LES DISPOSITIFS OPTOELECTRONIQUES. PRINCIPE DE FONCTIONNEMENT ET APPLICATIONTOMOV I.1972; FIZ.-MAT. SPIS.; BALG.; DA. 1972; VOL. 15; NO 4; PP. 274-296Serial Issue

ETUDE AUX RX POUR LA DETERMINATION QUANTITATIVE DE LA COMPOSITION DE PHASE ET DES COMPOSANTS DE STRUCTURES FIBREUSESTOMOV I.1976; IZVEST. KHIM.; BALG.; DA. 1976; VOL. 9; NO 4; PP. 587-598; ABS. ANGL.; BIBL. 16 REF.Article

Orientation dependence of the effective depth of X-ray penetrationTOMOV, I.Physica status solidi. A. Applied research. 1986, Vol 98, Num 1, pp 43-50, issn 0031-8965Article

Eliminating the extinction-induced reflection enlargement in the XRD characterisations of textured filmsTOMOV, I.Materialwissenschaft und Werkstofftechnik. 2003, Vol 34, Num 7, pp 688-692, issn 0933-5137, 5 p.Article

ECG ANALYSIS IN MASS SCREENING EXAMINATIONSDASKALOV I; TOMOV I.1979; ACTA MED. BULG.; BGR; DA. 1979; VOL. 6; NO 2; PP. 47-54; ABS. RUS; BIBL. 10 REF.Article

AN ANALYTICAL METHOD FOR THE QUANTITATIVE DETERMINATION OF THE VOLUME FRACTIONS IN FIBER TEXTURESTOMOV I; BUNGE HJ.1979; TEXTURE CRYST. SOLIDS; GBR; DA. 1979; VOL. 3; NO 2; PP. 73-83; BIBL. 8 REF.Article

LA CHARGE ELECTRIQUE DE L'AIR DANS LES BERGERIES ET L'INFLUENCE D'UNE IONISATION ARTIFICIELLE SUR LA QUALITE ET LA CROISSANCE DE LA LAINENENOV TS; TOMOV I.1977; ZHIVOTNOVAD. NAUKI; BALG.; DA. 1977; VOL. 14; NO 2; PP. 62-69; ABS. RUSSE ANGL.; BIBL. 13 REF.Article

LES COMPLEXES VENTRICULAIRES ABERRANTSTOMOV I; TODOROVA M.1974; VATRESHI BOLESTI; BALG.; DA. 1974; VOL. 13; NO 2; PP. 37-46; BIBL. 10 REF.Article

A new diffraction method for the determination of the effective depth of x-ray penetration = Eine neue Beugungsmethode zur Bestimmung der effektiven Eindringtiefe von RoentgenstrahlenTOMOV, I.Physica status solidi. A. Applied research. 1986, Vol 95, Num 2, pp 397-405, issn 0031-8965Article

Orientation dependence of the effective depth of X-ray penetrationTOMOV, I.Physica status solidi. A. Applied research. 1986, Vol 98, Num 1, pp 43-50, issn 0031-8965Article

X-RAY INVESTIGATION OF THE CHANGE IN THE TWIN FAULTS DURING THE GROWTH OF <100> TEXTURED NICKEL ELECTRODEPOSITSVITKOVA S; TOMOV I; VELINOV V et al.1978; IZVEST. KHIM.; BGR; DA. 1978; VOL. 11; NO 2; PP. 258-264; ABS. BUL; BIBL. 19 REF.Article

TEXTURE DE REVETEMENTS DE NICKEL DEPOSES PAR ELECTROLYSETOMOV I; UZUNOVA I; RASHKOV S et al.1974; BALG. AKAD. NAUK., IZVEST. OTDEL. KHIM. NAUKI; BALG.; DA. 1974; VOL. 7; NO 2; PP. 177-187; ABS. ANGL.; BIBL. 16 REF.Article

DETERMINATION DE LA TAILLE DES CRISTAUX X-NI ELECTRODEPOSESTOMOV I; STOJCHEV DS; RASHKOV S et al.1976; IZVEST. KHIM.; BALG.; DA. 1976; VOL. 9; NO 2; PP. 254-264; ABS. ANGL.; BIBL. 20 REF.Article

X-ray diffraction study of anisotrophy by formation and decomposition of nickel hydride. I: Orientation dependence of the extent of phase transformation of nickel into nickel hydrideTOMOV, I; MONEV, M.Journal of applied electrochemistry. 1992, Vol 22, Num 3, pp 262-267, issn 0021-891XArticle

Secondary extinction in textured filmsYAMAKOV, V; TOMOV, I.Journal of applied crystallography. 1999, Vol 32, pp 300-308, issn 0021-8898, 2Article

Orientation distributions by recovery behaviour in electrodeposited copper layers at room temperature = Distributions des orientations par le comportement de recouvrement des couches de cuivre électrodéposées à température ambianteSURNEV, S; TOMOV, I.Journal of applied electrochemistry. 1989, Vol 19, Num 5, pp 752-757, issn 0021-891XArticle

DETERMINATION OF THE SIZE OF THE CRYSTALLITES THAT FORM BRIGHT GALVANIC COPPER COATINGSSTOYCHEV DS; TOMOV I; VITANOVA I et al.1978; SURF. TECHNOL.; CHE; DA. 1978; VOL. 7; NO 6; PP. 433-441; BIBL. 18 REF.Article

Eisenschichten, elektrolytisch abgeschieden: Ermitteln der Mengenanteile von Texturkomponenten = Iron layers, electrolytically separated: Determine the quantities of texture componentsTOMOV, I; KARAGODIN, P; ERLER, F et al.Metalloberfläche. 1999, Vol 53, Num 11, pp 48-53, issn 0026-0797, 5 p.Article

Generation of picosecond hard x-ray pulsesTOMOV, I. V; CHEN, P; RENTZEPIS, P. M et al.Experimentelle Technik der Physik. 1994, Vol 40, Num 2, pp 165-180, issn 0014-4924Article

X-ray diffraction study of anisotropy by the formation and decomposition of nickel hydride. II: Decomposition kineticsTOMOV, I; MONEV, M; MIKHAILOV, M et al.Journal of applied electrochemistry. 1992, Vol 22, Num 1, pp 82-86, issn 0021-891XArticle

Numerical study of light pulse shortening due to nonlinear amplification and saturable absorptionMIRTCHEV, T; PETROV, V; TOMOV, I et al.Experimentelle Technik der Physik. 1991, Vol 39, Num 4-5, pp 393-395, issn 0014-4924Article

Laser-induced transient structure and stress in a platinum(111) crystal studied by time-resolved X-ray diffractionCHEN, P; TOMOV, I. V; RENTZEPIS, P. M et al.Journal of applied crystallography. 1999, Vol 32, pp 82-88, issn 0021-8898, 1Article

A high repetition rate, picosecond hard x-ray system, and its application to time-resolved x-ray diffractionANDERSON, T; TOMOV, I. V; RENTZEPIS, P. M et al.The Journal of chemical physics. 1993, Vol 99, Num 2, pp 869-875, issn 0021-9606Article

High repetition rate picosecond laser system at 1983 nmTOMOV, I. V; ANDERSON, T; RENTZEPIS, P. M et al.Applied physics letters. 1992, Vol 61, Num 10, pp 1157-1159, issn 0003-6951Article

Effects of excited-state absorption and stimulated emission in UV dyes on the shortening of laser pulses interacting with saturable absorbersCHRISTOV, C. G; TOMOV, I. V.Optical and quantum electronics. 1986, Vol 18, Num 2, pp 137-144, issn 0306-8919Article