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DETERMINATION OF THE OXYGEN PRECIPITATE-FREE ZONE WIDTH IN SILICON WAFERS FROM SURFACE PHOTOVOLTAGE MEASUREMENTSCHAPPELL TI; CHYE PW; TAVEL MA et al.1983; SOLID-STATE ELECTRONICS; ISSN 0038-1101; GBR; DA. 1983; VOL. 26; NO 1; PP. 33-36; BIBL. 11 REF.Article

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