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Results 1 to 25 of 1791

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MINIMIZING THE COST OF RELIABILITY ASSURANCELOVELOCK RT.1973; ELECTRON. COMPON.; G.B.; DA. 1973; VOL. 14; NO 12; PP. 555-557Serial Issue

LA LOI GAMMA GENERALISEE ET LA LOI DE PUISSANCE EN TANT QUE MODELES MATHEMATIQUES DE LA DISTRIBUTION DE LA DUREE DE VIE DES COMPOSANTS ELECTRONIQUESCIECHANOWICZ K.1972; ARCH. ELEKTROTECH.; POLSKA; DA. 1972; VOL. 21; NO 3; PP. 489-512; ABS. RUSSE ANGL. FR.; BIBL. 1 P.Serial Issue

HIGH-RELIABILITY SEMICONDUCTORS: PAYING MORE DOESN'T ALWAYS PAY OFF.HNATEK ER.1977; ELECTRONICS; U.S.A.; DA. 1977; VOL. 50; NO 3; PP. 101-105Article

RESULTS OF PRODUCTION THERMAL CYCLE SCREENING.KUEHN RE.1974; I.E.E.E. TRANS. RELIABIL.; U.S.A.; DA. 1974; VOL. 23; NO 4; PP. 273-276; BIBL. 15 REF.Article

SILICON IMPATT DIODE DEVICE INCORPORATING A DIAMOND HEAT SINK.NAGAO H; KATAYAMA S.1974; N.E.C. RES. DEVELOP.; JAP.; DA. 1974; NO 35; PP. 67-76; BIBL. 5 REF.Article

UPDATE AND QUANTIFICATION OF FAILURE RATE MATHEMATICAL MODELS FOR CONNECTORS AS SPECIFIED IN MIL-HDBK-217B.GUTH GF.1978; ELECTRON. PACKAG. PRODUCT.; U.S.A.; DA. 1978; VOL. 18; NO 5 PART. 2; PP. C26-C32Article

ZUVERLAESSIGKEIT ELEKTRISCHER KONTAKTE. = FIABILITE DES CONTACTS ELECTRIQUESHOFT H.1974; NACHR.-TECH., ELEKTRON.; DTSCH.; DA. 1974; VOL. 24; NO 12; PP. 453-455; BIBL. 6 REF.Article

OBSERVED FAILURE RATES OF ELECTRONIC COMPONENTS IN COMPUTER SYSTEMS.LUCAS P; KNIGHT L.1976; MICROELECTRON. AND RELIABIL.; G.B.; DA. 1976; VOL. 15; NO 3; PP. 239-243; BIBL. 2 REF.Article

FIABILITES DES COMPOSANTS ELECTRONIQUES, COMMENT FACILITER DES TAUX DE DEFAILLANCES CATALECTIQUES.GUYONNET J.1974; REV. PRAT. CONTROLE INDUSTR.; FR.; DA. 1974; VOL. 14; NO 68; PP. 20-22Article

ZUR BEURTEILUNG VON AUSFALLRATEN-ANGABEN VON HALBLEITER-BAUELEMENTE. = CRITIQUE DES INDICATIONS SUR LES TAUX DE DEFECTUOSITE DES COMPOSANTS ELECTRONIQUES A SEMI-CONDUCTEURSGERLING W.1974; QUAL. U. ZUVERLAESS.; DTSCH.; DA. 1974; VOL. 19; NO 7; PP. 152-157; BIBL. 12 REF.Article

VERFAHREN ZUR ABSICHERUNG DER ZUVERLAESSIGKEIT VON HALBLEITERBAUELEMENTEN = COMMENT ASSURER LA FIABILITE DES DISPOSITIFS SEMICONDUCTEURSFISCHER F.1972; SIEMENS Z.; DTSCH.; DA. 1972; VOL. 46; NO 12; PP. 954-958; BIBL. 6 REF.Serial Issue

AUSFALLRATEN ELEKTRONISCHER BAUELEMENTE. = TAUX DE DEFAILLANCE DES COMPOSANTS ELECTRONIQUESHOFT H.1974; RADIO FERNSEHEN ELEKTRON.; DTSCH.; DA. 1974; VOL. 23; NO 14; PP. 445-447Article

STEP-STRESS FAILURE RATE MODELS FOR ELECTRONIC COMPONENTS. = MODELES DE VITESSE DE DEFAILLANCE A CONTRAINTE EN ECHELON POUR DES COMPOSANTS ELECTRONIQUESBORA JS.1974; MICROELECTRON. AND RELIABIL.; G.B.; DA. 1974; VOL. 13; NO 4; PP. 259-266; BIBL. 6 REF.Article

IC FAILURE RATES AND SYSTEMS RELIABILITY PREDICTIONWALCZAK MW.1973; EVAL ENGNG; U.S.A.; DA. 1973; VOL. 12; NO 1; PP. 10-16 (6 P.); BIBL. 9 REF.Serial Issue

THE RELIABILITY OF FAILURE RATES.VAN DIEST HG.1973; MICROELECTRON. AND RELIABIL.; G.B.; DA. 1973; VOL. 12; NO 6; PP. 521-530; H.T. 2; BIBL. 7 REF.Article

DYNAMIC ENVIRONMENT FACTORS IN DETERMINING ELECTRONIC ASSEMBLY RELIABILITY.FIDERER L.1975; MICROELECTRON. AND RELIABIL.; G.B.; DA. 1975; VOL. 14; NO 2; PP. 173-193; BIBL. 1 P.; (SOC. RELIAB. ENG. CAN. RELIAB. SYMP. PROC.; OTTAWA, ONT.; 1975)Conference Paper

PRATIQUES ACTUELLES EN FIABILITE.BAJANESCO TI.1975; ELECTRONIQUE; SUISSE; DA. 1975; VOL. 4; NO 11-12; PP. 19-23; BIBL. 12 REF.Article

LA LOI GAMMA GENERALISEE AVEC COEFFICIENTS DE FORME NEGATIVE EN TANT QUE DISTRIBUTION DE LA DUREE DE VIE DES COMPOSANTS ELECTRONIQUES AVEC UN TAUX DE DEFAILLANCE LAMBDA (T) AYANT UN MAXIMUMCIECHANOWICZ K.1972; ARCH. ELEKTROTECH.; POLSKA; DA. 1972; VOL. 21; NO 3; PP. 513-521; ABS. RUSSE ANGL. FR.; BIBL. 8 REF.Serial Issue

A BURN-IN PROGRAM FOR WEAROUT UNAFFECTED EQUIPMENTS.GIRONI G; MALBERTI P.1976; MICROELECTRON. AND RELIABIL.; G.B.; DA. 1976; VOL. 15; NO 3; PP. 227-232; BIBL. 6 REF.Article

CORRELATIVE SEA MIST CORROSION TESTING FOR ELECTRONIC DEVICES.LASCARO CP.1975; J. SOC. ENVIRONMENT. ENGRS; G.B.; DA. 1975; VOL. 14; NO 1; PP. 21-30 (6P.); BIBL. 5 REF.Article

APPLICATION OF NEW METHODS AND TECHNIQUES FOR FAILURE ANALYSIS.1977; SOLID STATE TECHNOL.; U.S.A.; DA. 1977; VOL. 19; NO 2; PP. 49-50Article

A CASE STUDY APPROACH TO THE RELIABILITY OF SHIPBORNE ELECTRONIC SYSTEMS.SHOVE PL.1975; MICROELECTRON. AN RELIABIL.; G.B.; DA. 1975; VOL. 14; NO 1; PP. 57-62Article

ETUDE DE L'APPLICATION AUX CONDENSATEURS CERAMIQUES MONOLITHIQUES DE TYPE I DES METHODES DE SELECTIONS NOUVELLES DEJA ETUDIEES POUR LE TYPE II.GUYONNET J.1973; CNET-7145330; FR.; DA. 1973; PP. 1-53; H.T. 77; (RAPP. FINAL, ACTION CONCERTEE: FIABILITE)Report

FAILURE RATE. A UNIFIED APPROACH.LEE L; THOMPSON WA JR.1976; J. APPL. PROBABIL.; G.B.; DA. 1976; VOL. 13; NO 1; PP. 176-182; BIBL. 7 REF.Article

ZUVERLAESSIGKEITSSICHERUNG BEI ELEKTRISCHEN MESSGERAETEN. = GARANTIE DE FIABILITE DES INSTRUMENTS DE MESUREUNGER E.1976; B.B.C. NACHR.; DTSCH.; DA. 1976; VOL. 58; NO 12; PP. 504-508; BIBL. 3 REF.Article

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