THE QUANTITATIVE EFFECTS OF INTERFACE STATES ON THE PERFORMANCE OF CHARGE-COUPLED DEVICESTOMPSETT MF.1973; I.E.E.E. TRANS. ELECTRON DEVICES; U.S.A.; DA. 1973; VOL. 20; NO 1; PP. 45-55; BIBL. 20 REF.Serial Issue

CHARGE TRANSFER DEVICESTOMPSETT MF.1972; J. VACUUM SCI. TECHNOL.; U.S.A.; DA. 1972; VOL. 9; NO 4; PP. 1166-1181; BIBL. 44 REF.Serial Issue

THE EFFECTS OF BULK TRAPS ON THE PERFORMANCE OF BULK CHANNEL CHARGE-COUPLED DEVICES.MOHSEN AM; TOMPSETT MF.1974; I.E.E.E. TRANS. ELECTRON DEVICES; U.S.A.; DA. 1974; VOL. 21; NO 11; PP. 701-712; BIBL. 18 REF.Article

SPECTRAL DENSITY OF NOISE GENERATED IN CHARGE TRANSFER DEVICESTHORNBER KK; TOMPSETT MF.1973; I.E.E.E. TRANS. ELECTRON. DEVICES; U.S.A.; DA. 1973; VOL. 20; NO 4; PP. 456; BIBL. 4 REF.Serial Issue

USE OF CHARGE-COUPLED DEVICES FOR DELAYING ANALOG SIGNALSTOMPSETT MF; ZIMANY EJ JR.1973; I.E.E.E. J. SOLID-STATE CIRCUITS; U.S.A.; DA. 1973; VOL. 8; NO 2; PP. 151-157; BIBL. 37 REF.Serial Issue

NOISE MEASUREMENTS IN CHARGE-COUPLED DEVICES.MOHSEN AM; TOMPSETT MF; SEQUIN CH et al.1975; I.E.E.E. TRANS. ELECTRON DEVICES; U.S.A.; DA. 1975; VOL. 22; NO 5; PP. 209-218; BIBL. 22 REF.Article

DESIGN AND CHARACTERIZATION OF CCD'S FOR ANALOG SIGNAL PROCESSING.TOMPSETT MF; MOHSEN AM; SEALER DA et al.1975; IN: INST. ELECTR. ELECTRON. ENG. ADV. SOLID-STATE COMPONENTS SIGNAL PROCESS. INT. SYMP. CIRCUITS SYST.; NEWTON, MASS.; 1975; NEW YORK; I.E.E.E.; DA. 1975; PP. 83-89; BIBL. 8 REF.Conference Paper

MULTIPLE-TONE DETECTOR WITH CCD FILTERSSUCIU PI; TOMPSETT MF; BARNER JR et al.1979; IEEE J. SOLID STATE CIRCUITS; USA; DA. 1979; VOL. 14; NO 1; PP. 91-96; BIBL. 7 REF.Article

SELF-CONTAINED CHARGE-COUPLED SPLIT-ELECTRODE FILTERS USING A NOVEL SENSING TECHNIQUE.SEQUIN CH; TOMPSETT MF; SUCIU PI et al.1977; I.E.E.E. J. SOLID-STATE CIRCUITS; U.S.A.; DA. 1977; VOL. 12; NO 6; PP. 626-632; BIBL. 11 REF.Article