen = Systèmes informatiques tolérant les pannes = Fault-tolerant computer systemsWEISS, R.rtp. Regelungstechnische Praxis. 1983, Vol 25, Num 10, pp 408-416, issn 0340-4730Article

Error-correcting codes with byte error-detection capabilityCHIN-LONG CHEN.IEEE transactions on computers. 1983, Vol 32, Num 7, pp 615-621, issn 0018-9340Article

Greedy diagnosis of hybrid fault situationsDAHBURA, A. T; MASSON, G. M.IEEE transactions on computers. 1983, Vol 32, Num 8, pp 777-782, issn 0018-9340Article

Some open questions on : strict consecutive-k-out-of-n:F systemsRUSHDI, A. M.IEEE transactions on reliability. 1990, Vol 39, Num 3, pp 380-381, issn 0018-9529, 2 p.Article

Berechnung von Zuverlässigkeitskenngrössen eines Automatisierungssystems = Calcul des valeurs caractéristiques de fiabilité pour un système d'automatisation = Calculation of characteristic reliabilité values of an automation systemKOOLMAN, M; KRATZ, W.rtp. Regelungstechnische Praxis. 1984, Vol 26, Num 6, pp 252-257, issn 0340-4730Article

Failures in control systemsGALLUZZO, M; ANDOW, P. K.Reliability engineering. 1984, Vol 7, Num 4, pp 193-211, issn 0143-8174Article

Kenngrössen der Zuverlässigkeit von Automatisierungssystemen = Valeurs caractéristiques de la fiabilité d'un système d'automatisation = Characteristic values of the reliability of automation systemsKOOLMAN, M; KRATZ, W.rtp. Regelungstechnische Praxis. 1983, Vol 25, Num 12, pp 499-502, issn 0340-4730Article

Zuverlässigkeitskennwerte für kleinere Kommunikationsnetze = Caractéristiques de la fiabilité des petits réseaux de communication = Reliability characteristics of small communication networksSCHNEEWEISS, W.Elektronische Rechenanlagen. 1983, Vol 25, Num 3, pp 124-128, issn 0013-5720Article

Fitting cost―reliability data in a standard curveKAMAL KUMAR GOVIL.Microelectronics and reliability. 1985, Vol 25, Num 5, pp 913-915, issn 0026-2714Article

Mean time to achieve a failure-free requirement with imperfect repairEBRAHIMI, N.IEEE transactions on reliability. 1985, Vol 34, Num 1, pp 34-37, issn 0018-9529Article

Reliability derivation by cutset approachJAMIL, A. T. M; HASANUDDIN AHMAD, S.Microelectronics and reliability. 1985, Vol 25, Num 4, pp 789-795, issn 0026-2714Article

Ein Rechenmodell für die Verfügbarkeit von Systemen bei Instandhaltung mit Austauschteilen = Un modèle de calcul pour la disponibilité des systèmes lors de la maintenance par composants interchangeablesGEBHARDT, D.Angewandte Informatik. 1983, Vol 25, Num 8, pp 359-361, issn 0013-5704Article

Are reliability growth models practical planning and monitoring tools for development?SHEPPARD, J. M.Reliability engineering. 1985, Vol 11, Num 1, pp 1-12, issn 0143-8174Article

Continuous-time Markov methods in the solution of practical reliability problemsGRAY, J. N. P.Reliability engineering. 1985, Vol 11, Num 4, pp 233-252, issn 0143-8174Article

New approach for multistate systems analysisXUE JANAN.Reliability engineering. 1985, Vol 10, Num 4, pp 245-256, issn 0143-8174Article

Sensitivity analysis of a coherent systemPEI-EN LU.Microelectronics and reliability. 1985, Vol 25, Num 1, pp 97-99, issn 0026-2714Article

Random pattern testabilitySAVIR, J; DITLOW, G. S; BARDELL, P. H et al.IEEE transactions on computers. 1984, Vol 33, Num 1, pp 79-90, issn 0018-9340Article

Analysis of systems suibject to inspection and repair: a state-of-the-art surveySUBRAMANYAM NAIDU, R; GOPALAN, M. N.Microelectronics and reliability. 1984, Vol 24, Num 5, pp 939-945, issn 0026-2714Article

Stochastic behaviour of a maintained system with protection systemASHOK KUMAR; KAPOOR, V. B; RASTOGI, A. K et al.Microelectronics and reliability. 1984, Vol 24, Num 5, pp 869-872, issn 0026-2714Article

Availability modelling of multiprocessorsLEITE, J. C. B; DEPLEDGE, P. G.IEE proceedings. Part E. Computers and digital techniques. 1983, Vol 130, Num 5, pp 165-168, issn 0143-7062Article

Analysis of 1-out-of-n: G adjustable operating systemSARMAH, P; DHARMADHIKARI, A. D.Microelectronics and reliability. 1983, Vol 23, Num 3, pp 477-480, issn 0026-2714Article