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Results 1 to 25 of 472

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COMPLEX IMAGE DETERMINATION IN ELECTRON MICROSCOPY.SPENCE JCH.1974; OPT. ACTA; G.B.; DA. 1974; VOL. 21; NO 10; PP. 835-837; ABS. FR. ALLEM.; BIBL. 14 REF.Article

INFLUENCE DE L'OUVERTURE DU FAISCEAU ECLAIRANT L'ECHANTILLON, SUR LE TRANSFERT DU CONTRASTE DE PHASEBONHOMME P; BEORCHIA A; BONNET N et al.1973; C.R. ACAD. SCI., B; FR.; DA. 1973; VOL. 277; NO 3; PP. 83-86; BIBL. 15 REF.Serial Issue

IMAGE OF A STACKING FAULT.INDENBOM VL; SLOBODETSKII IS.1975; PHYS. STATUS SOLIDI, B; ALLEM.; DA. 1975; VOL. 71; NO 2; PP. 751-756; ABS. RUSSE; BIBL. 8 REF.Article

HIGH-RESOLUTION TOPOGRAPHICAL IMAGING BY DIRECT TRANSMISSION ELECTRON MICROSCOPY.CULLIS AG; MAHER DM.1974; PHILOS. MAG.; G.B.; DA. 1974; VOL. 30; NO 2; PP. 447-451; BIBL. 10 REF.Article

INFLUENCE DE LA DIFFUSION THERMIQUE SUR LA FORMATION DES CONTRASTES DE DIFFRACTION DES IMAGES ELECTRONIQUES.DUVAL H; DUVAL P; HENRY L et al.1974; J. PHYS.; FR.; DA. 1974; VOL. 35; NO 10; PP. L.169-L.172; ABS. ANGL.; BIBL. 10 REF.Article

REAL-SPACE METHODS FOR INTERPRETING ELECTRON MICROGRAPHS IN CROSS-GRATING ORIENTATIONS. II. ANALYSIS AND SEMICLASSICAL APPROXIMATIONS.OZORIO DE ALMEIDA AM.1975; ACTA CRYSTALLOGR., A; DANEM.; DA. 1975; VOL. 31; NO 4; PP. 442-445; BIBL. 6 REF.Article

POSSIBILITY OF A PHASE CONTRAST ELECTRON MICROSCOPEPARSONS DF; JOHNSON HM.1972; APPL. OPT.; U.S.A.; DA. 1972; VOL. 11; NO 12; PP. 2840-2843; BIBL. 22 REF.Serial Issue

A MICROWELDER FOR THE PREPARATION OF ELECTRON MICROSCOPE CENTRAL WIRE BEAM-STOPPING APERTURESBROWN JN.1972; J. MICR.; G.B.; DA. 1972; VOL. 96; NO 3; PP. 393-395; BIBL. 4 REF.Serial Issue

IMAGE OVERLAP IN FIELD-ION MICROSCOPY.INAL OT; MURR LE.1974; PHYS. STATUS SOLIDI, A; ALLEM.; DA. 1974; VOL. 23; NO 1; PP. K1-K2; H.T. 2; BIBL. 4 REF.Article

TOWARDS THREE-DIMENSIONAL "ELECTRON MICROSCOPY" AT ATOMIC RESOLUTION.HOPPE W.1974; NATURWISSENSCHAFTEN; DTSCH.; DA. 1974; VOL. 61; NO 6; PP. 239-249; BIBL. 52 REF.Article

HOLOGRAPHY WITHOUT FRINGES IN THE ELECTRON MICROSCOPEGERCHBERG RW.1972; NATURE; G.B.; DA. 1972; VOL. 240; NO 5381; PP. 404-406; BIBL. 2 REF.Serial Issue

REAL-SPACE METHODS FOR INTERPRETING ELECTRON MICROGRAPHS IN CROSS-GRATING ORIENTATIONS. I. EXACT WAVE-MECHANICAL FORMULATION.OZORIO DE ALMEIDA AM.1975; ACTA CRYSTALLOGR., A; DANEM.; DA. 1975; VOL. 31; NO 4; PP. 435-442; BIBL. 17 REF.Article

INCREASED IMAGE BRIGHTNESS CAUSED BY FIELD ADSORPTION IN FIELD-ION MICROSCOPY. II. EFFECTS OF FIELD DISTORTIONS IN ATOMIC ORBITALS.NOLAN DA; HERMAN RM.1974; PHYS. REV., B; U.S.A.; DA. 1974; VOL. 10; NO 1; PP. 50-54; BIBL. 10 REF.Article

CALCUL DU CONTRASTE DE DIFFRACTION DES IMAGES DE MONOCRISTAUX EN FONCTION DE LA TENSION ACCELERATRICE DES ELECTRONS.DUVAL H; DUVAL P; HENRY L et al.1974; C.R. ACAD. SCI., B; FR.; DA. 1974; VOL. 279; NO 15; PP. 383-386; BIBL. 5 REF.Article

A MOIRE INTERPRETATION OF FIELD-ION MICROSCOPYWALLS JM; LEIFER I; SOUTHWORTH HN et al.1973; PHILOS. MAG.; G.B.; DA. 1973; VOL. 27; NO 4; PP. 915-927; BIBL. 13 REF.Serial Issue

EIN- UND MEHRDEUTIGKEIT DER PHASENBESTIMMUNG AUS BILD UND BEUGUNGSFIGUR. = INTERPRETATION UNIQUE ET MULTIPLE DE LA DETERMINATION DES PHASES A PARTIR DE L'IMAGE ET DU DIAGRAMME DE DIFFRACTIONSCHISKE P.1974; OPTIK; DTSCH.; DA. 1974; VOL. 40; NO 3; PP. 261-275; ABS. ANGL.; BIBL. 17 REF.; (DTSCHE. GES. ELEKTRONENMIKROSK. 16. TAG. GEMEINSAME TAG. BELG. DTSCH. NIED. VER. ELEKTRONENMIKROSK.; LUETTICH; 1973)Conference Paper

AN APPLICATION OF THE HILBERT TRANSFORM IN ELECTRON MICROSCOPY. II. NON-ITERATIVE SOLUTION IN BRIGHT-FIELD MICROSCOPY AND THE DARK-FIELD PROBLEM.MISELL DL; GREENAWAY AH.1974; J. PHYS. D; G.B.; DA. 1974; VOL. 7; NO 12; PP. 1660-1669; BIBL. 29 REF.Article

ELASTIC SCATTERING OF BLOCH WAVES IN ABSORBING CRYSTALS CONTAINING LATTICE DEFECTSWILKENS M; KATERBAU KH; RUHLE M et al.1973; Z. NATURFORSCH., A; DTSCH.; DA. 1973; VOL. 28; NO 5; PP. 681-690; BIBL. 25 REF.Serial Issue

FORMATION D'IMAGES ELECTRONIQUES DE MONOCRISTAUX D'OR A TEMPERATURE AMBIANTE ET A BASSE TEMPERATURE: ETUDE DES PARAMETRES DE DIFFUSION INELASTIQUERENARD MILLIEZ D.1973; AO-CNRS-6877; FR.; DA. 1973; PP. (111 P.); H.T. 46; BIBL. 4 P. 1/2; (THESE DOCT. SCI. PHYS.; FAC. SCI. ORSAY)Thesis

INELASTIC EFFECTS IN LORENTZ MICROSCOPY.MORY C; COLLIEX C.1976; PHILOS. MAG.; G.B.; DA. 1976; VOL. 33; NO 1; PP. 97-103; BIBL. 7 REF.Article

ANALOGUE INVESTIGATIONS OF ELECTRIC FIELD DISTRIBUTION AND ION TRAJECTORIES IN THE FIELD ION MICROSCOPE.BIRDSEYE PJ; SMITH DA; SMITH GDW et al.1974; J. PHYS. D; G.B.; DA. 1974; VOL. 7; NO 12; PP. 1642-1651; BIBL. 16 REF.Article

ENERGY SPECTRUM OF FIELD IONIZATION AT A SINGLE ATOMIC SITEMULLER EW; KRISHNASWAMY SV.1973; SURF. SCI.; NETHERL.; DA. 1973; VOL. 36; NO 1; PP. 29-47; BIBL. 32 REF.Serial Issue

COMPARAISON DES IMAGES THEORIQUES ET EXPERIMENTALES OBTENUES AU MICROSCOPE ELECTRONIQUE COMME METHODE D'ANALYSE DE LA STRUCTURE DES CRISTAUXPIKUS EA; RUSAKOVA IA; SKAKOVA T YU et al.1974; ZAVODSK. LAB.; S.S.S.R.; DA. 1974; VOL. 40; NO 9; PP. 1090-1101; BIBL. 55 REF.Article

INFLUENCE DE L'OUVERTURE DU FAISCEAU ECLAIRANT L'ECHANTILLON, SUR LE TRANSFERT DU CONTRASTE DE PHASEBONHOMME P; BEORCHIA A; BONNET N et al.1973; C.R. ACAD. SCI., B; FR.; DA. 1973; VOL. 277; NO 3; PP. 83-86; BIBL. 15 REF.Serial Issue

ABBILDUNGSERSCHEINUNGEN AN ISOLATORSCHICHTEN IM ELEKTRONENSPIEGELMIKROSKOP UNTER STATIONAEREN AUFLADUNGSBEDINGUNGEN. = APPARITION D'IMAGES DE COUCHES ISOLANTES DANS UN MICROSCOPE ELECTRONIQUE A MIROIR SOUS DES CONDITIONS STATIONNAIRES DE CHARGEMENTWEIDNER G; WEISSMANTEL C; HERBERGER J et al.1975; KRISTALL U. TECH.; DTSCH.; DA. 1975; VOL. 10; NO 3; PP. 285-293; ABS. ANGL.; BIBL. 13 REF.Article

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