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LES DISPOSITIFS OPTOELECTRONIQUES. PRINCIPE DE FONCTIONNEMENT ET APPLICATIONTOMOV I.1972; FIZ.-MAT. SPIS.; BALG.; DA. 1972; VOL. 15; NO 4; PP. 274-296Serial Issue

ETUDE AUX RX POUR LA DETERMINATION QUANTITATIVE DE LA COMPOSITION DE PHASE ET DES COMPOSANTS DE STRUCTURES FIBREUSESTOMOV I.1976; IZVEST. KHIM.; BALG.; DA. 1976; VOL. 9; NO 4; PP. 587-598; ABS. ANGL.; BIBL. 16 REF.Article

Orientation dependence of the effective depth of X-ray penetrationTOMOV, I.Physica status solidi. A. Applied research. 1986, Vol 98, Num 1, pp 43-50, issn 0031-8965Article

Eliminating the extinction-induced reflection enlargement in the XRD characterisations of textured filmsTOMOV, I.Materialwissenschaft und Werkstofftechnik. 2003, Vol 34, Num 7, pp 688-692, issn 0933-5137, 5 p.Article

ECG ANALYSIS IN MASS SCREENING EXAMINATIONSDASKALOV I; TOMOV I.1979; ACTA MED. BULG.; BGR; DA. 1979; VOL. 6; NO 2; PP. 47-54; ABS. RUS; BIBL. 10 REF.Article

AN ANALYTICAL METHOD FOR THE QUANTITATIVE DETERMINATION OF THE VOLUME FRACTIONS IN FIBER TEXTURESTOMOV I; BUNGE HJ.1979; TEXTURE CRYST. SOLIDS; GBR; DA. 1979; VOL. 3; NO 2; PP. 73-83; BIBL. 8 REF.Article

LA CHARGE ELECTRIQUE DE L'AIR DANS LES BERGERIES ET L'INFLUENCE D'UNE IONISATION ARTIFICIELLE SUR LA QUALITE ET LA CROISSANCE DE LA LAINENENOV TS; TOMOV I.1977; ZHIVOTNOVAD. NAUKI; BALG.; DA. 1977; VOL. 14; NO 2; PP. 62-69; ABS. RUSSE ANGL.; BIBL. 13 REF.Article

LES COMPLEXES VENTRICULAIRES ABERRANTSTOMOV I; TODOROVA M.1974; VATRESHI BOLESTI; BALG.; DA. 1974; VOL. 13; NO 2; PP. 37-46; BIBL. 10 REF.Article

A new diffraction method for the determination of the effective depth of x-ray penetration = Eine neue Beugungsmethode zur Bestimmung der effektiven Eindringtiefe von RoentgenstrahlenTOMOV, I.Physica status solidi. A. Applied research. 1986, Vol 95, Num 2, pp 397-405, issn 0031-8965Article

Orientation dependence of the effective depth of X-ray penetrationTOMOV, I.Physica status solidi. A. Applied research. 1986, Vol 98, Num 1, pp 43-50, issn 0031-8965Article

ELECTROCHEMICAL FORMATION AND DISINTEGRATION OF THE NI-H PHASE IN BRIGHT NICKEL COATINGS = FORMATION ELECTROCHIMIQUE ET DECOMPOSITION DE LA PHASE NI-H DANS LES REVETEMENTS DE NICKEL BRILLANTRASHKOV S; MONEU M; TOMOV I et al.1982; SURF. TECHNOL.; ISSN 0376-4583; CHE; DA. 1982; VOL. 16; NO 3; PP. 203-208; BIBL. 8 REF.Article

X-RAY INVESTIGATION OF THE CHANGE IN THE TWIN FAULTS DURING THE GROWTH OF <100> TEXTURED NICKEL ELECTRODEPOSITSVITKOVA S; TOMOV I; VELINOV V et al.1978; IZVEST. KHIM.; BGR; DA. 1978; VOL. 11; NO 2; PP. 258-264; ABS. BUL; BIBL. 19 REF.Article

TEXTURE DE REVETEMENTS DE NICKEL DEPOSES PAR ELECTROLYSETOMOV I; UZUNOVA I; RASHKOV S et al.1974; BALG. AKAD. NAUK., IZVEST. OTDEL. KHIM. NAUKI; BALG.; DA. 1974; VOL. 7; NO 2; PP. 177-187; ABS. ANGL.; BIBL. 16 REF.Article

DETERMINATION DE LA TAILLE DES CRISTAUX X-NI ELECTRODEPOSESTOMOV I; STOJCHEV DS; RASHKOV S et al.1976; IZVEST. KHIM.; BALG.; DA. 1976; VOL. 9; NO 2; PP. 254-264; ABS. ANGL.; BIBL. 20 REF.Article

BESTIMMUNG DER MENGENANTEILE VON FASERTEXTUREN. = DETERMINATION DE LA FRACTION DE MELANGE DE TEXTURES EN FIBRESTOMOV I; SCHLAFER D; KUTTNER K et al.1977; KRISTALL U. TECH.; DTSCH.; DA. 1977; VOL. 7; NO 12; PP. 709-715; ABS. RUSSE; BIBL. 3 REF.Article

INFLUENCE OF CURRENT DENSITY AND TEMPERATURE ON THE MORPHOLOGY AND PREFERRED ORIENTATION OF ELECTRODEPOSITED COPPER COATINGSRASHKOV S; STOICHEV DS; TOMOV I et al.1972; ELECTROCHIM. ACTA; G.B.; DA. 1972; VOL. 17; NO 11; PP. 1955-1964; H.T. 3; ABS. FR. ALLEM.; BIBL. 31 REF.Serial Issue

INFLUENCE DE J ET DE T SUR LA MORPHOLOGIE ET L'ORIENTATION PREDOMINANTE DE REVETEMENTS DE CU DEPOSES PAR ELECTROLYSERASHKOV S; STOJCHEV DS; TOMOV I et al.1972; BALG. AKAD. NAUK., IZVEST. OTDEL. KHIM. NAUKI; BALG.; DA. 1972; VOL. 5; NO 2; PP. 217-229; H.T. 2; ABS. ANGL.; BIBL. 28 REF.Serial Issue

Secondary extinction used in thickness and pole density measurements of textured films by X-ray diffractionTOMOV, I.Materials science forum. 1998, pp 145-150, issn 0255-5476, isbn 0-87849-802-8Conference Paper

X-ray diffraction study of anisotrophy by formation and decomposition of nickel hydride. I: Orientation dependence of the extent of phase transformation of nickel into nickel hydrideTOMOV, I; MONEV, M.Journal of applied electrochemistry. 1992, Vol 22, Num 3, pp 262-267, issn 0021-891XArticle

X-ray diffraction and thermal wave analysis of primary recrystallization in electrodeposited copper layers at room temperatureSURNEV, S; TOMOV, I.Journal of applied electrochemistry. 1992, Vol 22, Num 5, pp 464-470, issn 0021-891XArticle

Secondary extinction in textured filmsYAMAKOV, V; TOMOV, I.Journal of applied crystallography. 1999, Vol 32, pp 300-308, issn 0021-8898, 2Article

Orientation distributions by recovery behaviour in electrodeposited copper layers at room temperature = Distributions des orientations par le comportement de recouvrement des couches de cuivre électrodéposées à température ambianteSURNEV, S; TOMOV, I.Journal of applied electrochemistry. 1989, Vol 19, Num 5, pp 752-757, issn 0021-891XArticle

DETERMINATION OF THE SIZE OF THE CRYSTALLITES THAT FORM BRIGHT GALVANIC COPPER COATINGSSTOYCHEV DS; TOMOV I; VITANOVA I et al.1978; SURF. TECHNOL.; CHE; DA. 1978; VOL. 7; NO 6; PP. 433-441; BIBL. 18 REF.Article

Eisenschichten, elektrolytisch abgeschieden: Ermitteln der Mengenanteile von Texturkomponenten = Iron layers, electrolytically separated: Determine the quantities of texture componentsTOMOV, I; KARAGODIN, P; ERLER, F et al.Metalloberfläche. 1999, Vol 53, Num 11, pp 48-53, issn 0026-0797, 5 p.Article

Generation of picosecond hard x-ray pulsesTOMOV, I. V; CHEN, P; RENTZEPIS, P. M et al.Experimentelle Technik der Physik. 1994, Vol 40, Num 2, pp 165-180, issn 0014-4924Article

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