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Results 1 to 25 of 18978

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HRTEM surface characterization of nanoscale solid-state materialsZHOU, W; MA, X. C; YUAN, Z. Y et al.Surface and interface analysis. 2001, Vol 32, Num 1, pp 236-239, issn 0142-2421Conference Paper

Capacitance between perpendicular conducting planes separated by a gapDAS, B. N; ANANDA MOHAN, S; PRASAD, K. V. S. V. R et al.IEEE transactions on electromagnetic compatibility. 1985, Vol 27, Num 2, pp 96-98, issn 0018-9375Article

Fullerenic carbon in carbon black furnacesDONNET, J. B; JOHNSON, M. P; NORMAN, D. T et al.Carbon (New York, NY). 2000, Vol 38, Num 13, pp 1885-1886, issn 0008-6223Article

Avoiding end-of-range dislocation in ion-implanted siliconACCO, S; CUSTER, J. S; SARIS, F. W et al.Materials science & engineering. B, Solid-state materials for advanced technology. 1995, Vol 34, Num 2-3, pp 168-174, issn 0921-5107Article

Comparison and test of HRTEM image simulation programsVAN DYCK, D; OP DE BEECK, M.Ultramicroscopy. 1994, Vol 55, Num 4, pp 435-437, issn 0304-3991Article

Structure modification of single-wall carbon nanotubesZHANG, Y; SHI, Z; GU, Z et al.Carbon (New York, NY). 2000, Vol 38, Num 15, pp 2055-2059, issn 0008-6223Article

Study of high resolution TEM images of nanoparticles either supported on amorphous films or embedded in a crystalline matrixYACAMAN, M. J; ZORRILLA, C; ASCENCIO, J. A et al.Materials transactions - JIM. 1999, Vol 40, Num 2, pp 141-145, issn 0916-1821Article

Amplitude contrast : A way to obtain directly interpretable high-resolution images in a spherical aberration corrected transmission electron microscopeFOSCHEPOTH, M; KOHL, H.Physica status solidi. A. Applied research. 1998, Vol 166, Num 1, pp 357-366, issn 0031-8965Article

High yield synthesis and growth mechanism of carbon nanotubesZUJIN SHI; XIHUANG ZHOU; ZHAOXIA JIN et al.Solid state communications. 1996, Vol 97, Num 5, pp 371-375, issn 0038-1098Article

Direct observation by TEM on the generation process of carbon clusters at 800°CKUSUNOKI, M; IKUHARA, Y; SHIBATA, Y et al.Fullerene science and technology. 1997, Vol 5, Num 7, pp 1397-1405, issn 1064-122XArticle

Effect of nitrogen contamination by crucide encapsulation on polycrystalline silicon material qualityBINETTI, S; ACCIARRI, M; SAVIGNI, C et al.Materials science & engineering. B, Solid-state materials for advanced technology. 1996, Vol 36, Num 1-3, pp 68-72, issn 0921-5107Conference Paper

A new technique for specimen preparation for transmission electron microscope studies of mechanically alloyed powdersHUANG, J. Y; HE, A. Q; WU, Y. K et al.Journal of materials science letters. 1994, Vol 13, Num 16, pp 1201-1203, issn 0261-8028Article

TEM study on extractive organic phase containing lanthanide ionsYAN LI; HUA LIAO; QING PENG et al.Journal of alloys and compounds. 1994, Vol 216, Num 1, pp L21-L23, issn 0925-8388Article

Carbon nanotubes : A status reportSUBRAMONEY, S.The Electrochemical Society interface. 1999, Vol 8, Num 4, pp 34-37, issn 1064-8208Article

TEM study on Langmuir-Blodgett films of two novel C60 derivativesLONG, C; XU, Y; ZHU, C et al.Solid state communications. 1997, Vol 101, Num 6, pp 439-442, issn 0038-1098Article

Elemental mapping using an energy-filter-equipped TEM with application to magnetic materialsKIMOTO, K; USAMI, K; YAHISA, Y et al.Hitachi review. 1996, Vol 45, Num 1, pp 15-18, issn 0018-277XArticle

Resolution beyond the 'information limit' in transmission electron microscopyNELLIST, P. D; MCCALLUM, B. C; RODENBURG, J. M et al.Nature (London). 1995, Vol 374, Num 6523, pp 630-632, issn 0028-0836Article

Surface structure of silicon observed by ultra-high-vacuum transmission electron microscopy at an atomic levelICHIHASHI, T; IIJIMA, S.NEC research & development. 1994, Vol 35, Num 2, pp 144-148, issn 0547-051XArticle

Oxygen self-diffusion in cylindrical single-crystal mulliteIKUMA, Y; SHIMADA, E; SAKANO, S et al.Journal of the Electrochemical Society. 1999, Vol 146, Num 12, pp 4672-4675, issn 0013-4651Article

Characterization of SOI-SIMOX structures using Brillouin light scatteringGHISLOTTI, G; GAGLIARDI, A; BOTTANI, C. E et al.Materials science & engineering. B, Solid-state materials for advanced technology. 1996, Vol 36, Num 1-3, pp 129-132, issn 0921-5107Conference Paper

A new type of columnar grain structure in obliquely deposited filmsHARA, K; ITOH, K; KAMIYA, M et al.Journal of magnetism and magnetic materials. 1995, Vol 148, Num 1-2, pp 19-20, issn 0304-8853Conference Paper

Performance of thin foil scintillating screen for transmission electron microscopyFAN, G. Y; DUNKELBERGER, D. G; ELLISMAN, M. H et al.Ultramicroscopy. 1994, Vol 55, Num 1, pp 7-14, issn 0304-3991Article

Temporal and interference fringe analysis of TEM01 laser modesVAUGHAN, J. M; WILLETTS, D. V.Journal of the Optical Society of America (1930). 1983, Vol 73, Num 8, pp 1018-1021, issn 0030-3941Article

A new route to bulk nanostructured metalsZHU, Yuntian T; HONGGANG JIANG; JIANYU HUANG et al.Metallurgical and materials transactions. A, Physical metallurgy and materials science. 2001, Vol 32, Num 6, pp 1559-1562, issn 1073-5623Article

Synthesis and characterization of helical multi-shell gold nanowiresKONDO, Y; TAKAYANAGI, A. K.Science (Washington, D.C.). 2000, Vol 289, Num 5479, pp 606-608, issn 0036-8075Article

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