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INDEX OF REFRACTION OF STEAM GROWN OXIDE ON SILICONTAFT EA.1980; J. ELECTROCHEM. SOC.; ISSN 0013-4651; USA; DA. 1980; VOL. 127; NO 4; PP. 993-994; BIBL. 4 REF.Article

FILMS FROM THE LOW TEMPERATURE OXIDATION OF SILANETAFT EA.1979; J. ELECTROCHEM. SOC.; ISSN 0013-4651; USA; DA. 1979; VOL. 126; NO 10; PP. 1728-1731; BIBL. 9 REF.Article

THE OPTICAL CONSTANTS OF SILICON AND DRY OXYGEN OXIDES OF SILICON AT 5461 A.TAFT EA.1978; J. ELECTROCHEM. SOC.; USA; DA. 1978; VOL. 125; NO 6; PP. 968-971; BIBL. 22 REF.Article

PRACTICAL CONSIDERATIONS IN ETHERNET LOCAL NETWORK DESIGNCRANE RC; TAFT EA.1980; HAWAII INTERNATIONAL CONFERENCE ON SYSTEM SCIENCES. 13/1980/HONOLULU HI; USA; S.L.: WESTERN PERIODICALS; DA. 1980; VOL. 1; PP. 166-175; BIBL. 16 REF.Conference Paper

AN OPTICAL CHARACTERIZATION OF NATIVE OXIDES AND THIN THERMAL OXIDES ON SILICONPHILIPP HR; TAFT EA.1982; J. APPL. PHYS.; ISSN 0021-8979; USA; DA. 1982; VOL. 53; NO 7; PP. 5224-5229; BIBL. 18 REF.Article

MUTUAL ENCAPSULATION OF INTERNETWORK PROTOCOLSSHOCH JF; COHEN D; TAFT EA et al.1981; COMPUT. NETWORKS; ISSN 0376-5075; NLD; DA. 1981; VOL. 5; NO 4; PP. 287-300; BIBL. 16 REF.Article

PUP: AN INTERNETWORK ARCHITECTUREBOGGS DR; SHOCH JF; TAFT EA et al.1980; I.E.E.E. TRANS. COMMUNIC.; USA; DA. 1980; VOL. 28; NO 4; PP. 612-624; BIBL. 32 REF.Article

TECHNOLOGY DEVELOPMENT FOR INSB INFRARED IMAGERSCHING YEU WEI; WANG KL; TAFT EA et al.1980; I.E.E.E. TRANS. ELECTRON DEVICES; USA; DA. 1980; VOL. 27; NO 1; PP. 170-175; BIBL. 10 REF.Article

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