TESTABILITY - THE KEY TO AUTOMATION IN CIRCUIT TESTING.1974; IN: IEEE INTERCON. INT. CONV. EXPO. INST. ELECTR. ELECTRON. ENG.; NEW YORK; 1974; NEW YORK; I.E.E.E.; DA. 1974; PP. (10P.)Conference Paper

AUTOMATIC TEST EQUIPMENT-LESSONS LEARNED AND DETERRENTS TO WIDER APPLICATION.1974; IN: IEEE INTERCON. INT. CONV. EXPO. INST. ELECTR. ELECTRON. ENG.; NEW YORK; 1974; NEW YORK; I.E.E.E.; DA. 1974; PP. (17P.)Conference Paper

LE TEST AUTOMATIQUE DES MICROPROCESSEURS.BILBAULT M.1975; ELECTRON. MICROELECTRON. INDUSTR.; FR.; DA. 1975; NO 208; PP. 31-33; BIBL. 3 REF.Article

TESTING MICROCOMPUTER BOARDS AUTOMATICALLY.FOLEY EB JR; FIRMAN AH.1976; COMPUTER DESIGN; U.S.A.; DA. 1976; VOL. 15; NO 12; PP. 92-94; BIBL. 1 REF.Article

APPLICATIONS OF PATTERN RECOGNITION TO THE DIAGNOSIS OF EQUIPMENT FAILURES.PAU LF.1974; PATTERN RECOGNIT.; G.B.; DA. 1974; VOL. 6; NO 1; PP. 3-11; BIBL. 17 REF.Article

A REVIEW AND NEW APPROACHES TO DIGITAL TESTING.1974; IN: IEEE INTERCON. INT. CONV. EXPO. INST. ELECTR. ELECTRON. ENG.; NEW YORK; 1974; NEW YORK; I.E.E.E.; DA. 1974; PP. (24P.)Conference Paper

MINICOMPUTER SOFTWARE FOR FAULT LOCATION CONTROL IN DIGITAL CIRCUITSLOHUARU TV; UBAR RR; VIILUP AA et al.1979; SOFTWARE FOR COMPUTER CONTROL. SYMPOSIUM ON SOFTWARE FOR COMPUTER CONTROL. 2/1979/PRAGUE; GBR/USA/FRA; OXFORD: PERGAMON PRESS/NEW YORK: PERGAMON PRESS/PARIS: PERGAMON PRESS; DA. 1979; PP. 165-168; BIBL. 2 REF.Conference Paper

AUTOMATIC TESTING 76. CONFERENCE. PROCEEDINGS; HAMBURG; 1976.1976; NEWPORT PAGNELL; NETWORK; DA. 1976; PP. (536P.); BIBL. DISSEM.; 6 FASCConference Paper

FAULT TEST GENERATION USING A DESIGN LANGUAGE.HUEY BM; HILL FJ.1975; IN: INT. SYMP. COMPUT. HARDWARE DESCR. LANG. AND APPL. PROC.; NEW YORK, N.Y.: 1975; NEW YORK; ASSOC. COMPUT. MACH.; DA. 1975; PP. 91-95; BIBL. 12 REF.Conference Paper

DATA REDUCTION AND DISPLAY IN AUTOMATED TEST SYSTEMS.CAVE T; SMITH D.1978; COMPUTER DESIGN; U.S.A.; DA. 1978; VOL. 17; NO 5; PP. 161-172; BIBL. 6 REF.Article

COMMON MISCONCEPTIONS INDIGITAL TEST GENERATION.THOMAS JJ.1977; COMPUTER DESIGN; U.S.A.; DA. 1977; VOL. 16; NO 1; PP. 89-94; BIBL. 6 REF.Article

MICROPROCESSOR SYSTEM VALIDATION AND FAILURE ISOLATION WITH PORTABLE TESTER.NEESE JW.1977; COMPUTER DESIGN; U.S.A.; DA. 1977; VOL. 16; NO 9; PP. 105-111; BIBL. 2 REF.Article

AUTOMATISCHE TESTERSTELLUNG ZUR FEHLERDIAGNOSE IN SCHALTWERKEN. = ENSEMBLE DE TESTS AUTOMATIQUES POUR LE DIAGNOSTIC DES PANNES DANS LES CIRCUITS SEQUENTIELSEBEL B.1977; ELEKTRON. RECHENANLAGEN; DTSCH.; DA. 1977; VOL. 19; NO 5; PP. 226-232; ABS. ANGL.; BIBL. 13 REF.Article

COMPUTER-AIDED MODULE-LEVEL TEST GENERATION FOR DIGITAL DEVICES ON THE BASIS OF THEIR ALTERNATIVE-GRAPH MODELPALL MA; UBAR RR.1979; SOFTWARE FOR COMPUTER CONTROL. SYMPOSIUM ON SOFTWARE FOR COMPUTER CONTROL. 2/1979/PRAGUE; GBR/USA/FRA; OXFORD: PERGAMON PRESS/NEW YORK: PERGAMON PRESS/PARIS: PERGAMON PRESS; DA. 1979; PP. 287-290; BIBL. 3 REF.Conference Paper

EIN ALGORITHMUS ZUR BERECHNUNG VON TESTS FUER DIGITALE FUNKTIONSGRUPPEN. = ALGORITHME POUR LE CALCUL DES TESTS POUR GROUPES DE FONCTIONS NUMERIQUESECKERT K; RICHTER B.1977; Z. ELEKTR. INFORM.- U. ENERGIETECH.; DTSCH.; DA. 1977; VOL. 7; NO 6; PP. 521-528; BIBL. 7 REF.Article

TEST ET TESTABILITE. LOGICIELRAULT JC.1980; TECHNIQUES DE L'INGENIEUR, ELECTRONIQUE; FRA; PARIS: TECH.-ING.; DA. 1980; NO 87; E3970; 9 P.; BIBL. 41 REF.Book Chapter

AUTOMATIC ANALOG TESTING: 1979 STYLEPLICE WA.1979; COMPUTER; USA; DA. 1979; VOL. 12; NO 10; PP. 40-47; BIBL. 25 REF.Article

JOIN 488 BUS INSTRUMENTS AND EFFICIENT SOFTWARE FOR FAST, AUTOMATIC TESTSSMITH L.1978; ELECTRON. DESIGN; USA; DA. 1978; VOL. 26; NO 24; PP. 142-148Article

FAULT-TOLERANT COMPUTING AND DIAGNOSIS1972; IN: SUMMER COMPUT. SIMULATION CONF. SAN DIEGO, CALIF., 1972, PROC.; LA JOLLA; SIMULATION COUNCILS INC.; DA. 1972; VOL. 1; PP. 89-107; BIBL. DISSEM.Conference Proceedings

TEST AUTOMATIQUE DE SYSTEMES DE NUMERISATION DE SIGNAUX PAR ANALYSE D'HISTOGRAMMECASTANIE F; DUBE D.1981; CONGRES AUTOMATIQUE/1981/NANTES; FRA; PARIS: AFCET; DA. 1981; PP. 231-242; BIBL. 15 REF.Conference Paper

STRATEGIE DU TEST = TEST STRATEGIESSAGNARD FRANCOIS REGIS.1982; ; FRA; DA. 1982; 164 F.; 30 CM; BIBL. 2 P.; TH. 3E CYCLE: INFOR./PARIS 6/1982Thesis

PROCEEDINGS/AUTOMATIC TESTING '79, CONFERENCE & EXHIBITION, BRIGHTON, DECEMBER 11-13, 19791979; AUTOMATIC TESTING '79. CONFERENCE & EXHIBITION/1979-12-11/BRIGHTON; GBR; BUCKINGHAM: NETWORK; DA. 1979; 3 VOL., 172, 142, 175 P.: ILL.; 30 CM; BIBL. DISSEM.; ISBN 0-904999-72-60-904999-73-40-904999-74-2Conference Proceedings

An overview of automated software testingBERTOLINO, A.The Journal of systems and software. 1991, Vol 15, Num 2, pp 133-138, issn 0164-1212, 6 p.Article

Realization of a self-testing bus arbiterTOKITO, K; KUROKAWA, T; KOGA, Y et al.Systems and computers in Japan. 1993, Vol 24, Num 3, pp 13-24, issn 0882-1666Article

Computing the minimum DNF representation of Boolean functions defined by intervalsSCHIEBER, Baruch; GEIST, Daniel; ZAKS, Ayal et al.Discrete applied mathematics. 2005, Vol 149, Num 1-3, pp 154-173, issn 0166-218X, 20 p.Article