FILTRE MULTICOUCHE SPATIALEMENT LIMITE A REFLEXION TOTALE INTERNE ATTENUEEMALOV VV; IOGANSEN LV.1980; OPT. I SPEKTROSK.; SUN; DA. 1980; VOL. 48; NO 1; PP. 146-154; BIBL. 9 REF.Article

THE USE OF ATTENUATED TOTAL REFLECTANCE (ATR) IN DETERMINING THE NATURE OF A COATING ON A PAPERBOBER A; BERKSHIRE RC.1979; APPL. SPECTROSC.; USA; DA. 1979; VOL. 33; NO 2; PP. 184-186; BIBL. 5 REF.Article

ELEMENT A REFLEXION TOTALE INTERNE ATTENUEE ACCORDABLE EN FONCTION DE L'ANGLE D'INCIDENCE DES FAISCEAUX LUMINEUX FORTEMENT COLLIMATESMOLOCHNIKOV BI; VASIL'EVA IS; GUBEL NN et al.1979; OPT.-MEKH. PROMYSHL.; SUN; DA. 1979; NO 11; PP. 26-28; BIBL. 4 REF.Article

CALCUL OPERATIF DES CONSTANTES OPTIQUES DETERMINEES PAR UNE METHODE DE REFLEXION TOTALE INTERNE ATTENUEESHMULEVICH MI; SHAKARYAN EH S; ZOLOTAREV VM et al.1978; OPT.-MEKH. PROMYSHL.; S.S.S.R.; DA. 1978; VOL. 45; NO 3; PP. 58-60; BIBL. 4 REF.Article

EXPERIMENTAL OBSERVATION OF THE UPPER POLARITON BRANCH IN ISOTROPIC CRYSTALS.FORNARI B; PAGANNONE M.1978; PHYS. REV., B; USA; DA. 1978; VOL. 17; NO 8; PP. 3047-3050; BIBL. 23 REF.Article

TWO-INTERFACE SURFACE-POLARITON MODES: GAAS EPITAXIAL FILM ON GAAS SUBSTRATE.HOLM RT; PALIK ED.1978; PHYS. REV., B; USA; DA. 1978; VOL. 17; NO 6; PP. 2673-2681; BIBL. 24 REF.Article

VERSATILE FRUSTRATED-TOTAL-REFRACTION POLARIZER FOR THE INFRAREDLEES D; BAUMEISTER P.1979; OPT. LETTERS; USA; DA. 1979; VOL. 4; NO 2; PP. 66-67; BIBL. 7 REF.Article

REFRACTOMETRE A REFLEXION TOTALE INTERNE ATTENUEE POUR LA MESURE DES CONSTANTES OPTIQUES DES MILIEUX ABSORBANTSMOLOCHNIKOV BI; LEJKIN MV; VASIL'EVA IS et al.1979; OPT.-MEKH. PROMYSHL.; SUN; DA. 1979; NO 2; PP. 26-28; BIBL. 6 REF.Article

DETERMINATION OF OPTIMUM FLOW DISCHARGE PARAMETERS BASED ON ATR-FTIR SPECTRANGUYEN LT; SUNG NH; SUH NP et al.1980; J. POLYM. SCI., POLYM. LETTERS ED.; USA; DA. 1980; VOL. 18; NO 8; PP. 541-548; BIBL. 14 REF.Article

SURFACE PLASMA WAVE STUDY OF SUBMONOLAYER CS AND CS-O COVERED AG SURFACESCHEN WP; CHEN JM.1980; SURF. SCI.; ISSN 0039-6028; NLD; DA. 1980; VOL. 91; NO 2-3; PP. 601-617; BIBL. 30 REF.Article

TOTAL INTERNAL REFLECTION RAMAN SPECTROSCOPY AS A NEW TOOL FOR SURFACE ANALYSISIWAMOTO R; MIYA M; OHTA K et al.1980; J. AMER. CHEM. SOC.; USA; DA. 1980; VOL. 102; NO 3; PP. 1212-1213; BIBL. 10 REF.Article

ERWEITERTE PROBENPRAEPARATIONSMOEGLICHKEITEN FUER DIE IR-SPEKTROSKOPIE DURCH VERWENDUNG DER ATR-TECHNIK = POSSIBILITES ELARGIES DE PREPARATION DES ECHANTILLONS POUR LA SPECTROSCOPIE IR, A L'AIDE DE LA TECHNIQUE "REFLEXION TOTALE ATTENUEE"ADRIAN P.1979; G.I.T., FACHZ. LAB.; DEU; DA. 1979; VOL. 23; NO 6; PP. 513-520; (5 P.); BIBL. 12 REF.Article

CHOIX DES CONDITIONS OPTIMALES D'ENREGISTREMENT DES SPECTRES DE REFLEXION MULTIPLE INTERNE ATTENUEE POUR LA DETERMINATION DES CONSTANTES OPTIQUES DE COUCHES MINCES (D<10 NM) D'OXYDEEREMEEVA MA; KUZNETSOVA GN; EREMEEV VP et al.1979; ZH. PRIKL. SPEKTROSK.; BYS; DA. 1979; VOL. 30; NO 1; PP. 129-133; ABS. ENG; BIBL. 21 REF.Article

ETUDE DE LA STRUCTURE DES COUCHES LIMITES DE POLYMETHYLMETHACRYLATE PAR LA METHODE DE LA REFLEXION INTERNE TOTALE PERTURBEESEMENOVICH GM; LIPATOV YU S; GUSEV SS et al.1978; VYSOKOMOLEK. SOEDIN., A; SUN; DA. 1978; VOL. 20; NO 9; PP. 2000-2005; ABS. ENG; BIBL. 11 REF.Article

ATTENUATED TOTAL REFLECTION ANGULAR SPECTRA OF A AG FILM BOUNDED BY DIELECTRIC SLABSKOVACS GJ; SCOTT GD.1978; CANAD. J. PHYS.; CAN; DA. 1978; VOL. 56; NO 9; PP. 1235-1247; ABS. FRE; BIBL. 19 REF.Article

RELATIONSHIPS BETWEEN THE GOOS-HAENCHEN SHIFT AND THE EFFECTIVE THICKNESS IN ATTENUATED TOTAL REFLECTION SPECTROSCOPY.HIRSCHFELD T.1977; APPL. SPECTROSC.; U.S.A.; DA. 1977; VOL. 31; NO 3; PP. 243-244; BIBL. 9 REF.Article

SURFACE ELECTROMAGNETIC WAVES WITH DAMPING. II. ANISOTROPIC MEDIA.KOVENER GS; ALEXANDER RW JR; TYLER IL et al.1977; PHYS. REV., B; U.S.A.; DA. 1977; VOL. 15; NO 12; PP. 5877-5882; BIBL. 24 REF.Article

ATTENUATED TOTAL REFLECTION SPECTRA OF SURFACE EXCITON POLARITONS.BISHOP MF; MARADUDIN AA; MILLS DL et al.1976; PHYS. REV., B; U.S.A.; DA. 1976; VOL. 14; NO 10; PP. 4744-4745; BIBL. 4 REF.Article

PROCEDE DE MESURE DES INDICES DE REFRACTION DES MILIEUX ABSORBANTSPEN'KOVSKIJ AI.1982; OPT.-MEH. PROM.; ISSN 0030-4042; SUN; DA. 1982; NO 8; PP. 38-41; BIBL. 14 REF.Article

EXPERIMENTAL AND THEORETICAL STUDY OF EXCITON SURFACE POLARITONS ON ORGANIC CRYSTALS. I: (010) FACE OF TCNQ SINGLE CRYSTALSBRILLANTE A; PHILPOTT MR; POCKRAND I et al.1979; J. CHEM. PHYS.; USA; DA. 1979; VOL. 70; NO 12; PP. 5739-5746; BIBL. 19 REF.Article

THE ATR SPECTRA OF MULTIPOLE SURFACE PLASMONSSIPE JE.1979; SURF. SCI.; NLD; DA. 1979; VOL. 84; NO 1; PP. 75-105; BIBL. 31 REF.Article

SURFACE POLARITON IN THE ATR ANGULAR SPECTRA OF A THIN IRON FILM BOUNDED BY DIELECTRIC LAYERSKOVACS GJ.1978; J. OPT. SOC. AMER.; USA; DA. 1978; VOL. 68; NO 10; PP. 1325-1332; BIBL. 19 REF.Article

DETERMINATION OF THE OPTICAL PROPERTIES OF THIN FILMS.ABELES F.sdIN: OPT. PHENOM. INFRARED MATER. TOP. MEET. DIG. TECH. PAPERS; ANNAPOLIS, MD.; 1976; S.L.; DA. S.D.; PP. WE1.1-WE1.2Conference Paper

Simplified attenuated total reflection apparatusVILLAGRAN, J. C; THOMPSON, J. C.Review of scientific instruments. 1989, Vol 60, Num 6, pp 1201-1202, issn 0034-6748Article

Quantitative ATR-spektrokopie in einem 3-Schicht-System = Spectroscopie de réflexion totale atténuée quantitative dans un système à 3 couches = Quantitative ATR spectroscopy within a 3-layer-systemABRAHAM, K; MÜLLER, G.Optik (Stuttgart). 1985, Vol 70, Num 1, pp 29-32, issn 0030-4026Article