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The Kepler end-to-end model: creating high-fidelity simulations to test Kepler ground processingBRYSON, Stephen T; JENKINS, Jon M; PETERS, Dan J et al.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7738, issn 0277-786X, isbn 978-0-8194-8228-0, 1Vol, 773808.1-773808.12Conference Paper

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