OPPORTUNITY OF INHIBITION TO OPTIMIZE NAND-NOR NETWORKS.TOSSER AJ.1976; COMPUTERS ELECTR. ENGNG; G.B.; DA. 1976; VOL. 3; NO 3; PP. 281-292; BIBL. 10 REF.Article

MODELE ELECTRIQUE NOUVEAU EN VUE D'INTERPRETER LA MESURE D'ACTIVITES IONIQUES FAIBLES PAR MICROPIPETTEMAHMOUD A; TOSSER AJ.1982; R.B.M. REVUE EUROPEENNE DE BIOTECHNOLOGIE MEDICALE; ISSN 0222-0776; FRA; DA. 1982; VOL. 4; NO 4; PP. 299-303; ABS. ENG; BIBL. 17 REF.Article

AN EXTENSION OF THE COTTEY CONDUCTION MODELTELLIER CR; TOSSER AJ.1978; THIN SOLID FILMS; NLD; DA. 1978; VOL. 52; NO 1; PP. 53-61; BIBL. 21 REF.Article

GRAPHICAL USE "DON'T CARE" SYMBOLS IN THE SHORTENED QUINE-MCCLUSKEY TABLES.TOSSER AJ; DUBUS D.1977; INTERNATION. J. ELECTRON.; G.B.; DA. 1977; VOL. 43; NO 4; PP. 353-359; BIBL. 5 REF.Article

THE TEMPERATURE COEFFICIENT OF RESISTIVITY OF POLYCRYSTALLINE RADIO FREQUENCY SPUTTERED ALUMINIUM FILMS.TELLIER CR; TOSSER AJ.1977; THIN SOLID FILMS; NETHERL.; DA. 1977; VOL. 43; NO 3; PP. 261-266; BIBL. 23 REF.Article

RESISTIVITY RECOVERY OF THIN SPUTTERED ALUMINIUM FILMS.TELLIER CR; TOSSER AJ.1976; ELECTROCOMPON. SCI. TECHNOL.; G.B.; DA. 1976; VOL. 3; NO 2; PP. 85-89; BIBL. 34 REF.Article

GRAPHICAL EXHAUSTIVE ANALYSIS OF MINIMUM MUX SYNTHESIS OF SWITCHING FUNCTIONSLOTFI ZM; TOSSER AJ.1980; COMPUT. ELECTR. ENG.; ISSN 0045-7906; USA; DA. 1980; VOL. 7; NO 4; PP. 235-242; BIBL. 11 REF.Article

USING MULTIPLEXERS TO REALIZE SWITCHING FUNCTIONS HAVING PARTICULAR PROPERTIESLOTFI ZM; TOSSER AJ.1979; INTERNATION. J. ELECTRON.; GBR; DA. 1979; VOL. 47; NO 3; PP. 253-266; BIBL. 17 REF.Article

THE DERIVATION OF DISJUNCTIVE AND CONJUNCTIVE REDUCED BOOLEAN FORMS FROM DUAL KARNAUGH MAPSLOTFI Z; TOSSER AJ.1978; INTERNATION. J. ELECTRON.; GBR; DA. 1978; VOL. 44; NO 2; PP. 161-165; BIBL. 4 REF.Article

DESCRIPTION OF ELECTRONIC TRANSPORT PROPERTIES OF MONOCRYSTALLINE FILMS BY A STATISTICAL MODEL = DESCRIPTION DES PROPRIETES DE TRANSPORT ELECTRONIQUE DE COUCHES MINCES MONOCRISTALLINES PAR UN MODELE STATISTIQUETELLIER CR; TOSSER AJ.1980; THIN SOLID FILMS; ISSN 0040-6090; CHE; DA. 1980; VOL. 70; NO 2; PP. 225-234; BIBL. 43 REF.Article

FAST ARITHMETIC PROCEDURE FOR MINIMIZATION OF LOGICAL FUNCTIONS = PROCEDE ARITHMETIQUE RAPIDE POUR LA MINIMALISATION DES FONCTIONS LOGIQUESLOTFI ZM; TOSSER AJ.1979; INTERNATION. J. ELECTRON.; GBR; DA. 1979; VOL. 47; NO 2; PP. 181-185; BIBL. 7 REF.Article

SYSTEMATIC SEARCH FOR MINIMUM SYNTHESIS OF LOGICAL FUNCTIONS WITH MULTIPLEXERS = RECHERCHE SYSTEMATIQUE D'UNE METHODE DE SYNTHESE MINIMALE DES FONCTIONS LOGIQUES AVEC DES MULTIPLEXEURSLOTFI ZM; TOSSER AJ.1979; INTERNATION. J. ELECTRON.; GBR; DA. 1979; VOL. 47; NO 6; PP. 569-575; BIBL. 10 REF.Article

EXACT AND APPROXIMATE EXPRESSIONS FOR THE TEMPERATURE COEFFICIENT OF RESISTIVITY OF POLYCRYSTALLINE FILMS USING THE MAYADAS-SHATZKES MODEL.TELLIER CR; TOSSER AJ.1977; THIN SOLID FILMS; NETHERL.; DA. 1977; VOL. 44; NO 2; PP. 141-147; BIBL. 6 REF.Article

MINIMUM NAND-NOR SYNTHESIS OF S-FACTORIZED SUM OF PRODUCTS AND PRODUCT OF SUMS.MASSET GJ; TOSSER AJ.1977; INTERNATION. J. ELECTRON.; G.B.; DA. 1977; VOL. 43; NO 3; PP. 209-251; BIBL. 4 REF.Article

THE THICKNESS DEPENDENCE OF THE INTERBAND TRANSITION PHOTOVOLTAIC VOLTAGE AND THE SHORT-CIRCUIT PHOTOCURRENT IN ZINC SULPHIDE PHOTOCELLS.ARSALANE M; TOSSER AJ.1977; THIN SOLID FILMS; NETHERL.; DA. 1977; VOL. 42; NO 2; PP. 213-220; BIBL. 11 REF.Article

GRAIN SIZE DEPENDENCE OF THE GAUGE FACTOR OF THIN METALLIC FILMS.TELLIER CR; TOSSER AJ.1977; ELECTROCOMPON. SCI. TECHNOL.; G.B.; DA. 1977; VOL. 4; NO 1; PP. 9-17; BIBL. 31 REF.Article

APPROXIMATE EXPRESSION FOR THE ELECTRICAL RESISTIVITY OF THIN POLYCRYSTALLINE METALLIC FILMSTELLIER CR; TOSSER AJ.1976; THIN SOLID FILMS; NETHERL.; DA. 1976; VOL. 33; NO 2; PP. L19-L26; BIBL. 16 REF.Article

THEORETICAL ANALYSIS OF THE HALL EFFECT IN THIN POLYCRYSTALLINE METALLIC FILMSPICHARD CR; TOSSER AJ; TELLIER CR et al.1981; J. MATER. SCI.; ISSN 0022-2461; GBR; DA. 1981; VOL. 16; NO 2; PP. 451-456; BIBL. 32 REF.Article

THREE-DIMENSIONAL STRAIN COEFFICIENTS OF RESISTIVITY OF THIN POLYCRYSTALLINE METAL FILMSTELLIER CR; PICHARD CR; TOSSER AJ et al.1981; J. MATER. SCI.; ISSN 0022-2461; GBR; DA. 1981; VOL. 16; NO 8; PP. 2281-2286; BIBL. 23 REF.Article

CONTRIBUTION DES JOINTS DE GRAINS PARALLELES ET PERPENDICULAIRES AU CHAMP ELECTRIQUE A LA RESISTIVITE ELECTRIQUE DE COUCHES METALLIQUES POLYCRISTALLINES = CONTRIBUTION OF PARALLEL AND PERPENDICULAR TO ELECTRIC FIELD GRAIN BOUNDARIES TO ELECTRICAL RESISTIVITY OF POLYCRYSTALLINE THIRIFILMSPICHARD CR; TELLIER CR; TOSSER AJ et al.1981; VIDE COUCHES MINCES; ISSN 0223-4335; FRA; DA. 1981; VOL. 36; NO 208; PP. 619-626; ABS. ENG; BIBL. 38 REF.Article

ABOUT THE ORIGIN OF MAGNETORESISTANCE IN RELATIVELY THIN METAL FILMSTELLIER CR; TOSSER AJ; PICHARD CR et al.1981; J. MATER. SCI.; ISSN 0022-2461; GBR; DA. 1981; VOL. 16; NO 4; PP. 1118-1121; BIBL. 16 REF.Article

HALL COEFFICIENT OF THIN POLYCRYSTALLINE METALLIC FILMS IN A THREE-DIMENSIONAL SCATTERING MODEL = COEFFICIENT HALL DE COUCHES MINCES METALLIQUES POLYCRISTALLINES DANS UN MODELE DE DIFFUSION A TROIS DIMENSIONSPICHARD CR; TELLIER CR; TOSSER AJ et al.1980; THIN SOLID FILMS; ISSN 0040-6090; CHE; DA. 1980; VOL. 69; NO 2; PP. 157-164; BIBL. 21 REF.Article

A THREE-DIMENSIONAL MODEL FOR GRAIN BOUNDARY RESISTIVITY IN METAL FILMS = UN MODELE A TROIS DIMENSIONS POUR LA RESISTIVITE AUX JOINTS DE GRAINS DANS LES COUCHES MINCES METALLIQUESPICHARD CR; TELLIER CR; TOSSER AJ et al.1979; THIN SOLID FILMS; ISSN 0040-6090; CHE; DA. 1979; VOL. 62; NO 2; PP. 189-194; BIBL. 9 REF.Article

APPROXIMATE EXPRESSIONS FOR THE PRODUCT OF THE RESISTIVITY WITH ITS TCR IN VERY THIN POLYCRYSTALLINE FILMSTELLIER CR; PICHARD CR; TOSSER AJ et al.1979; J. PHYS. F; ISSN 0305-4608; GBR; DA. 1979; VOL. 9; NO 12; PP. 2377-2380; BIBL. 9 REF.Article

LIMITING VALUES OF THE SPECULARITY REFLECTION COEFFICIENT IN THE COTTEY SIZE EFFECT MODEL = VALEURS LIMITES DU COEFFICIENT DE REFLEXION SPECULAIRE DANS LE MODELE DE L'EFFET DIMENSIONNEL DE COTTEYTELLIER CR; PICHARD CR; TOSSER AJ et al.1982; JOURNAL OF MATERIALS SCIENCE LETTERS; ISSN 510106; GBR; DA. 1982; VOL. 1; NO 6; PP. 271-273; BIBL. 18 REF.Article